Abstract:
Technologies are described for monitoring characteristics of layers of integrated computational elements (ICEs) during fabrication using an in-situ spectrometer operated in step-scan mode in combination with lock-in or time-gated detection. As part of the step-scan mode, a wavelength selecting element of the spectrometer is discretely scanned to provide spectrally different instances of probe-light, such that each of the spectrally different instances of the probe-light is provided for a finite time interval. Additionally, an instance of the probe-light interacted during the finite time interval with the ICE layers includes a modulation that is being detected by the lock-in or time-gated detection over the finite time interval.
Abstract:
Two dimensional (2D) optical spectroscopy, wherein the spectrum has an excitation and an emission axis, reveals information formerly hidden in one-dimensional (1D) optical spectroscopy. However, current two dimensional optical spectroscopy systems are complex laboratory arrangements and accordingly limited in deployment. According to embodiments of the invention a monolithic platform providing significantly reduced complexity and increased robustness is provided allowing for “black-box” modules allowing commercial deployment of 2D optical spectroscopy instruments. Additionally, the invention supports high pulse repetition rates as well as one quantum and two quantum measurements under electronic control.
Abstract:
Disclosed is a highly reliable optical fiber measurement device and measurement method having a simple and compact structure. The device includes a planar liquid holder having a plurality of liquid holding portions arranged along a flat face; a plurality of light receiving optical fibers for transmitting fluorescence generated in the liquid holding portions; a plurality of light emitting optical fibers for transmitting excitation light into the liquid holding portions; a measurement head capable of being positioned in the each liquid holding portion while supporting a plurality of measurement ends having a bundle of one light receiving end of the light receiving optical fibers and one light emitting end of light emitting optical fibers; a light reception selecting element that, by sequentially selecting one by one from plural the light receiving optical fibers and sequentially selecting one by one from plural kinds of wavelength or wavelength bands, sequentially guides the light of the selected wavelength or wavelength band of the fluorescence received by the selected light receiving optical fibers to one photoelectric element; and a photoelectric element for sequentially conducting photoelectric conversion on the guided fluorescence.
Abstract:
A hyperspectral imaging system and method are described herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest). The hyperspectral imaging system includes at least one optic, a scannable slit mechanism, a spectrometer, a two-dimensional image sensor, and a controller. The scannable slit mechanism can be a micro-electromechanical system spatial light modulator (MEMS SLM), a diffractive Micro-Opto-Electro-Mechanical Systems (MOEMS) spatial light modulator (SLM), a digital light processing (DLP) system, a liquid crystal display, a rotating drum with at least one slit formed therein, or a rotating disk with at least one slit formed therein.
Abstract:
A method and apparatus is disclosed for using below deep ultra-violet (DUV) wavelength reflectometry for measuring properties of diffracting and/or scattering structures on semiconductor work-pieces is disclosed. The system can use polarized light in any incidence configuration, but one technique disclosed herein advantageously uses un-polarized light in a normal incidence configuration. The system thus provides enhanced optical measurement capabilities using below deep ultra-violet (DUV) radiation, while maintaining a small optical module that is easily integrated into other process tools. A further refinement utilizes an r-θ stage to further reduce the footprint.
Abstract:
The present subject matter relates to an apparatus and related method of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
Abstract:
Disclosed is a highly reliable optical fiber measurement device and measurement method having a simple and compact structure. The device includes a planar liquid holder having a plurality of liquid holding portions arranged along a flat face; a plurality of light receiving optical fibers for transmitting fluorescence generated in the liquid holding portions; a plurality of light emitting optical fibers for transmitting excitation light into the liquid holding portions; a measurement head capable of being positioned in the each liquid holding portion while supporting a plurality of measurement ends having a bundle of one light receiving end of the light receiving optical fibers and one light emitting end of light emitting optical fibers; a light reception selecting element that, by sequentially selecting one by one from plural the light receiving optical fibers and sequentially selecting one by one from plural kinds of wavelength or wavelength bands, sequentially guides the light of the selected wavelength or wavelength band of the fluorescence received by the selected light receiving optical fibers to one photoelectric element; and a photoelectric element for sequentially conducting photoelectric conversion on the guided fluorescence.
Abstract:
The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Abstract:
A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting light from a light source; reflecting the light from the sample; directing a portion of the light reflected from the sample with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the light reflected from the sample, the optical filter mechanism configured to filter and measure data carried by the light reflected from the sample.