公开(公告)号：US07371078B2

公开(公告)日：2008-05-13

申请号：US10780893

申请日：2004-02-19

申请人： Akihiko Ito ,  Hiroto Nakamura

发明人： Akihiko Ito ,  Hiroto Nakamura

IPC分类号： H01R12/00

CPC分类号： G01R31/2886 ,  G01R1/0433 ,  G01R1/07314 ,  G01R31/2893

摘要： To attain an object of providing an insert for holding wide-ranging kinds of area array type electronic components and realizing certain connection between external terminals of an area array type electronic component and connection terminals of a socket, and an electronic component testing apparatus and an electronic component testing method using the same, a thin plate 163 for supporting an IC device 2 is positioned between an external terminal face 23 of the IC device 2 and a connection terminal face 42 of a socket 40, and a thickness of the thin plate 163 is made to be approximately equal to or less than a distance between a tip portion of the external terminals 22 and the external terminal face 23.

摘要翻译： 为了实现提供用于保持广泛种类的区域阵列型电子部件的插入物并实现区域阵列型电子部件的外部端子和插座的连接端子之间的一定连接的目的，以及电子部件测试装置和电子 使用它们的部件测试方法，用于支撑IC器件2的薄板163位于IC器件2的外部端子面23和插座40的连接端子面42之间，薄板163的厚度为 被制成大致等于或小于外部端子22的端部与外部端子面23之间的距离。

公开(公告)号：US20050237071A1

公开(公告)日：2005-10-27

申请号：US10512051

申请日：2002-04-25

申请人： Akihiko Ito ,  Hiroto Nakamura

发明人： Akihiko Ito ,  Hiroto Nakamura

IPC分类号： G01R31/28 ,  H01L21/66 ,  G01R31/02

CPC分类号： G01R31/2886

摘要： An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested against contact portions of a test head portion (100) while loading the electronic devices to be tested on electronic device conveying media (11, 12, 13, 14) by a moving means: wherein two electronic device conveying media (11, 12) loaded with electronic devices to be tested are gripped by one moving means and two electronic device conveying media (13, 14) loaded with electronic devices to be tested are gripped by the other moving means at a time, and the respective moving means independently conveys to and from the contact groups.

摘要翻译： 一种电子设备测试装置，用于在将要测试的电子设备加载到电子设备传送介质（11,12,13）上的同时，将待测试的电子设备的输入/输出端子按压在测试头部分（100）的接触部分上， 移动装置：其中装载有待测试的电子装置的两个电子装置输送介质（11,12）由一个移动装置和装载有电子装置的两个电子装置传送介质（13,14）夹持 一次测试被其他移动装置夹住，并且相应的移动装置独立地传送到接触组和从接触组传送。

公开(公告)号：US20050036275A1

公开(公告)日：2005-02-17

申请号：US10780893

申请日：2004-02-19

申请人： Akihiko Ito ,  Hiroto Nakamura

发明人： Akihiko Ito ,  Hiroto Nakamura

IPC分类号： G01R31/26 ,  G01R1/04 ,  G01R1/073 ,  G01R31/28 ,  H02B1/00

CPC分类号： G01R31/2886 ,  G01R1/0433 ,  G01R1/07314 ,  G01R31/2893

摘要： To attain an object of providing an insert for holding wide-ranging kinds of area array type electronic components and realizing certain connection between external terminals of an area array type electronic component and connection terminals of a socket, and an electronic component testing apparatus and an electronic component testing method using the same, a thin plate 163 for supporting an IC device 2 is positioned between an external terminal face 23 of the IC device 2 and a connection terminal face 42 of a socket 40, and a thickness of the thin plate 163 is made to be approximately equal to or less than a distance between a tip portion of the external terminals 22 and the external terminal face 23.

摘要翻译： 为了实现提供用于保持广泛种类的区域阵列型电子部件的插入物并实现区域阵列型电子部件的外部端子和插座的连接端子之间的一定连接的目的，以及电子部件测试装置和电子 使用它们的部件测试方法，用于支撑IC器件2的薄板163位于IC器件2的外部端子面23和插座40的连接端子面42之间，薄板163的厚度为 被制成大致等于或小于外部端子22的端部与外部端子面23之间的距离。

公开(公告)号：US6104183A

公开(公告)日：2000-08-15

申请号：US809243

申请日：1997-05-28

申请人： Yoshihito Kobayashi ,  Tsuyoshi Yamashita ,  Hiroto Nakamura ,  Shin Nemoto ,  Yoshiyuki Masuo ,  Akihiko Ito

发明人： Yoshihito Kobayashi ,  Tsuyoshi Yamashita ,  Hiroto Nakamura ,  Shin Nemoto ,  Yoshiyuki Masuo ,  Akihiko Ito

IPC分类号： G01R31/26 ,  G01R31/28 ,  H01L21/677

CPC分类号： G01R31/2868

摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber 101 containing therein a vertical transport means is located a test chamber 102 which is in turn adjoined by a temperature-stress removing chamber 103 likewise containing therein a vertical transport means, so that the constant temperature chamber 101, the test chamber 102 and the temperature-stress removing chamber 103 are arranged transversely in a line. Further, a loader section 300 is located in front of the constant temperature chamber, and an unloader section 400 is located in front of the test chamber and the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about three test tray lengths.

