摘要:
This invention provides a semiconductor flip chip package including a carrier substrate and a flip chip mounted on the carrier substrate. The flip chip comprises a first input/output (I/O) pad and a second I/O pad on an active surface of the flip chip, wherein a switching between the first I/O pad and the second I/O pad is implemented by wire bonding.
摘要:
A QFN semiconductor package includes a die attach pad; a semiconductor die mounted on the die attach pad; an inner terminal lead disposed adjacent to the die attach pad; a first wire bonding the inner terminal lead to the semiconductor die; an extended, outer terminal lead disposed along periphery of the QFN semiconductor package, wherein the extended, outer terminal lead is disposed beyond a maximum wire length which is provided for a specific minimum pad opening size on the semiconductor die; an intermediary terminal disposed between the inner terminal lead and the extended, outer terminal lead; a second wire bonding the intermediary terminal to the semiconductor die; and a trace interconnecting the intermediary terminal to the extended, outer terminal lead.
摘要:
A method for making a quad flat non-lead (QFN) semiconductor package includes half etching a first side of a carrier to form top portions of a lead array and a die attach surface of a die attach pad, wherein the lead array includes at least one inner terminal lead disposed adjacent to the die attach pad, at least one extended, outer terminal lead disposed along periphery of the QFN semiconductor package, and at least one intermediary terminal disposed between the inner terminal lead and the extended, outer terminal lead, wherein the intermediary terminal is disposed between the inner terminal lead and the extended, outer terminal lead.
摘要:
A semiconductor chip package is disclosed. The semiconductor chip package comprises a package substrate having a bottom surface. At least four adjacent ball pads are on the bottom surface, arranged in a first two-row array along a first direction and a second direction. At least four vias are drilled through the package substrate, arranged in a second two-row array, wherein each of the vias in a row of the second two-row array is offset by a first distance along the first direction and a second distance along the second direction from the connecting ball pads in a row of the first two-row array, and each of the vias in the other adjacent row of the second two-row array is offset by the first distance along an opposite direction to the first direction and the second distance along the second direction from the connecting ball pads in the other adjacent row of the first two-row array.
摘要:
A QFN semiconductor package includes a die attach pad; a semiconductor die mounted on the die attach pad; an inner terminal lead disposed adjacent to the die attach pad; a first wire bonding the inner terminal lead to the semiconductor die; an extended, outer terminal lead disposed along periphery of the QFN semiconductor package, wherein the extended, outer terminal lead is disposed beyond a maximum wire length which is provided for a specific minimum pad opening size on the semiconductor die; an intermediary terminal disposed between the inner terminal lead and the extended, outer terminal lead; a second wire bonding the intermediary terminal to the semiconductor die; and a trace interconnecting the intermediary terminal to the extended, outer terminal lead.
摘要:
A QFN semiconductor package includes a die attach pad; a semiconductor die mounted on the die attach pad; an inner terminal lead disposed adjacent to the die attach pad; a first wire bonding the inner terminal lead to the semiconductor die; an extended, outer terminal lead disposed along periphery of the QFN semiconductor package, wherein the extended, outer terminal lead is disposed beyond a maximum wire length which is provided for a specific minimum pad opening size on the semiconductor die; an intermediary terminal disposed between the inner terminal lead and the extended, outer terminal lead; a second wire bonding the intermediary terminal to the semiconductor die; and a third wire bonding the intermediary terminal to the extended, outer terminal lead.
摘要:
Means for measuring a working machine's structural deviation from five reference axes includes a main sensing body bonded with a main axis of the working machine (or controlled to revolve), and a lighting unit set around the main sensing body to circle about the main sensing body with a fixed radius (or the lighting unit radiates a light on the main sensing body from that radial distance and circles along with the main sensing body) such that as soon as the main sensing body has detected an optical signal, it is converted to an error signal informing of the working machine's structural deviation in two or three dimensional displacement.
摘要:
A static/dynamic multi-function measuring device for linear unit, includes a foundation, a multi-direction sliding unit having eddy current detector, a linear motor, a linear unit with a sensing element and an optical measuring unit; the static/dynamic multi-function measuring device uses the linear motor to drive the multi-direction sliding unit with low friction to provide a non-contact measurement of a parallel alignment of the linear unit, a linear accuracy measurement of the linear unit, and a vibration measurement of the linear unit to detect the parallel alignment of the linear unit and the linear accuracy of a slide rail and so on, the static/dynamic multi-function measuring device also measures errors of the linear unit and a slide block moving in the vibrating and the rolling direction.
摘要:
A semiconductor chip package is disclosed. The semiconductor chip package comprises a package substrate having a bottom surface. At least four adjacent ball pads are on the bottom surface, arranged in a first two-row array along a first direction and a second direction. At least four vias are drilled through the package substrate, arranged in a second two-row array, wherein each of the vias in a row of the second two-row array is offset by a first distance along the first direction and a second distance along the second direction from the connecting ball pads in a row of the first two-row array, and each of the vias in the other adjacent row of the second two-row array is offset by the first distance along an opposite direction to the first direction and the second distance along the second direction from the connecting ball pads in the other adjacent row of the first two-row array.
摘要:
A method of numerical-control scraping of a work piece has a preparing step, a scanning step, a flatness-parameter inputting step, a surface-finishing step, a related-parameter inputting step, an auto-scraping step and an analyzing step. The preparing step comprises preparing a multi-axis machine tool, a laser displacement meter, an auto scraping apparatus and a computer. The scanning step comprises scanning the work piece. The flatness-parameter inputting step comprises inputting a flatness-parameter. The surface-finishing step comprises calculating out the to-be-scraped ranges of the work piece and scraping the work piece. The related-parameter inputting step comprises inputting desired PPI and POP in the computer, calculating out the HOP, the DOS and the oil content to obtain the length, the width and the depth of a single scraping process. The auto-scraping step comprises scraping the work piece to meet the requirement. The analyzing step comprises detecting the 3D-appearance drawing of the work piece.