Method for pattern formation and resin composition for use in the method
    1.
    发明授权
    Method for pattern formation and resin composition for use in the method 有权
    用于图案形成的方法和用于该方法的树脂组合物

    公开(公告)号:US08211624B2

    公开(公告)日:2012-07-03

    申请号:US12601011

    申请日:2008-05-21

    摘要: A pattern forming method includes (1) selectively exposing a first resist layer, and developing the exposed first resist layer to form a first pattern, (2) applying a resin composition containing a hydroxyl group-containing resin and a solvent to the first pattern, baking the applied resin composition, and developing the baked resin composition to form a second pattern, the hydroxyl group-containing resin becoming insoluble or scarcely soluble in a developer when baked, and (3) totally or selectively exposing the second pattern to make the second pattern partly soluble in the developer, and developing the exposed second pattern to form a third pattern in which at least a hole or a groove is formed in the second pattern.

    摘要翻译: 图案形成方法包括:(1)选择性地暴露第一抗蚀剂层,以及使曝光的第一抗蚀剂层显影以形成第一图案;(2)将含有羟基的树脂和溶剂的树脂组合物施加到第一图案, 烘烤所施加的树脂组合物,并显影所述烘焙的树脂组合物以形成第二图案,所述含羟基的树脂在烘烤时变得不溶或几乎不溶于显影剂,以及(3)全部或选择性地暴露所述第二图案以制备第二图案 图案部分地溶解在显影剂中,并且显影第二图案以形成第三图案,其中至少在第二图案中形成孔或凹槽。

    METHOD FOR PATTERN FORMATION AND RESIN COMPOSITION FOR USE IN THE METHOD
    2.
    发明申请
    METHOD FOR PATTERN FORMATION AND RESIN COMPOSITION FOR USE IN THE METHOD 有权
    方法中使用的图案形成方法和树脂组合物

    公开(公告)号:US20100190104A1

    公开(公告)日:2010-07-29

    申请号:US12601011

    申请日:2008-05-21

    IPC分类号: G03F7/20 G03F7/004

    摘要: A pattern forming method includes (1) selectively exposing a first resist layer, and developing the exposed first resist layer to form a first pattern, (2) applying a resin composition containing a hydroxyl group-containing resin and a solvent to the first pattern, baking the applied resin composition, and developing the baked resin composition to form a second pattern, the hydroxyl group-containing resin becoming insoluble or scarcely soluble in a developer when baked, and (3) totally or selectively exposing the second pattern to make the second pattern partly soluble in the developer, and developing the exposed second pattern to form a third pattern in which at least a hole or a groove is formed in the second pattern.

    摘要翻译: 图案形成方法包括:(1)选择性地暴露第一抗蚀剂层,以及使曝光的第一抗蚀剂层显影以形成第一图案;(2)将含有羟基的树脂和溶剂的树脂组合物施加到第一图案, 烘烤所施加的树脂组合物,并显影所述烘焙的树脂组合物以形成第二图案,所述含羟基的树脂在烘烤时变得不溶或几乎不溶于显影剂,以及(3)全部或选择性地暴露所述第二图案以制备第二图案 图案部分地溶解在显影剂中,并且显影第二图案以形成第三图案,其中至少在第二图案中形成孔或凹槽。

    RADIATION-SENSITIVE RESIN COMPOSITION
    3.
    发明申请
    RADIATION-SENSITIVE RESIN COMPOSITION 审中-公开
    辐射敏感性树脂组合物

    公开(公告)号:US20120156621A1

    公开(公告)日:2012-06-21

    申请号:US13403036

    申请日:2012-02-23

    IPC分类号: G03F7/004

    摘要: A radiation-sensitive resin composition includes a resin including a repeating unit shown by a following general formula (1), a photoacid generator and a photodisintegrating base shown by a following general formula (8). R2 represents a hydrogen atom or a methyl group, and each of R2s individually represents a monovalent alicyclic hydrocarbon group having 4 to 20 carbon atoms or a derivative thereof, a linear or branched alkyl group having 1 to 4 carbon atoms, or the like. Each of R18 to R20 individually represents a hydrogen atom, an alkyl group, an alkoxy group, a hydroxyl group or a halogen atom, and Z− represents OH−, R—COO−, R—SO3− or an anion shown by a following formula (10), wherein R represents an alkyl group, an aryl group or an alkaryl group.

