公开(公告)号：US10177530B2

公开(公告)日：2019-01-08

申请号：US15379856

申请日：2016-12-15

申请人： Toshihiro Ishii ,  Yoichiro Takahashi ,  Sunao Chubachi ,  Masayuki Fujiwara ,  Toshihide Sasaki ,  Kazuhiko Adachi

发明人： Toshihiro Ishii ,  Yoichiro Takahashi ,  Sunao Chubachi ,  Masayuki Fujiwara ,  Toshihide Sasaki ,  Kazuhiko Adachi

IPC分类号： H01S5/026 ,  A61B5/00 ,  A61B5/16 ,  G01J1/02 ,  G01N21/47 ,  H01L31/0224 ,  H01L31/0232 ,  H01L31/103 ,  H01L31/167 ,  H01S5/183 ,  A61B5/026 ,  A61B5/055 ,  A61B5/1455 ,  G01J1/04 ,  G01N21/359 ,  G01N21/49 ,  H01S5/42 ,  H01S5/022

摘要： An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.

公开(公告)号：US20150334263A1

公开(公告)日：2015-11-19

申请号：US14709872

申请日：2015-05-12

申请人： Sunao CHUBACHI

发明人： Sunao CHUBACHI

IPC分类号： H04N1/028

CPC分类号： H04N1/02815 ,  B41J11/009 ,  G03G15/5029 ,  G03G15/607 ,  G03G2215/00324 ,  G03G2215/00616

摘要： A sensor device includes an irradiation unit that includes a light source and irradiates an object with light, an optical detection unit disposed on an optical path of light emitted from the irradiation unit and reflected at the object, at least one object sensor that detects presence of the object, and a controller that controls the light source based on output from the object sensor.

摘要翻译： 传感器装置包括：照射单元，其包括光源并用光照射物体;光学检测单元，设置在从所述照射单元发射的光的光路上并在所述物体处反射;至少一个物体传感器， 物体，以及基于来自物体传感器的输出来控制光源的控制器。

公开(公告)号：US09374491B2

公开(公告)日：2016-06-21

申请号：US14709872

申请日：2015-05-12

申请人： Sunao Chubachi

发明人： Sunao Chubachi

IPC分类号： H04N1/04 ,  H04N1/028 ,  B41J11/00 ,  G03G15/00

CPC分类号： H04N1/02815 ,  B41J11/009 ,  G03G15/5029 ,  G03G15/607 ,  G03G2215/00324 ,  G03G2215/00616

摘要： A sensor device includes an irradiation unit that includes a light source and irradiates an object with light, an optical detection unit disposed on an optical path of light emitted from the irradiation unit and reflected at the object, at least one object sensor that detects presence of the object, and a controller that controls the light source based on output from the object sensor.

摘要翻译： 传感器装置包括：照射单元，其包括光源并用光照射物体;光学检测单元，设置在从所述照射单元发射的光的光路上并在所述物体处反射;至少一个物体传感器， 物体，以及基于来自物体传感器的输出来控制光源的控制器。

公开(公告)号：US06700618B1

公开(公告)日：2004-03-02

申请号：US09441663

申请日：1999-11-16

申请人： Sunao Chubachi

发明人： Sunao Chubachi

IPC分类号： H04N5232

CPC分类号： H04N5/23212

摘要： A focus point detecting apparatus comprises a HPF which extracts a high-frequency component from a picked-up image, and an ABS circuit which obtains an absolute value of the outputs of the HPF. A base clipping circuit removes a component equal to or less than a first threshold value from the output of the ABS circuit, and an another base clipping circuit removes a component equal to or less than a second threshold value which is larger than the first threshold value from the output of the ABS circuit. An integrator integrates the output of one of the base clipping circuits and an another integrator integrates the output of the other base clipping circuit. Finally, a computing circuit detects a focus point according to the integrated values in the two integrators. Therefore, focus point can be detected with higher precision.

摘要翻译： 焦点检测装置包括从拾取图像中提取高频分量的HPF和获得HPF的输出的绝对值的ABS电路。 基准限幅电路从ABS电路的输出去除等于或小于第一阈值的分量，另一基准削波电路去除等于或小于大于第一阈值的第二阈值的分量 从ABS电路的输出。 积分器集成了一个基本限幅电路的输出，另一个积分器对另一个基准削波电路的输出进行了积分。 最后，计算电路根据两个积分器中的积分值检测焦点。 因此，可以更高精度地检测焦点。

公开(公告)号：US20170179682A1

公开(公告)日：2017-06-22

申请号：US15379856

申请日：2016-12-15

申请人： Toshihiro ISHII ,  Yoichiro TAKAHASHI ,  Sunao CHUBACHI ,  Masayuki FUJIWARA ,  Toshihide SASAKI ,  Kazuhiko ADACHI

发明人： Toshihiro ISHII ,  Yoichiro TAKAHASHI ,  Sunao CHUBACHI ,  Masayuki FUJIWARA ,  Toshihide SASAKI ,  Kazuhiko ADACHI

IPC分类号： H01S5/026 ,  H01S5/42 ,  G01N21/47 ,  G01J1/02 ,  A61B5/16 ,  H01L31/0232 ,  H01L31/0224 ,  H01L31/103 ,  A61B5/00 ,  H01S5/183 ,  H01L31/167

CPC分类号： H01S5/0262 ,  A61B5/0042 ,  A61B5/0073 ,  A61B5/0261 ,  A61B5/055 ,  A61B5/1455 ,  A61B5/165 ,  A61B5/4887 ,  A61B2505/09 ,  A61B2562/0233 ,  A61B2562/146 ,  A61B2562/16 ,  G01J1/0209 ,  G01J1/0411 ,  G01N21/359 ,  G01N21/4785 ,  G01N21/4795 ,  G01N21/49 ,  G01N2201/0612 ,  H01L31/022408 ,  H01L31/02327 ,  H01L31/103 ,  H01L31/167 ,  H01S5/02208 ,  H01S5/02288 ,  H01S5/0264 ,  H01S5/18347 ,  H01S5/18358 ,  H01S5/423

摘要： An optical sensor, an optical examination device, and a method of detecting optical properties. The optical sensor includes an irradiation system including light irradiator to irradiate a test object with light, and a detection system to detect the light that is emitted from the irradiation system to the test object and has propagated through the test object. The light irradiator includes a multilayered structure having an active layer, and the multilayered structure includes a surface-emitting laser element and a photo-sensing element optically connected to the surface-emitting laser element. The optical examination device includes the optical sensor, and a controller to calculate optical properties of the test object based on a detection result of the optical sensor. The method includes performing optical simulation to obtain a detection light quantity distribution for an optical model and performing inverse problem estimation.