METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
    71.
    发明申请
    METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 有权
    制造半导体器件的方法

    公开(公告)号:US20120244660A1

    公开(公告)日:2012-09-27

    申请号:US13495481

    申请日:2012-06-13

    IPC分类号: H01L21/44

    摘要: It is an object to provide a highly reliable semiconductor device which includes a thin film transistor having stable electric characteristics. It is another object to manufacture a highly reliable semiconductor device at lower cost with high productivity. In a method for manufacturing a semiconductor device which includes a thin film transistor where a semiconductor layer having a channel formation region, a source region, and a drain region are formed using an oxide semiconductor layer, heat treatment (heat treatment for dehydration or dehydrogenation) is performed so as to improve the purity of the oxide semiconductor layer and reduce impurities such as moisture. Moreover, the oxide semiconductor layer subjected to the heat treatment is slowly cooled under an oxygen atmosphere.

    摘要翻译: 本发明的目的是提供一种高度可靠的半导体器件,其包括具有稳定电特性的薄膜晶体管。 另一个目的是以更高的生产率以更低的成本制造高可靠性的半导体器件。 在包括薄膜晶体管的半导体器件的制造方法中,使用氧化物半导体层形成具有沟道形成区域,源极区域和漏极区域的半导体层,进行热处理(脱水或脱氢的热处理) 以提高氧化物半导体层的纯度并减少诸如水分的杂质。 此外,在氧气氛下缓慢冷却经受热处理的氧化物半导体层。

    METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
    74.
    发明申请
    METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 有权
    制造半导体器件的方法

    公开(公告)号:US20110287591A1

    公开(公告)日:2011-11-24

    申请号:US13110314

    申请日:2011-05-18

    IPC分类号: H01L21/336 H01L21/20

    摘要: An object is to provide a semiconductor device including an oxide semiconductor, which has stable electrical characteristics and high reliability. In a manufacturing process of a bottom-gate transistor including an oxide semiconductor layer, heat treatment in an atmosphere containing oxygen and heat treatment in vacuum are sequentially performed for dehydration or dehydrogenation of the oxide semiconductor layer. In addition, irradiation with light having a short wavelength is performed concurrently with the heat treatment, whereby elimination of hydrogen, OH, or the like is promoted. A transistor including an oxide semiconductor layer on which dehydration or dehydrogenation treatment is performed through such heat treatment has improved stability, so that variation in electrical characteristics of the transistor due to light irradiation or a bias-temperature stress (BT) test is suppressed.

    摘要翻译: 目的在于提供一种具有稳定的电气特性和高可靠性的氧化物半导体的半导体装置。 在包括氧化物半导体层的底栅晶体管的制造工艺中,在氧化物气氛中进行热处理,在真空中进行热处理,依次进行氧化物半导体层的脱水或脱氢。 此外,与热处理同时进行具有短波长的光的照射,由此促进氢,OH等的消除。 包括通过这种热处理进行脱水或脱氢处理的氧化物半导体层的晶体管具有改善的稳定性,从而抑制了由于光照射或偏压温度应力(BT)测试而导致的晶体管的电特性的变化。

    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    76.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    半导体器件及其制造方法

    公开(公告)号:US20110101335A1

    公开(公告)日:2011-05-05

    申请号:US12912196

    申请日:2010-10-26

    IPC分类号: H01L29/12 H01L21/34

    摘要: An object is to provide a semiconductor device including an oxide semiconductor with stable electric characteristics can be provided. An insulating layer having many defects typified by dangling bonds is formed over an oxide semiconductor layer with an oxygen-excess mixed region or an oxygen-excess oxide insulating layer interposed therebetween, whereby impurities in the oxide semiconductor layer, such as hydrogen or moisture (a hydrogen atom or a compound including a hydrogen atom such as H2O), are moved through the oxygen-excess mixed region or oxygen-excess oxide insulating layer and diffused into the insulating layer. Thus, the impurity concentration of the oxide semiconductor layer is reduced.