摘要翻译： PCT No.PCT / JP96 / 02067 Sec。 371日期1997年5月28日 102（e）日期1997年5月28日PCT提交1996年7月24日PCT公布。 出版物WO97 / 05495 日期：1997年2月13日提供了具有减小的横向宽度和尺寸紧凑的半导体器件测试装置。 在其中容纳有垂直传送装置的恒温室101附近设置有测试室102，测试室102又由同样包含垂直传送装置的温度应力消除室103邻接，使得恒温室101，测试 室102和温度应力消除室103横向排列成一行。 此外，装载部300位于恒温室前方，卸载部400位于试验室前方和温度应力消除室。 通过这种布置，测试装置的横向宽度可以减小到约三个测试托盘长度。

公开(公告)号：US06384593B1

公开(公告)日：2002-05-07

申请号：US09596062

申请日：2000-06-16

申请人： Yoshihito Kobayashi ,  Tsuyoshi Yamashita ,  Hiroto Nakamura ,  Shin Nemoto ,  Yoshiyuki Masuo ,  Akihiko Ito

发明人： Yoshihito Kobayashi ,  Tsuyoshi Yamashita ,  Hiroto Nakamura ,  Shin Nemoto ,  Yoshiyuki Masuo ,  Akihiko Ito

IPC分类号： G01R3128

CPC分类号： G01R31/2868

摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber containing therein a vertical transport means is located a test chamber which is in turn adjoined by a temperature-stress removing chamber likewise containing therein a vertical transport means, so that the constant temperature chamber and the test chamber are arranged transversely in a line, while the temperature-stress removing chamber is located in front of the test chamber when viewed in front view of the apparatus. Further, a loader section is located in front of the constant temperature chamber, and an unloader section is located above the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about two test tray lengths.

摘要翻译： 提供了具有减小的横向宽度并且尺寸紧凑的半导体器件测试装置。 在其中容纳有垂直输送装置的恒温室附近设有试验室，该试验室又由同样含有垂直输送装置的温度应力消除室邻接，使得恒温室和试验室横向布置 在该装置的正视图中观察时，温度应力消除室位于测试室的前方。 此外，装载部位于恒温室前方，卸载部位于温度应力消除室的上方。 通过这种布置，测试装置的横向宽度可以减小到大约两个测试托盘长度。

公开(公告)号：US5269401A

公开(公告)日：1993-12-14

申请号：US923514

申请日：1992-08-03

申请人： Akihiko Ito ,  Hiroto Nakamura

发明人： Akihiko Ito ,  Hiroto Nakamura

IPC分类号： B65G11/16 ,  B65G11/02 ,  B65G21/20 ,  H01L21/677 ,  H05K13/02 ,  B65G11/10

CPC分类号： H05K13/022 ,  B65G11/023

摘要： Both side walls of a channel groove for guiding integrated circuits with J-shaped leads are formed at an angle greater than 90 degrees to the bottom of the channel groove.

摘要翻译： 用于引导具有J形引线的集成电路的通道槽的两个侧壁形成为与沟槽的底部成大于90度的角度。

公开(公告)号：US09583062B2

公开(公告)日：2017-02-28

申请号：US13216139

申请日：2011-08-23

申请人： Akihiko Ito

发明人： Akihiko Ito

IPC分类号： G09G3/36 ,  H04N13/04 ,  G09G3/00

CPC分类号： G09G3/3677 ,  G09G3/001 ,  G09G3/003 ,  G09G3/3614 ,  G09G3/3648 ,  G09G3/3688 ,  G09G2310/02 ,  G09G2310/0205 ,  G09G2310/0224 ,  G09G2310/0251 ,  G09G2310/0297 ,  H04N13/341

摘要： A right unit period corresponding to a right-eye image and a left unit period corresponding to a left-eye image are set alternately. The scanning line driving circuit selects the plurality of scanning lines in several units at each right unit period, the glasses control circuit controls both of the shutter for the right eye and the shutter for the left eye to be in the closed state at least a portion of an image update period at which the data line driving circuit supplies a gradation potential corresponding to the right-eye image to each data line and the glasses control circuit controls the shutter for the right eye to be in the opened state and controls the shutter for the left eye to be in the closed state at the display period after the lapse of the image update period.

