摘要:
A driver circuit that prevents amplitude reduction at a high temperature comprises a differential pre-buffer circuit 22 for performing signal clamping by diodes 16 and 17 each having a nonlinear voltage-current characteristic with respect to an input signal and a differential output circuit 23 for amplifying output signals of the differential pre-buffer circuit 22, for output. The driver circuit further includes a temperature characteristic compensation circuit 44 for controlling direct currents to be passed through the diodes 16 and 17 based on a current to be passed through a diode 43 having a voltage-current characteristic with the same temperature coefficient as those of the diodes 16 and 17. A current related to constant currents I1 and I2 is supplied from the temperature characteristic compensation circuit 44 as a current that cancels the temperature characteristic of a fall in forward voltages of the diodes 16 and 17.
摘要:
Disclosed is a communication circuit including a clock selection circuit (20) which receives CDR multiple-phase clocks (16) from a PLL (1) to a CDR circuit (7), selects one of the CDR multiple-phase clock signals (16) responsive to a clock selection signal (21), and outputs the selected clock signal. At a time of the loopback test, the clock signal selected by the clock selection circuit (20) is used as a transmit clock (11). Transmit data is looped back from an input/output terminal (4) to a receiver circuit (6). Data from the receiver circuit (6) is supplied to the CDR circuit (7), and comparison between recovered data from the CDR circuit (7) and expected value data is made by a comparison circuit (8), thereby conducting the test. By changing a phase of the transmit clock (11) by the clock selection circuit (20), a delay time (=tTx+tRx) which is a sum of a transmit circuit delay time (tTx) and a receiver circuit delay time (tRx) can be varied.
摘要:
A method of exposing a wafer to a charged-particle beam by directing to the wafer the charged-particle beam deflected by a deflector includes the steps of arranging a plurality of first marks at different heights, focusing the charged-particle beam on each of the first marks by using a focus coil provided above the deflector, obtaining a focus distance for each of the first marks, obtaining deflection-efficiency-correction coefficients for each of the first marks, and using linear functions of the focus distance for approximating the deflection-efficiency-correction coefficients to obtain the deflection-efficiency-correction coefficients for an arbitrary value of the focus distance. A device for carrying out the method is also set forth.
摘要:
A periodic low current from an intermittent Low current generator 5 is used, and fluctuations of r1 and r10, c1 and c2, and I6 and I20, thus cancel one another. Thus, .omega..sub.0 is not fluctuated unless the oscillation frequency Tosc of a pulse wave generator OSC is fluctuated. Television and ratio audio ICs using an LPF filter do not require specific provision of any oscillator for a filter circuit, because they have an accurate oscillator. The oscillation frequency of the pulse wave generator OSC should be at least 20 times the pass band of the filter circuit.
摘要:
A method of detecting deficiency of an aperture used in a charged-particle-beam exposure process employing at least two exposure columns is disclosed, where each of the two exposure columns passes a charged-particle beam through the aperture formed through a mask to shape a cross section of the charged-particle beam before exposing the charged-particle beam onto an object. The method includes the steps of mounting masks having the same aperture to the at least two exposure columns; scanning, in each of the at least two exposure columns, the charged-particle beam over an area containing a mark on a surface substantially at the same height as the object after passing the charged-particle beam through the same aperture; obtaining, in each of the at least two exposure columns, a signal waveform corresponding to the scan by detecting charged particles scattered by the mark; and comparing the signal waveform between the at least two exposure columns.
摘要:
A differential amplifier includes first and second current paths, each connected between first and second power supplies (PS) and respectively outputting first and second differential output signals. The first current path includes: first transistor, selectively interconnected between the first PS and a first output terminal, its gate receiving one differential input signal; second transistor, connected between the second PS and the first output terminal, its gate receiving the other differential input signal; and first switch circuit. The second current path includes: third transistor, selectively interconnected between the second PS and a second output terminal, its gate receiving one differential input signal; fourth transistor, connected between the first PS and the second output terminal, its gate receiving the other differential input signal; and second switch circuit. One of the first and second switch circuits is connected to the first PS and the other is connected to the second PS.
摘要:
A method of exposing a wafer to a charged-particle beam by directing to the wafer the charged-particle beam deflected by a deflector includes the steps of arranging a plurality of first marks at different heights, focusing the charged-particle beam on each of the first marks by using a focus coil provided above the deflector, obtaining a focus distance for each of the first marks, obtaining deflection-efficiency-correction coefficients for each of the first marks, and using linear functions of the focus distance for approximating the deflection-efficiency-correction coefficients to obtain the deflection-efficiency-correction coefficients for an arbitrary value of the focus distance. A device for carrying out the method is also set forth.
摘要:
A semiconductor integrated circuit includes a macro connected between a first power supply line and a second power supply line to drive a load, and a power-supply-noise cancelling circuit connected between an input and an output of the macro to generate a current for canceling one of a current flowing from the first power supply line to the output of the macro and a current flowing from the output of the macro to the second power supply line, on the basis of a potential difference between the input and the output of the macro. The macro and the power-supply-noise cancelling circuit are mounted in a same chip.
摘要:
A semiconductor integrated circuit includes a macro connected between a first power supply line and a second power supply line to drive a load, and a power-supply-noise cancelling circuit connected between an input and an output of the macro to generate a current for canceling one of a current flowing from the first power supply line to the output of the macro and a current flowing from the output of the macro to the second power supply line, on the basis of a potential difference between the input and the output of the macro. The macro and the power-supply-noise cancelling circuit are mounted in a same chip.
摘要:
A differential amplifier including: 1st transistor that is connected between 1st power-supply terminal and 1st output terminal, and has a control terminal receiving one of the differential input signals; 2nd transistor that is connected between 2nd power-supply terminal and 1st output terminal, and has a control terminal receiving the other of the differential input signals; 1st switch that is connected between 1st power-supply terminal and 1st transistor; 3rd transistor that is connected between 2nd power-supply terminal and 2nd output terminal, and has a control terminal is input to one of the differential input signals; 4th transistor that is connected between 1st power-supply terminal and 2nd output terminal, and has a control terminal receiving the other of the differential input signals; 2nd switch that is connected between 2nd power-supply terminal and 3rd transistor. Drive state of 1st and 2nd switches are controlled by a control signal.