公开(公告)号：US10276236B2

公开(公告)日：2019-04-30

申请号：US15597709

申请日：2017-05-17

Applicant: Silicon Storage Technology, Inc. ,  Agency For Science, Technology, and Research

Inventor： Santosh Hariharan ,  Hieu Van Tran ,  Feng Zhou ,  Xian Liu ,  Steven Lemke ,  Nhan Do ,  Zhixian Chen ,  Xinpeng Wang

IPC: G11C13/00 ,  G11C11/00 ,  H01L27/24 ,  H01L45/00

Abstract: A memory device includes a metal oxide material disposed between and in electrical contact with first and second conductive electrodes, and an electrical current source configured to apply one or more electrical current pulses through the metal oxide material. For each of the one or more electrical current pulses, an amplitude of the electrical current increases over time during the electrical current pulse to form a conductive filament in metal oxide material.

公开(公告)号：US20130270508A1

公开(公告)日：2013-10-17

申请号：US13860870

申请日：2013-04-11

Applicant: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH

Inventor： Xiang LI ,  Navab Singh ,  Zhixian Chen ,  Xinpeng Wang ,  Guo-Qiang Patrick Lo

IPC: H01L45/00

CPC classification number: H01L45/1206 ,  B82Y10/00 ,  H01L27/2454 ,  H01L27/2463 ,  H01L45/04 ,  H01L45/122 ,  H01L45/1226 ,  H01L45/1233 ,  H01L45/146 ,  H01L45/16 ,  H01L45/1675 ,  Y10S977/762 ,  Y10S977/84 ,  Y10S977/938

Abstract: According to embodiments of the present invention, a non-volatile memory device is provided. The non-volatile memory device includes a nanowire transistor including a nanowire channel, and a resistive memory cell arranged adjacent to the nanowire transistor and in alignment with a longitudinal axis of the nanowire channel. According to further embodiments of the present invention, a method of forming a non-volatile memory device is also provided.

Abstract translation: 根据本发明的实施例，提供了一种非易失性存储器件。 非易失性存储器件包括纳米线晶体管，其包括纳米线通道，以及与纳米线晶体管相邻并且与纳米线通道的纵向轴线对准布置的电阻存储器单元。 根据本发明的另外的实施例，还提供了一种形成非易失性存储器件的方法。

公开(公告)号：US09959927B2

公开(公告)日：2018-05-01

申请号：US15404087

申请日：2017-01-11

Applicant: Silicon Storage Technology, Inc. ,  Agency For Science, Technology And Research

Inventor： Feng Zhou ,  Xian Liu ,  Nhan Do ,  Hieu Van Tran ,  Hung Quoc Nguyen ,  Mark Reiten ,  Zhixian Chen ,  Wang Xinpeng ,  Guo-Qiang Lo

IPC: G11C16/04 ,  G11C13/00 ,  H01L45/00

CPC classification number: G11C13/0007 ,  H01L45/08 ,  H01L45/1233 ,  H01L45/145 ,  H01L45/146 ,  H01L45/16

Abstract: A memory device and method comprising a metal oxide material disposed between and in electrical contact with first and second conductive electrodes, and a voltage source configured to apply a plurality of voltage pulses spaced apart in time across the first and second electrodes. For each one of the voltage pulses, an amplitude of the voltage increases during the voltage pulse.

公开(公告)号：US20180033482A1

公开(公告)日：2018-02-01

申请号：US15597709

申请日：2017-05-17

Applicant: Silicon Storage Technology, Inc. ,  Agency For Science, Technology, and Research

Inventor： Santosh Hariharan ,  Hieu Van Tran ,  Feng Zhou ,  Xian Liu ,  Steven Lemke ,  Nhan Do ,  Zhixian Chen ,  Xinpeng Wang

IPC: G11C13/00 ,  H01L27/24 ,  H01L45/00

CPC classification number: G11C13/0011 ,  G11C11/00 ,  G11C13/0007 ,  G11C13/0064 ,  G11C13/0069 ,  G11C2013/0066 ,  G11C2013/0078 ,  G11C2013/0083 ,  G11C2013/0088 ,  G11C2013/0092 ,  G11C2213/79 ,  H01L27/2436 ,  H01L27/2463 ,  H01L45/04 ,  H01L45/085 ,  H01L45/146

Abstract: A memory device includes a metal oxide material disposed between and in electrical contact with first and second conductive electrodes, and an electrical current source configured to apply one or more electrical current pulses through the metal oxide material. For each of the one or more electrical current pulses, an amplitude of the electrical current increases over time during the electrical current pulse to form a conductive filament in metal oxide material.