摘要翻译： 交替地设置对应于右眼图像的右单位周期和对应于左眼图像的左单位周期。 扫描线驱动电路在每个右侧单位周期以多个单位选择多条扫描线，眼镜控制电路将左眼的快门和左眼的快门两者都控制在处于关闭状态的至少一部分 数据线驱动电路向每个数据线提供与右眼图像相对应的灰度级的图像更新周期，并且眼镜控制电路控制右眼的快门处于打开状态，并且控制快门 左眼在图像更新周期过后的显示周期处于关闭状态。

公开(公告)号：US09019264B2

公开(公告)日：2015-04-28

申请号：US13541526

申请日：2012-07-03

申请人： Akihiko Ito

发明人： Akihiko Ito

IPC分类号： G06T15/00 ,  G09G3/00 ,  G09G3/36

CPC分类号： G09G3/003 ,  G06T15/00 ,  G09G3/3614 ,  G09G3/3648 ,  G09G2310/0205

摘要： In one unit period of a display period, each first pair of scanning lines is selected and a gray scale potential corresponding to pixels of one scanning line of the first pair of scanning lines is supplied to each signal line. In another unit period, each second pair of scanning lines is selected and a gray scale potential corresponding to pixels of one scanning line of the second pair of scanning lines is supplied to each signal line.

摘要翻译： 在显示周期的一个单位周期中，选择每个第一对扫描线，并且将与第一对扫描线的一条扫描线的像素相对应的灰度级电位提供给每个信号线。 在另一单元周期中，选择每一对第二扫描线，并且将与第二对扫描线的一条扫描线的像素对应的灰度级电位提供给每条信号线。

公开(公告)号：US20130318554A1

公开(公告)日：2013-11-28

申请号：US13976267

申请日：2011-12-28

申请人： Aya Minehara ,  Ai Terashima ,  Yoshinori Oonishi ,  Kinya Fujimoto ,  Kazunori Yoshizawa ,  Yoshinori Ohmura ,  Yukimi Kawaguchi ,  Yuhji Ohi ,  Keiichiro Sato ,  Yumiko Saimen ,  Akihiko Ito

发明人： Aya Minehara ,  Ai Terashima ,  Yoshinori Oonishi ,  Kinya Fujimoto ,  Kazunori Yoshizawa ,  Yoshinori Ohmura ,  Yukimi Kawaguchi ,  Yuhji Ohi ,  Keiichiro Sato ,  Yumiko Saimen ,  Akihiko Ito

IPC分类号： H04N21/482

CPC分类号： H04N21/4821 ,  H04N5/44543 ,  H04N21/4314 ,  H04N2005/44556

摘要： The television (1) includes: an infrared radiation receiver (119) which receives from a user an instruction to select a program cell; and a CPU (118) which generates a user interface screen of an electronic program table to be displayed on an LCD (110). The CPU (118) generates the user interface screen of the electronic program table such that a time zone item column located in a left direction of a selected program cell and a time zone item column located in a right direction of the selected program cell are indicated with deep blue, and other time zone item columns are indicated with light blue.

摘要翻译： 电视机（1）包括：红外线辐射接收器（119），其从用户接收选择节目单元的指令; 以及生成要在LCD（110）上显示的电子节目表的用户界面画面的CPU（118）。 CPU（118）生成电子节目表的用户界面画面，使得位于所选节目单元的左方向的时区项列和位于所选节目单元的右方向上的时区项列 深蓝色，其他时区项目列用淡蓝色表示。

公开(公告)号：US08497831B2

公开(公告)日：2013-07-30

申请号：US11534948

申请日：2006-09-25

申请人： Akihiko Ito

发明人： Akihiko Ito

IPC分类号： G09G3/36

CPC分类号： G09G3/3688 ,  G09G3/3614 ,  G09G3/3648 ,  G09G2310/0248 ,  G09G2310/0297 ,  G09G2310/08

摘要： An electro-optical device includes pixel electrodes corresponding to intersections of a plurality of scanning lines and a plurality of data lines and specific to the pixels, a common electrode facing the pixel electrode, and a switching element that establishes conduction between the data line and the pixel electrode when a selection voltage is applied to the scanning line, a control circuit that supplies a high voltage having a predetermined value and a low voltage lower than the high voltage alternately at predetermined intervals to the common electrode; a scanning line driving circuit that selects the plurality of scanning lines in a predetermined order and that applies the selection voltage to each of the selected scanning lines; and a data line driving circuit that supplies a data signal defining the grayscale levels of the pixels to the data lines in a period during which one of the scanning lines is selected and during which the voltage applied to the common electrode is maintained at the high voltage or the low voltage and that performs a precharge operation for precharging the plurality of data lines to a predetermined potential in a period of time including a period during which the voltage applied to the common electrode changes from one of the high voltage and the low voltage to the other.

摘要翻译： 电光装置包括对应于多个扫描线和多个数据线并且特定于像素的交点的像素电极，面向像素电极的公共电极以及建立数据线与第一电极之间的导通的开关元件 向扫描线施加选择电压时的像素电极;控制电路，其以预定间隔以预定间隔交替地向所述公共电极提供具有预定值的高电压和低于所述高电压的低电压; 扫描线驱动电路，其以预定顺序选择所述多条扫描线，并将所述选择电压施加到每条所选择的扫描线; 以及数据线驱动电路，其在选择了扫描线之一并且施加到公共电极的电压保持在高电压的期间内将限定像素的灰度级的数据信号提供给数据线 或低电压，并且在包括施加到公共电极的电压从高电压和低电压之一变化的时段的时间段内执行用于将多条数据线预充电到预定电位的预充电操作， 另一个。