摘要:
A program element has a magnetic layer electrically connected between first and second nodes. At least a portion of the magnetic layer forms a link portion designed to be blown with external laser irradiation. The magnetic layer is provided in the same layer as and with the same structure as a tunneling magneto-resistance element in an MTJ memory cell. An electrical contact between the magnetic layer and respective one of the first and second nodes has the same structure as the electrical contact between the tunneling magneto-resistance element and an interconnection provided in the same metal interconnection layer as respective one of the first and second nodes in the MTJ memory cell.
摘要:
A tunneling magneto-resistance element forming an MTJ memory cell has an elongated form having an aspect ratio larger than one for stabilizing the magnetization characteristics. Bit lines and write word lines for carrying data write currents are arranged along short and long sides of the tunneling magneto-resistance element, respectively. The data write current flowing through the bit line, which can easily have an interconnection width, is designed to be larger than the data write current flowing through the write word line. For example, a distance between the write word line and the tunneling magneto-resistance element is smaller than a distance between the bit line and the tunneling magneto-resistance element.
摘要:
In data write operation, a data write current starts being supplied to a write word line of the selected row at a first time without waiting for redundant determination. A data write current starts being supplied to a bit line or sub bit line of the selected column at a second time that is later than the first time according to the redundant determination result. The redundant determination is conducted between the first and second times. The data write currents flowing through the write word line and the bit line generate magnetic fields of the hard-axis and easy-axis directions for the selected memory sell, respectively.
摘要:
An access transistor in an MTJ memory cell, which is one of transistors connected to a read current path, is fabricated with a semiconductor layer formed on an insulating film on a semiconductor substrate SUB, and includes impurity regions, a gate region and a body region. That is, the access transistor is fabricated with an SOI (Silicon On Insulator) structure in order to reduce an off-leak current.
摘要:
A plurality of test target chips on a test target wafer are simultaneously and electrically coupled to a plurality of chips on a test wafer via a wafer contactor. Each chip on the test wafer has a test circuit for conducting an operation test on each chip on the test target wafer. Since the test circuit is in a one-to-one relationship with respect to the test target chip, and is arranged on the test wafer other than the test target wafer, the many chips can be simultaneously tested in parallel during the wafer test without increasing an area of the test target chips.
摘要:
A semiconductor device comprises a memory cell block and a sense amplifier zone. A selection gate included in the sense amplifier zone is turned on for selectively coupling the memory cell block with the sense amplifier zone. Local drivers are dispersively arranged on a BLI wire transmitting a gate control signal, and a driver is arranged on an end of the BLI wire. The driver pulls down the potential of the BLI wire at a high speed.
摘要:
First and second current drivers are connected to one end of corresponding first and second write bit lines, respectively, and the first and second write bit lines are directly connected, at the other end, to a common line. The first and second current drivers receive a first power supply voltage and the ground voltage, while the common line receives a second power supply voltage higher than the ground voltage and lower than the first power supply voltage. The first and second current drivers cause a current for data writing to flow in a first direction based on a voltage difference between the first power supply voltage and the second power supply voltage, and cause a current for data writing to flow in a second direction based on a voltage difference between the second power supply voltage and the ground voltage.
摘要:
A plurality of bit lines are divided into a plurality of groups each including Y (Y: integer of at least two) bit lines. Y data read data lines passing a data read current therethrough in data reading are provided along with Y connection control parts electrically coupling Y bit lines and the Y read data lines with each other every group. Therefore, the connection control parts electrically connected with the Y read data lines are uniformly divided so that parasitic capacitance applied to the read data lines following electrical connection with the connection control parts can be suppressed. Therefore, the time for charging the read data lines to a prescribed voltage level can be reduced for executing high-speed data reading.
摘要:
Two complementary bit lines corresponding to a selected column are pulled down to a ground voltage via each of a selected MTJ memory cell and a dummy memory cell and are pulled up to a power supply voltage via a read drive selection gate. A read gate corresponding to the selected column drives the voltages of two complementary read data buses by driving force according to the voltage of corresponding complementary two bit lines, respectively. A data reading circuit executes data reading operation on the basis of a voltage difference between the complementary two read data buses. The power supply voltage is determined in consideration of reliability of a tunneling insulating film of an MTJ memory cell.
摘要:
An MTJ memory cell is independently provided with a write word line and a read word line used for data write and data read. By separately arranging read word lines every two regions formed by dividing a memory array in the column direction, it is possible to reduce signal propagation delays of the read word lines and accelerate the data read operation. Activation of each read word line is controlled by a write word line in accordance with a row selection result in a hierarchical manner. A word-line-current control circuit forms and cuts off the current path of a write word line correspondingly to data write and data read.