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    Integrated inspection system and defect correction method
    3.
    发明申请
    Integrated inspection system and defect correction method 失效
    综合检测系统和缺陷校正方法

    公开(公告)号：US20070117225A1

    公开(公告)日：2007-05-24

    申请号：US11285331

    申请日：2005-11-21

    Applicant: Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

    Inventor： Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

    IPC: H01L21/66

    CPC classification number: G01N21/95 ,  G01N21/8422 ,  G01N21/8806

    Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

    Abstract translation: 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。

    DEVICES AND METHODS FOR OPTICAL DETECTION
    6.
    发明申请
    DEVICES AND METHODS FOR OPTICAL DETECTION 审中-公开
    用于光学检测的装置和方法

    公开(公告)号：US20110122412A1

    公开(公告)日：2011-05-26

    申请号：US12623714

    申请日：2009-11-23

    Applicant: Chulmin Joo ,  Anthony John Murray ,  Masako Yamada

    Inventor： Chulmin Joo ,  Anthony John Murray ,  Masako Yamada

    IPC: G01J3/45

    CPC classification number: G01N33/6845 ,  G01N21/0332 ,  G01N21/05 ,  G01N21/45 ,  G01N21/53 ,  G01N2021/0346

    Abstract: An optical detection system for sensing one or more samples is provided. The optical detection system comprises a broadband light source that emits a beam comprising a continuous spectrum over a range of wavelengths; a fluidic cell comprising one or more channels that positions the sample so that at least a portion of the beam is directed on the sample to produce a back reflected beam; and a spectrometer that analyzes an interference spectrum of the beam back reflected from the sample.

    Abstract translation: 提供了用于感测一个或多个样品的光学检测系统。 光学检测系统包括宽带光源，其发射包括波长范围上的连续光谱的光束; 流体单元包括一个或多个通道，其定位样品，使得至少一部分光束被引导到样品上以产生反射反射光束; 以及分析从样品反射的光束的干涉光谱的光谱仪。

    FILM, BACKLIGHT DISPLAYS, AND METHODS FOR MAKING THE SAME
    7.
    发明申请
    FILM, BACKLIGHT DISPLAYS, AND METHODS FOR MAKING THE SAME 有权
    电影，背光显示及其制作方法

    公开(公告)号：US20090052045A1

    公开(公告)日：2009-02-26

    申请号：US12141674

    申请日：2008-06-18

    Applicant: Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    Inventor： Dennis Joseph Coyle ,  Eugene George Olczak ,  Masako Yamada ,  Scott Michael Miller ,  Nitin Garg

    IPC: G02B27/12

    CPC classification number: G02B6/0053 ,  G02B5/045 ,  G02B6/0061 ,  G02F1/133606 ,  G02F1/133611 ,  G02F2001/133607

    Abstract: In one embodiment a film can comprises a surface comprising a plurality of prism structures. Each prism structure has a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures. The plurality of prism structures can have a variation in the w direction of prism peak height that is discrete and/or continuous. In one embodiment, a method for making a film can comprise forming a plurality of prism structures on a surface. The plurality of prism structures can have a lateral modulation in the w direction of less than or equal to ±20% of an average pitch of the prism structures, and wherein the plurality of prism structures have a variation in the w direction of prism peak height that is discrete and/or continuous.

    Abstract translation: 在一个实施例中，膜可以包括包括多个棱镜结构的表面。 每个棱镜结构在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制。 多个棱镜结构可以具有离散和/或连续的棱镜峰高的w方向的变化。 在一个实施例中，制造薄膜的方法可以包括在表面上形成多个棱镜结构。 多个棱镜结构可以在w方向上具有小于或等于棱镜结构的平均间距的±20％的横向调制，并且其中多个棱镜结构具有棱镜峰高的w方向的变化 这是离散和/或连续的。

    Method and apparatus for measuring prism characteristics
    10.
    发明申请
    Method and apparatus for measuring prism characteristics 失效
    用于测量棱镜特性的方法和装置

    公开(公告)号：US20070115465A1

    公开(公告)日：2007-05-24

    申请号：US11286061

    申请日：2005-11-23

    Applicant: Dennis Coyle ,  Micah Sze ,  Masako Yamada

    Inventor： Dennis Coyle ,  Micah Sze ,  Masako Yamada

    IPC: G01N21/88

    CPC classification number: G01N21/958 ,  G01M11/0235

    Abstract: Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the distance disposed on an opposing side of the prism sheet from the side that the light beam is incident upon. Measurement of two angles of the refracted images of the beam on the ruled scale, measured twice, illuminating the sample at different angles are used in an equation to simultaneously provide the apex angle, the skew angle and the refractive index of the prism sheet.

    Abstract translation: 本文公开了一种方法，其包括用入射光束照射棱镜片的微结构棱镜或棱镜的线性阵列。 该方法还包括在测量装置上测量光束的折射图像，以测量从光束入射的一侧设置在棱镜片的相对侧上的距离。 在等式中使用测量两次，以不同角度照射样品的刻度上的束的折射图像的两个角度的两个角度，以同时提供棱镜片的顶角，斜角和折射率。

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