Abstract:
An apparatus for providing an antibacterial film according to an embodiment of the present disclosure makes it possible to place an antibacterial film over a button on a manipulation panel through an antibacterial film providing unit and an antibacterial film recovery unit, thereby preventing the spread of bacteria that may be transmitted by many users' button manipulation. Additionally, it is possible to automatically replace the antibacterial film that covers the button on the manipulation panel at a predetermined time interval set through an auto-timer unit, thereby improving the convenience of use. Additionally, it is possible to sterilize the antibacterial film after use through a sterilization unit provided in the antibacterial film recovery unit for reuse, thereby achieving resource savings.
Abstract:
An organic light emitting display apparatus includes a substrate, an organic light emitting portion comprising a plurality of organic light emitting devices formed on the substrate, and an encapsulation portion for encapsulating the organic light emitting portion. The encapsulation portion includes a porous layer formed on the organic light emitting portion, a planarization layer formed on the porous layer, and a barrier layer formed on the planarization layer. The porous layer prevents impurities from being concentrated at a part of the porous layer.
Abstract:
A test socket is provided that includes a base material including an insulating elastic material and a conductive portion extending through the base material in a thickness direction of the base material, wherein the conductive portion includes a plurality of conductive particle structures arranged in the thickness direction of the base material, and each of the plurality of conductive particle structures includes a plurality of conductive particles having at least one insulating wire and/or at least one conductive wire extending from a surface of the conductive particle, bonded with a material having a functional group.
Abstract:
Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.
Abstract:
Provided is an apparatus and method for obtaining depth information using an optical pattern. The apparatus for obtaining depth information using the optical pattern may include: a pattern projector to generate the optical pattern using a light source and an optical pattern projection element (OPPE), and to project the optical pattern towards an object area, the OPPE comprising a pattern that includes a plurality of pattern descriptors; an image obtaining unit to obtain an input image by photographing the object area; and a depth information obtaining unit to measure a change in a position of at least one of the plurality of pattern descriptors in the input image, and to obtain depth information of the input image based on the change in the position.
Abstract:
A battery module according to the present invention includes rechargeable batteries that include a first terminal and a second terminal which protrude outward, the first terminal including differentiation portions formed of an indentation or a protruding portion to differentiate the first terminal from the second terminal; and connection members that electrically connect the rechargeable batteries, fixed to the first and second terminals of adjacent rechargeable batteries, including verification portions which fit the differentiation portions so as to improve assemblability and minimize contact resistance.
Abstract:
A barrier film composite includes a decoupling layer and a barrier layer. The barrier layer includes a first region and a second region that is thinner than the first region.
Abstract:
Embodiments of the present invention provide methods to etching a recess channel in a semiconductor substrate, for example, a silicon containing material. In one embodiment, a method of forming a recess structure in a semiconductor substrate includes transferring a silicon substrate into a processing chamber having a patterned photoresist layer disposed thereon exposing a portion of the substrate, providing an etching gas mixture including a halogen containing gas and a Cl2 gas into the processing chamber, supplying a RF source power to form a plasma from the etching gas mixture, supplying a pulsed RF bias power in the etching gas mixture, and etching the portion of the silicon substrate exposed through the patterned photoresist layer in the presence of the plasma.
Abstract:
A patterning slit sheet frame assembly includes a patterning slit sheet having a pattern, a patterning slit sheet frame supporting the patterning slit sheet, and a tensile force application unit that applies a tensile force to the patterning slit sheet after the patterning slit sheet is disposed on the patterning slit sheet frame.
Abstract:
A thin film deposition apparatus and a method of depositing a thin film using the thin film deposition apparatus, the thin film deposition apparatus including a chamber having a substrate and a mask mounted therein; a deposition source, the deposition source supplying a deposition gas to the substrate; and a mask measuring unit, the mask measuring unit measuring a status of the mask within the chamber.