Lateral interposer contact design and probe card assembly
    4.
    发明申请
    Lateral interposer contact design and probe card assembly 审中-公开
    横向插入器触点设计和探针卡组合

    公开(公告)号:US20070075717A1

    公开(公告)日:2007-04-05

    申请号:US11633324

    申请日:2006-12-04

    IPC分类号: G01R31/02

    摘要: The present invention is directed to an interposer having an interposer substrate with an upper surface and a lower surface and at least one resilient contact element having an upper portion and a lower portion. The upper portion extends in a substantially vertical fashion above the upper surface of said interposer substrate, and the lower portion extends in a substantially vertical fashion below the lower surface of said interposer substrate. The upper and lower portions of the resilient contact element are substantially resilient in a direction parallel to the substrate.

    摘要翻译: 本发明涉及具有具有上表面和下表面的插入件基板和至少一个具有上部和下部的弹性接触元件的插入件。 上部部分以大致垂直的方式在所述插入器基板的上表面上方延伸,并且下部部分以基本垂直的方式延伸到所述插入器基板的下表面之下。 弹性接触元件的上部和下部在平行于基底的方向上基本上具有弹性。