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公开(公告)号:US20230138460A1
公开(公告)日:2023-05-04
申请号:US18089458
申请日:2022-12-27
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Che-Ting LIU , Jheng-Yu HONG , Yu-Ting LU , Po-Chun LEE , Chih-Hsiang HSU
IPC: H01L23/00 , H01L21/56 , H01L21/683 , H01L21/78 , H01L23/544 , H01L21/67
Abstract: A method and a system for manufacturing a semiconductor package structure are provided. The method includes: (a) providing a package body including at least one semiconductor device encapsulated in an encapsulant; (b) providing a flattening force to the package body; (c) thinning the package body after (b); (d) attaching a film to the package body; and (e) releasing the flattening force after (d).
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公开(公告)号:US20210074664A1
公开(公告)日:2021-03-11
申请号:US16565158
申请日:2019-09-09
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Yu-Pin TSAI , Ming-Chi LIU , Yu-Ting LU , Kai-Chiang HSU , Che-Ting LIU
IPC: H01L23/00 , H01L23/498 , H01L23/31 , H01L23/29 , H01L25/10 , H01L21/683 , H01L21/78 , H01L21/56
Abstract: A semiconductor package structure includes a semiconductor device with an active surface, a conductive pillar on the conductive pad, an adhesion strengthening layer, and an encapsulant in contact with the adhesion strengthening layer. The conductive pillar has a side surface and a top surface. The adhesion strengthening layer is conformally disposed on the side surface of the conductive pillar and the active surface of the semiconductor device.
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公开(公告)号:US20220139872A1
公开(公告)日:2022-05-05
申请号:US17086179
申请日:2020-10-30
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Che-Ting LIU , Jheng-Yu HONG , Yu-Ting LU , Po-Chun LEE , Chih-Hsiang HSU
IPC: H01L23/00 , H01L21/67 , H01L21/683 , H01L21/56 , H01L21/78 , H01L23/544
Abstract: A method and a system for manufacturing a semiconductor package structure are provided. The method includes: (a) providing a package body including at least one semiconductor device encapsulated in an encapsulant; (b) providing a flattening force to the package body; (c) thinning the package body after (b); (d) attaching a film to the package body; and (e) releasing the flattening force after (d).
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公开(公告)号:US20190206843A1
公开(公告)日:2019-07-04
申请号:US16297470
申请日:2019-03-08
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Li-Hao LYU , Chieh-Ju TSAI , Yu-Kai LIN , Wei-Ming HSIEH , Yu-Pin TSAI , Man-Wen TSENG , Yu-Ting LU
IPC: H01L25/065 , H01L23/538 , H01L23/31 , H01L23/427 , H01L23/498 , H01L23/00 , H01L21/56 , H01L23/28
CPC classification number: H01L25/0657 , H01L21/561 , H01L23/28 , H01L23/3114 , H01L23/3128 , H01L23/3142 , H01L23/427 , H01L23/49816 , H01L23/49838 , H01L23/5389 , H01L23/562 , H01L24/19 , H01L24/20 , H01L2224/04105 , H01L2224/12105 , H01L2224/32225 , H01L2224/73267 , H01L2224/92244 , H01L2224/97 , H01L2225/06513 , H01L2225/06586 , H01L2924/1433 , H01L2924/3511 , H01L2224/83
Abstract: A method for manufacturing a semiconductor device package includes: (1) providing a first encapsulation layer; (2) disposing an adhesive layer on the first encapsulation layer; (3) disposing a first die on the adhesive layer; and (4) forming a second encapsulation layer covering the first die, the adhesive layer, and the first encapsulation layer.
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公开(公告)号:US20240063163A1
公开(公告)日:2024-02-22
申请号:US18498931
申请日:2023-10-31
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Yu-Pin TSAI , Ming-Chi LIU , Yu-Ting LU , Kai-Chiang HSU , Che-Ting LIU
IPC: H01L23/00 , H01L23/31 , H01L23/29 , H01L23/498 , H01L25/10 , H01L21/683 , H01L21/78 , H01L21/56
CPC classification number: H01L24/24 , H01L23/3128 , H01L24/05 , H01L23/295 , H01L23/49838 , H01L24/25 , H01L25/105 , H01L21/6836 , H01L21/78 , H01L21/565 , H01L24/19 , H01L24/97 , H01L23/49827 , H01L2924/35121 , H01L2221/68381 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/19102 , H01L2224/2518 , H01L2224/24226
Abstract: A semiconductor package structure includes a semiconductor device with an active surface, a conductive pillar on the conductive pad, an adhesion strengthening layer, and an encapsulant in contact with the adhesion strengthening layer. The conductive pillar has a side surface and a top surface. The adhesion strengthening layer is conformally disposed on the side surface of the conductive pillar and the active surface of the semiconductor device.
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公开(公告)号:US20210407951A1
公开(公告)日:2021-12-30
申请号:US17473829
申请日:2021-09-13
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Yu-Ping TSAI , Ming-Chi LIU , Yu-Ting LU , Kai-Chiang HSU , Che-Ting LIU
IPC: H01L23/00 , H01L23/31 , H01L23/29 , H01L23/498 , H01L25/10 , H01L21/683 , H01L21/78 , H01L21/56
Abstract: A semiconductor package structure includes a semiconductor device with an active surface, a conductive pillar on the conductive pad, an adhesion strengthening layer, and an encapsulant in contact with the adhesion strengthening layer. The conductive pillar has a side surface and a top surface. The adhesion strengthening layer is conformally disposed on the side surface of the conductive pillar and the active surface of the semiconductor device.
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公开(公告)号:US20180061727A1
公开(公告)日:2018-03-01
申请号:US15675612
申请日:2017-08-11
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Li-Hao LYU , Chieh-Ju TSAI , Yu-Kai LIN , Wei-Ming HSIEH , Yu-Pin TSAI , Man-Wen TSENG , Yu-Ting LU
IPC: H01L23/28 , H01L23/498 , H01L23/427 , H01L23/31
CPC classification number: H01L25/0657 , H01L21/561 , H01L23/28 , H01L23/3114 , H01L23/3128 , H01L23/3142 , H01L23/427 , H01L23/49816 , H01L23/49838 , H01L23/5389 , H01L23/562 , H01L24/19 , H01L24/20 , H01L2224/04105 , H01L2224/12105 , H01L2224/32225 , H01L2224/73267 , H01L2224/92244 , H01L2224/97 , H01L2225/06513 , H01L2225/06586 , H01L2924/1433 , H01L2924/3511 , H01L2224/83
Abstract: A semiconductor device package comprises an adhesive layer, a die on the adhesive layer, a first encapsulation layer encapsulating the die and the adhesive layer, and a second encapsulation layer adjacent to the first encapsulation layer and the adhesive layer. The second encapsulation layer has a first surface and a second surface different from the first surface. A contact angle of the first surface of the second encapsulation layer is different from a contact angle of the second surface of the second encapsulation layer.
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