    摘要翻译: 本发明的目的是提供一种包括具有稳定电特性的氧化物半导体的半导体器件。 在氧化物半导体层上形成具有以悬挂键为代表的许多缺陷的绝缘层,其间具有氧过剩混合区域或氧过剩氧化物绝缘层,由此氧化物半导体层中的诸如氢或水分的杂质( 氢原子或包含氢原子如H 2 O的化合物)通过氧过剩混合区域或氧 - 过量氧化物绝缘层移动并扩散到绝缘层中。 因此,氧化物半导体层的杂质浓度降低。

    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THE SAME
    77.
    发明申请
    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THE SAME 有权
    半导体器件及其制造方法相同

    公开(公告)号:US20110092017A1

    公开(公告)日:2011-04-21

    申请号:US12906553

    申请日:2010-10-18

    IPC分类号: H01L21/34

    摘要: An object is to provide a method for manufacturing a highly reliable semiconductor device including thin film transistors which have stable electric characteristics and are formed using an oxide semiconductor. A method for manufacturing a semiconductor device includes the steps of: forming an oxide semiconductor film over a gate electrode with a gate insulating film interposed between the oxide semiconductor film and the gate electrode, over an insulating surface; forming a first conductive film including at least one of titanium, molybdenum, and tungsten, over the oxide semiconductor film; forming a second conductive film including a metal having lower electronegativity than hydrogen, over the first conductive film; forming a source electrode and a drain electrode by etching of the first conductive film and the second conductive film; and forming an insulating film in contact with the oxide semiconductor film, over the oxide semiconductor film, the source electrode, and the drain electrode.

    摘要翻译: 本发明的目的是提供一种用于制造具有稳定电特性并使用氧化物半导体形成的薄膜晶体管的高可靠性半导体器件的方法。 一种制造半导体器件的方法包括以下步骤:在绝缘表面上,在栅极上形成氧化物半导体膜,其中栅极绝缘膜置于氧化物半导体膜和栅电极之间; 在所述氧化物半导体膜上形成包括钛,钼和钨中的至少一种的第一导电膜; 在所述第一导电膜上形成包含具有比氢更低的电负性的金属的第二导电膜; 通过蚀刻第一导电膜和第二导电膜形成源电极和漏电极; 以及在所述氧化物半导体膜,所述源电极和所述漏极上形成与所述氧化物半导体膜接触的绝缘膜。

    LIQUID CRYSTAL DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME
    79.
    发明申请
    LIQUID CRYSTAL DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME 有权
    液晶显示装置及其制造方法

    公开(公告)号:US20110058116A1

    公开(公告)日:2011-03-10

    申请号:US12871162

    申请日:2010-08-30

    IPC分类号: H01L33/08 H01L33/28

    CPC分类号: H01L27/1225

    摘要: An object is to provide an active matrix liquid crystal display device in which plural kinds of circuits are formed over one substrate and plural kinds of thin film transistors are provided corresponding to characteristics of the plural kinds of circuits. An inverted-coplanar thin film transistor including an oxide semiconductor layer which is over and overlaps with a source electrode layer and a drain electrode layer is used for a pixel thin film transistor. A channel-protective thin film transistor is used for a driver-circuit thin film transistor is used. In addition, main parts of the pixel thin film transistor are formed using a light-transmitting material, so that the aperture ratio is increased.

    摘要翻译: 本发明提供一种有源矩阵液晶显示装置,其中在一个基板上形成多种电路,并且根据多种电路的特性设置多种薄膜晶体管。 包括与源电极层和漏电极层重叠的氧化物半导体层的倒共面薄膜晶体管用于像素薄膜晶体管。 使用通道保护薄膜晶体管用于驱动电路薄膜晶体管。 此外,使用透光材料形成像素薄膜晶体管的主要部分,使得开口率增加。

    LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME
    80.
    发明申请
    LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME 有权
    发光装置及其制造方法

    公开(公告)号:US20110057187A1

    公开(公告)日:2011-03-10

    申请号:US12871184

    申请日:2010-08-30

    IPC分类号: H01L33/00 H01L21/02

    摘要: An object of the present invention is to provide a light-emitting device in which plural kinds of circuits are formed over the same substrate, and plural kinds of thin film transistors are provided in accordance with characteristics of the plural kinds of circuits. An inverted-coplanar thin film transistor, an oxide semiconductor layer of which overlaps with a source and drain electrode layers, and a channel-etched thin film transistor are used as a thin film transistor for a pixel and a thin film transistor for a driver circuit, respectively. Between the thin film transistor for a pixel and a light-emitting element, a color filter layer is provided so as to overlap with the light-emitting element which is electrically connected to the thin film transistor for a pixel.

    摘要翻译: 本发明的目的是提供一种在同一基板上形成多种电路的发光器件,并且根据多种电路的特性提供多种薄膜晶体管。 作为用于像素的薄膜晶体管和用于驱动电路的薄膜晶体管,使用反向共面薄膜晶体管,其与源极和漏极层重叠的氧化物半导体层和沟道蚀刻薄膜晶体管 , 分别。 在用于像素的薄膜晶体管和发光元件之间,设置滤色器层,以与与像素的薄膜晶体管电连接的发光元件重叠。