Nonlinear model calibration using attenuated stimuli
    1.
    发明申请
    Nonlinear model calibration using attenuated stimuli 审中-公开
    使用衰减刺激的非线性模型校准

    公开(公告)号:US20070136018A1

    公开(公告)日:2007-06-14

    申请号:US11299001

    申请日:2005-12-09

    IPC分类号: G01R35/00

    CPC分类号: G01R31/3191

    摘要: A system and method are disclosed for calibrating non-linear behavior using attenuated stimuli and responses which allows for calibration with unknown stimulus and less expensive sources and receivers. The device under test is stimulated with a signal and then an attenuated version of the same signal, so that non-linear differences between responses can be attributed to the device rather than the signal source. Alternatively, or in conjunction with attenuation of the stimulus, the output of the device at different response amplitudes can be selectively attenuated such that the receiver measures approximately the same amplitude. This allows non-linear differences between measurements to be attributed to the device rather than the receiver. Two or more different signal sources can also be used, where responses are measured for each signal individually and then for at least one linear combination of signals.

    摘要翻译: 公开了一种系统和方法,用于使用衰减的刺激和响应校准非线性行为,其允许用未知刺激和较便宜的源和接收器进行校准。 被测器件用信号刺激,然后用相同信号的衰减版本进行激励,使得响应之间的非线性差异可归因于器件而不是信号源。 或者,或者结合激励的衰减,可以选择性地衰减在不同响应幅度下的器件的输出,使得接收器测量大致相同的幅度。 这允许测量之间的非线性差异归因于设备而不是接收器。 还可以使用两个或多个不同的信号源,其中针对每个信号单独地测量响应,然后针对信号的至少一个线性组合。

    System and method for microwave imaging using programmable transmission array
    2.
    发明申请
    System and method for microwave imaging using programmable transmission array 有权
    使用可编程传输阵列进行微波成像的系统和方法

    公开(公告)号:US20060109174A1

    公开(公告)日:2006-05-25

    申请号:US11147899

    申请日:2005-06-08

    IPC分类号: G01S13/89

    摘要: A microwave imaging system uses microwave radiation provided by a microwave source to image targets. The system includes an array of antenna elements that are capable of being programmed with a respective transmission coefficient to direct the microwave illumination from the microwave source toward a position on the target. The antenna elements are further capable of being programmed with a respective additional transmission coefficient to receive reflected microwave illumination reflected from the position on the target and direct the reflected microwave illumination towards a microwave receiver. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the target. Multiple beams can be directed towards the target to obtain corresponding pixel values for use by the processor in constructing the image.

    摘要翻译: 微波成像系统使用由微波源提供的微波辐射来对目标进行成像。 该系统包括天线元件阵列,其能够用相应的传输系数进行编程,以将来自微波源的微波照明引导到目标上的位置。 天线元件还能够用相应的附加传输系数进行编程,以接收从目标上的位置反射的反射的微波照射并将反射的微波照射引导到微波接收器。 处理器可操作以测量反射的微波照明的强度以确定目标图像内的像素的值。 多个光束可以被引向目标以获得对应的像素值,供处理器在构建图像时使用。

    System and method for security inspection using microwave imaging
    3.
    发明授权
    System and method for security inspection using microwave imaging 有权
    使用微波成像进行安全检查的系统和方法

    公开(公告)号:US06965340B1

    公开(公告)日:2005-11-15

    申请号:US10996764

    申请日:2004-11-24

    摘要: A security inspection system uses microwave radiation to image targets on a human subject or other item. The system includes an array of antenna elements that are programmable with a respective phase delay to direct a beam of microwave illumination toward a target on the human subject or item. The antenna elements are further capable of receiving reflected microwave illumination reflected from the target. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the human subject or item. Multiple beams can be directed towards the human subject or item to obtain corresponding pixel values for use by the processor in constructing the image.

    摘要翻译: 安全检查系统使用微波辐射来对人类对象或其他物品进行成像。 该系统包括天线元件的阵列,其可编程具有相应的相位延迟以将微波照射束引导到人类对象或物品上的目标。 天线元件还能够接收从目标反射的反射的微波照明。 处理器可操作以测量反射的微波照明的强度,以确定人物对象或物品的图像内的像素的值。 多个光束可以被引导到人类对象或物体,以获得处理器在构建图像时使用的相应像素值。

    Nanoscale displacement detector
    4.
    发明申请
    Nanoscale displacement detector 失效
    纳米尺度位移检测器

    公开(公告)号:US20070107501A1

    公开(公告)日:2007-05-17

    申请号:US11280365

    申请日:2005-11-16

    申请人: Robert Taber

    发明人: Robert Taber

    IPC分类号: G01B5/28

    CPC分类号: G01Q20/04 G01Q60/38

    摘要: A nanoscale displacement detector includes a cantilever integrated with an optical resonator, referred to herein as a “microresonator.” The microresonator and cantilever are configured such that displacement of the cantilever relative to the microresonator causes a change in the resonant frequency of the microresonator. The change in the resonant frequency of the microresonator is used to monitor cantilever displacement. In an embodiment, the microresonator includes a cavity that faces the cantilever and the cantilever includes a protrusion that faces the microresonator and is aligned with the cavity.

