PIC STRUCTURE WITH WIRE(S) BETWEEN Z-STOP SUPPORTS ON SIDE OF OPTICAL DEVICE ATTACH CAVITY

    公开(公告)号:US20240103237A1

    公开(公告)日:2024-03-28

    申请号:US17933199

    申请日:2022-09-19

    CPC classification number: G02B6/423 G02B6/4206 G02B6/424 G02B6/4274

    Abstract: A photonic integrated circuit (PIC) structure includes a substrate, and a cavity defined in the substrate, the cavity including a shoulder at a side of the cavity. A plurality of z-stop supports for an optical device are also included. Each z-stop support of the plurality of z-stop supports is on a support portion of the shoulder. A wire extends over the side of the cavity and between at least two z-stop supports of the plurality of z-stop supports. An optical device is positioned on the plurality of z-stop supports in the cavity and electrically coupled to the wire. Electrical connections between z-stop supports allows larger sized electrical connections to the optical device to mitigate electromigration issues, and increased options for electrical connections.

    Silicon-controlled rectifiers in a silicon-on-insulator technology

    公开(公告)号:US11935946B2

    公开(公告)日:2024-03-19

    申请号:US17849867

    申请日:2022-06-27

    CPC classification number: H01L29/7455 H01L29/66363

    Abstract: Structures for a silicon-controlled rectifier and methods of forming a structure for a silicon-controlled rectifier. The structure comprises a semiconductor substrate, a dielectric layer on the semiconductor substrate, and a first well and a second well in the semiconductor substrate beneath the dielectric layer. The first well has a first conductivity type, the second well has a second conductivity type opposite to the first conductivity type, and the second well adjoins the first well along a p-n junction. The structure further comprises a first terminal and a second terminal above the dielectric layer, a first connection extending through the dielectric layer from the first terminal to the first well, and a second connection extending through the dielectric layer from the second terminal to the second well.

    POLARIZATION ROTATORS WITH OVERLAPPING WAVEGUIDE CORES

    公开(公告)号:US20240085626A1

    公开(公告)日:2024-03-14

    申请号:US17941055

    申请日:2022-09-09

    Inventor: Yusheng Bian

    CPC classification number: G02B6/126 G02B6/1228 G02B6/13 G02B2006/12061

    Abstract: Structures for a polarization rotator and methods of forming a structure for a polarization rotator. The structure comprises a first waveguide core having a first section, a second section, a first terminating end, and a second terminating end opposite to the first terminating end. The first and second sections of the first waveguide core are arranged between the first terminating end and the second terminating end. The structure further comprises a second waveguide core including a first tapered section having a first overlapping arrangement with the first section of the first waveguide core and a second tapered section having a second overlapping arrangement with the second section of the first waveguide core. The first waveguide core comprises a first material, and the second waveguide core comprises a second material different from the first material.

    STRUCTURES FOR A VERTICAL VARACTOR DIODE AND RELATED METHODS

    公开(公告)号:US20240072180A1

    公开(公告)日:2024-02-29

    申请号:US17896711

    申请日:2022-08-26

    CPC classification number: H01L29/93 H01L29/1095 H01L29/66174

    Abstract: Structures for a varactor diode and methods of forming same. The structure comprises a first semiconductor layer including a section on a substrate, a second semiconductor layer on the section of the first semiconductor layer, a third semiconductor layer on the second semiconductor layer, and a doped region in the section of the first semiconductor layer. The section of the first semiconductor layer and the doped region have a first conductivity type, and the second semiconductor layer comprises silicon-germanium having a second conductivity type opposite to the first conductivity type, and the third semiconductor layer has the second conductivity type. The doped region contains a higher concentration of a dopant of the first conductivity type than the section of the first semiconductor layer. The second semiconductor layer abuts the first section of the first semiconductor layer along an interface, and the doped region is positioned adjacent to the interface.

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