    摘要翻译: 辐射敏感性树脂组合物包括含有下列通式(1)表示的重复单元的树脂,光致酸产生剂和由以下通式(8)表示的光致聚合碱。 R2表示氢原子或甲基,R2各自表示碳原子数为4〜20的一价脂环式烃基或其衍生物,碳原子数为1〜4的直链或支链烷基等。 R 18〜R 20各自独立地表示氢原子,烷基,烷氧基,羟基或卤素原子,Z-表示OH-,R-COO-,R-SO 3 - 或下述 式(10),其中R表示烷基,芳基或烷芳基。

    Radiation-sensitive resin composition
    7.
    发明授权
    Radiation-sensitive resin composition 有权
    辐射敏感树脂组合物

    公开(公告)号:US06933094B2

    公开(公告)日:2005-08-23

    申请号:US09953941

    申请日:2001-09-18

    IPC分类号: G03F7/004 G03F7/038 G03F7/039

    摘要: A chemically amplified radiation-sensitive resin composition comprising a specific copolymer and a photoacid generator, wherein the copolymer contains the following recurring unit (1) and/or the recurring unit (2), and the recurring unit (3-1), wherein R1 is a hydrogen or methyl, R2 is a C4-10 tertiary alkyl, R3and R4 are a hydrogen, C1-12 alkyl, C6-15 aromatic, C1-12 alkoxyl, or R3 and R4 may form, in combination and together with the nitrogen atom with which the R3 and R4 groups bond, a C3-15 cyclic structure, provided that R3 and R4 are not a hydrogen atom at the same time. The composition effectively responds to various radiations, exhibits excellent resolution and pattern configuration and minimal iso-dense bias, and can form fine patterns at a high precision and in a stable manner.

    摘要翻译: 包含特定共聚物和光酸产生剂的化学放大的辐射敏感性树脂组合物,其中所述共聚物包含以下重复单元(1)和/或重复单元(2)和重复单元(3-1),其中R 1是氢或甲基,R 2是C 4-10叔烷基,R 3和R 3 H 4是氢,C 1-12烷基,C 6-15芳族,C 1-12烷氧基, ,或R 3和R 4可以与R 3和R 4的氮原子组合形成, 基团键合,C 3-15-15环状结构,条件是R 3和R 4不是氢原子 同时。 该组合物有效响应各种辐射,显示出优异的分辨率和图案配置以及最小的等密度偏差,并能以高精度和稳定的方式形成精细图案。

    Anthracene derivative and radiation-sensitive resin composition
    8.
    发明授权
    Anthracene derivative and radiation-sensitive resin composition 有权
    蒽衍生物和辐射敏感性树脂组合物

    公开(公告)号:US06830868B2

    公开(公告)日:2004-12-14

    申请号:US10379507

    申请日:2003-03-06

    IPC分类号: G03F7004

    摘要: A novel anthracene derivative useful as an additive to a radiation-sensitive resin composition is disclosed. The anthracene derivative has the following formula (1), wherein R1 groups individually represent a hydroxyl group or a monovalent organic group having 1-20 carbon atoms, n is an integer of 0-9, X is a single bond or a divalent organic group having 1-12 carbon atoms, and R2 represents a monovalent acid-dissociable group. The radiation-sensitive resin composition comprises the anthracene derivative of the formula (1), a resin insoluble or scarcely soluble in alkali, but becomes alkali soluble in the presence of an acid, and a photoacid generator. The composition is useful as a chemically-amplified resist for microfabrication utilizing deep ultraviolet rays, typified by a KrF excimer laser and ArF excimer laser.

