摘要:
A program verification method is for a nonvolatile memory device which programs a plurality of memory cells. The program verification method includes applying a plurality of verification voltages, and determining whether programming of memory cells, having different target threshold voltage distributions, from among the plurality of memory cells is completed based on one of the plurality of verification voltages.
摘要:
A vertical nonvolatile memory device which includes a plurality of cell strings formed in a direction intersecting with a substrate is provided. The vertical nonvolatile memory device is configured to apply a non-selection read voltage to at least one selection line connected to a cell string from among the plurality of cell strings. The vertical nonvolatile memory device is configured to apply the non-selection read voltage to at least one unselected word line of the cell string a desired time period after the applying of the non-selection read voltage to the at least one selection line.
摘要:
A nonvolatile memory device includes a plurality of vertical NAND flash memory cells arranged in a three dimensional (3D) structure, a first memory block disposed in the 3D structure and having memory cells selected by a first ground selection line and a second ground selection line, wherein the first and second ground selection lines are electrically separated from each other, a second memory block disposed in the 3D structure and having memory cells selected by a third selection line and fourth selection line, wherein the third and fourth ground selection lines are electrically separated from each other, and a pass transistor that transfers a driving signal to turn on ground selection transistors respectively connected to the first and third ground selection lines in response to a block selection signal.
摘要:
A nonvolatile memory device comprises a plurality of vertical NAND flash memory cells arranged in a three dimensional (3D) structure, a first memory block disposed in the 3D structure and having memory cells selected by a first ground selection line and a second ground selection line, wherein the first and second ground selection lines are electrically separated from each other, a second memory block disposed in the 3D structure and having memory cells selected by a third selection line and fourth selection line, wherein the third and fourth ground selection lines are electrically separated from each other, and a pass transistor that transfers a driving signal to turn on ground selection transistors respectively connected to the first and third ground selection lines in response to a block selection signal.
摘要:
A program verification method is for a nonvolatile memory device which programs a plurality of memory cells. The program verification method includes applying a plurality of verification voltages, and determining whether programming of memory cells, having different target threshold voltage distributions, from among the plurality of memory cells is completed based on one of the plurality of verification voltages.
摘要:
A vertical nonvolatile memory device which includes a plurality of cell strings formed in a direction intersecting with a substrate is provided. The vertical nonvolatile memory device is configured to apply a non-selection read voltage to at least one selection line connected to a cell string from among the plurality of cell strings. The vertical nonvolatile memory device is configured to apply the non-selection read voltage to at least one unselected word line of the cell string a desired time period after the applying of the non-selection read voltage to the at least one selection line.