    摘要翻译: 纳米尺度位移检测器包括与光谐振器集成的悬臂,在本文中称为“微谐振器”。 微谐振器和悬臂被配​​置为使得悬臂相对于微谐振器的位移导致微谐振器的谐振频率的变化。 微谐振器谐振频率的变化用于监测悬臂位移。 在一个实施例中,微谐振器包括面向悬臂的空腔,并且悬臂包括面向微谐振器并与空腔对准的突起。

    OPTICALLY-AUGMENTED MICROWAVE IMAGING SYSTEM AND METHOD
    5.
    发明申请
    OPTICALLY-AUGMENTED MICROWAVE IMAGING SYSTEM AND METHOD 有权
    光学成像微波成像系统及方法

    公开(公告)号:US20050270223A1

    公开(公告)日:2005-12-08

    申请号:US10863733

    申请日:2004-06-08

    摘要: An imaging system includes an optical (visible-light or near IR) imaging system and a microwave imaging system. The optical imaging system captures an optical image of the object, produces optical image data representing the optical image and extracts optical image information from the optical image data. The microwave imaging system produces microwave image data representing a microwave image of the object in response to the optical image information.

    摘要翻译: 成像系统包括光学(可见光或近红外)成像系统和微波成像系统。 光学成像系统捕获物体的光学图像,产生表示光学图像的光学图像数据,并从光学图像数据中提取光学图像信息。 微波成像系统响应于光学图像信息产生表示对象的微波图像的微波图像数据。

    Plasma generating devices having alternative ground geometry and methods for using the same
    6.
    发明申请
    Plasma generating devices having alternative ground geometry and methods for using the same 审中-公开
    具有替代地面几何形状的等离子体产生装置及其使用方法

    公开(公告)号:US20070170996A1

    公开(公告)日:2007-07-26

    申请号:US11485051

    申请日:2006-07-11

    IPC分类号: H03B5/00

    摘要: Aspects of the invention include plasma generating devices having alternative ground geometries and systems thereof, as well as methods of using the same in plasma generation. The plasma generating devices of the invention include a resonator with a discharge gap disposed on a substrate and a ground element. Embodiments of the ground element of the plasma generating devices of the invention include those that are internal, external, coplanar or a combination thereof. The subject plasma generating devices, systems and methods find use in a variety of different applications.

    摘要翻译: 本发明的方面包括具有替代地面几何形状及其系统的等离子体产生装置,以及在等离子体产生中使用该等离子体产生装置的方法。 本发明的等离子体产生装置包括具有设置在基板上的放电间隙的谐振器和接地元件。 本发明的等离子体产生装置的接地元件的实施例包括内部,外部,共面或其组合的那些。 主题等离子体产生装置,系统和方法可用于各种不同的应用。

    System and method for security inspection using microwave imaging
    7.
    发明申请
    System and method for security inspection using microwave imaging 有权
    使用微波成像进行安全检查的系统和方法

    公开(公告)号:US20060109160A1

    公开(公告)日:2006-05-25

    申请号:US11148079

    申请日:2005-06-08

    IPC分类号: G01S13/00

    摘要: A microwave imaging system uses microwave radiation provided by a microwave source to image targets. The system includes an array of antenna elements that are capable of being programmed with a respective direction coefficient to direct the microwave illumination from the microwave source toward a position on the target. The antenna elements are further capable of being programmed to receive reflected microwave illumination reflected from the position on the target. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the target. Multiple beams can be directed towards the target to obtain corresponding pixel values for use by the processor in constructing the image.

    摘要翻译: 微波成像系统使用由微波源提供的微波辐射来对目标进行成像。 该系统包括天线元件阵列,其能够用相应的方向系数进行编程,以将来自微波源的微波照明引导到目标上的位置。 天线元件还能够被编程以接收从目标上的位置反射的反射的微波照明。 处理器可操作以测量反射的微波照明的强度以确定目标图像内的像素的值。 多个光束可以被引向目标以获得对应的像素值,供处理器在构建图像时使用。

    Handheld microwave imaging device
    10.
    发明申请
    Handheld microwave imaging device 审中-公开
    手持式微波成像装置

    公开(公告)号:US20070139249A1

    公开(公告)日:2007-06-21

    申请号:US11303581

    申请日:2005-12-16

    IPC分类号: G01S13/89

    CPC分类号: G01S13/89 H01Q3/46

    摘要: A handheld microwave imaging device provides screening of objects, such as persons and other items. The imaging device includes an antenna array of antenna elements, each capable of being programmed with a respective direction coefficient to direct microwave illumination toward a target associated with the object, and each capable of being programmed with a respective additional direction coefficient to receive reflected microwave illumination reflected from the target. The imaging device further includes a processor operable to measure an intensity of the reflected microwave illumination to determine a value of a voxel within a microwave image of the object. The antenna array is compliantly mounted in a first portion of a support structure, while a second portion of the support structure defines a handle for enabling a user to control movement of the device.

    摘要翻译: 手持式微波成像装置提供物体的检查,例如人和其他物品。 该成像装置包括天线元件的天线阵列,每个天线阵列能够​​被编程有相应的方向系数以将微波照明引导到与物体相关联的目标,并且每个都能够被编程有相应的附加方向系数以接收反射的微波照射 从目标反映出来。 成像装置还包括处理器,可操作以测量反射的微波照射的强度,以确定物体的微波图像内的体素的值。 天线阵列顺从地安装在支撑结构的第一部分中,而支撑结构的第二部分限定了用于使用户能够控制设备的移动的手柄。