    摘要翻译: 公开了一种用作辐射敏感性树脂组合物添加剂的新型蒽衍生物。 蒽衍生物具有下式(1),其中R 1各自独立地表示羟基或具有1-20个碳原子的一价有机基团,n为0-9的整数,X为单键或 具有1-12个碳原子的二价有机基团,R 2表示一价酸解离基团。 辐射敏感性树脂组合物包含式(1)的蒽衍生物,不溶于或几乎不溶于碱的树脂,但在酸存在下变成碱溶性的光致酸产生剂。 该组合物可用作以KrF准分子激光和ArF准分子激光为代表的利用深紫外线进行微细加工的化学增幅抗蚀剂。

    Copolymer, polymer mixture, and radiation-sensitive resin composition
    9.
    发明授权
    Copolymer, polymer mixture, and radiation-sensitive resin composition 有权
    共聚物,聚合物混合物和辐射敏感树脂组合物

    公开(公告)号:US07105269B2

    公开(公告)日:2006-09-12

    申请号:US10321518

    申请日:2002-12-18

    摘要: 1. A copolymer having recurring units of the following formulas (1), (2), and (3), wherein R1, R4, R5, and R6 are a hydrogen atom or a methyl group, R2, R3, and R7 represent a monovalent organic group, k is 1 or 2, 1 is 0–4, n is 1–3, m is 0–3, R8 is a substituted methyl group, 1-substituted ethyl group, 1-branched alkyl group, triorganosilyl group, triorganogermyl group, alkoxycarbonyl group, acyl group, or cyclic acid-dissociable group, with two or more R8 groups being the same or different, q is 1–3, and p is 0–3, the copolymer having a GPC average molecular weight of 3,000–100,000. The composition is useful as a polymer component for a radiation-sensitive resin composition suitable as a chemically-amplified resist.

    摘要翻译: 1.具有下式(1),(2)和(3)的重复单元的共聚物,其中R 1,R 4,R 5 R 6和R 6是氢原子或甲基,R 2,R 3和R 7 表示一价有机基团,k为1或2,1为0-4,n为1-3,m为0-3,R 8为取代甲基,1 取代乙基,1-支链烷基,三有机甲硅烷基,三有机甲基,烷氧基羰基,酰基或环状酸解离基,其中两个或多个R 8基团相同或不同, q为1-3,p为0-3,GPC的平均分子量为3,000〜100,000。 该组合物可用作适合作为化学增幅抗蚀剂的辐射敏感性树脂组合物的聚合物组分。

    Radiation-sensitive resin composition
    10.
    发明授权
    Radiation-sensitive resin composition 有权
    辐射敏感树脂组合物

    公开(公告)号:US06821705B2

    公开(公告)日:2004-11-23

    申请号:US10132249

    申请日:2002-04-26

    IPC分类号: G03F7039

    摘要: A radiation-sensitive resin composition comprising (A) a compound of the following formula (1), (R1, R2, and R3 is hydrogen, hydroxyl group, or monovalent organic group and R4 is monovalent acid-dissociable group), (B) an alkali insoluble or scarcely soluble resin comprising a recurring unit of the following formula (2), (R5 is hydrogen or monovalent organic group, R′ hydrogen or methyl, n 1-3, m 0-3) and a recurring unit containing acid-dissociable group, and (C) a photoacid generator. The resin composition is useful as a chemically amplified resist, exhibits high sensitivity, resolution, radiation transmittance, and surface smoothness, and is free from the problem of partial insolublization during overexposure.

    摘要翻译: 一种辐射敏感性树脂组合物,其包含(A)下式(1)的化合物,(R 1,R 2和R 3)是氢,羟基或一价有机基团,R 4 (B)一种碱不溶性或几乎不溶的树脂,其包含下式(2)的重复单元,(R 5是氢或一价有机基团,R'氢或甲基,n 1-3,m 0-3)和含有酸解离基团的重复单元,和(C)光酸产生剂。 树脂组合物可用作化学放大抗蚀剂,显示出高灵敏度,分辨率,辐射透射率和表面光滑度,并且在过度曝光期间不存在部分不溶性的问题。