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公开(公告)号:US20160155728A1
公开(公告)日:2016-06-02
申请号:US15018818
申请日:2016-02-08
Applicant: Broadcom Corporation
Inventor: Sam Ziqun ZHAO , Rezaur Rahman KHAN , Pieter VORENKAMP , Sampath K.V. KARIKALAN , Kevin Kunzhong HU , Xiangdong CHEN
CPC classification number: H01L25/105 , H01L21/50 , H01L21/78 , H01L23/481 , H01L24/13 , H01L24/16 , H01L24/19 , H01L24/24 , H01L24/32 , H01L24/82 , H01L24/83 , H01L24/92 , H01L24/96 , H01L25/0657 , H01L25/50 , H01L2224/0401 , H01L2224/04105 , H01L2224/05548 , H01L2224/05572 , H01L2224/12105 , H01L2224/131 , H01L2224/16145 , H01L2224/24011 , H01L2224/24146 , H01L2224/2919 , H01L2224/82039 , H01L2224/82047 , H01L2224/821 , H01L2224/83 , H01L2224/9202 , H01L2224/92133 , H01L2224/92144 , H01L2224/92244 , H01L2224/96 , H01L2225/06517 , H01L2225/06524 , H01L2225/06527 , H01L2225/06548 , H01L2225/1041 , H01L2924/00014 , H01L2924/12042 , H01L2924/15747 , H01L2924/181 , H01L2224/82 , H01L2924/014 , H01L2224/05552 , H01L2924/00
Abstract: An exemplary implementation of the present disclosure includes a stacked package having a top die from a top reconstituted wafer situated over a bottom die from a bottom reconstituted wafer. The top die and the bottom die are insulated from one another by an insulation arrangement. The top die and the bottom die are also interconnected through the insulation arrangement. The insulation arrangement can include a top molding compound that flanks the top die and a bottom molding compound that flanks the bottom die. The top die and the bottom die can be interconnected through at least the, top molding compound. Furthermore, the top die and the bottom die can be interconnected through a conductive via that extends within the insulation arrangement.
Abstract translation: 本公开的示例性实施方案包括具有来自位于底部重构晶片的底模上方的顶部重构晶片的顶模的堆叠封装。 顶部模具和底部模具通过绝缘装置彼此绝缘。 顶模和底模也通过绝缘装置互连。 绝缘装置可以包括在顶模侧面的顶部模塑料和位于底模侧面的底部模塑料。 顶模和底模可以通过至少顶部模塑料相互连接。 此外,顶模和底模可以通过在绝缘装置内延伸的导电通孔相互连接。
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公开(公告)号:US20150235992A1
公开(公告)日:2015-08-20
申请号:US14701388
申请日:2015-04-30
Applicant: BROADCOM CORPORATION
Inventor: Sampath K. KARIKALAN , Sam Ziqun ZHAO , Kevin Kunzhong HU , Rezaur Rahman KHAN , Pieter VORENKAMP , Xiangdong CHEN
IPC: H01L25/065 , H01L23/00
CPC classification number: H01L25/0655 , H01L23/48 , H01L23/49827 , H01L23/49833 , H01L23/538 , H01L24/16 , H01L24/17 , H01L24/32 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/80 , H01L24/82 , H01L25/0652 , H01L2224/0401 , H01L2224/05541 , H01L2224/13082 , H01L2224/131 , H01L2224/13147 , H01L2224/16225 , H01L2224/16227 , H01L2224/1703 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73203 , H01L2224/73215 , H01L2224/73265 , H01L2224/96 , H01L2924/00014 , H01L2924/15192 , H01L2924/152 , H01L2924/1532 , H01L2924/30105 , H01L2924/00012 , H01L2924/014 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: There are disclosed herein various implementations of semiconductor packages including a bridge interposer. One exemplary implementation includes a first active die having a first portion situated over the bridge interposer, and a second portion not situated over the bridge interposer. The semiconductor package also includes a second active die having a first portion situated over the bridge interposer, and a second portion not situated over the bridge interposer. The second portion of the first active die and the second portion of the second active die include solder balls mounted on a package substrate, and are configured to communicate electrical signals to the package substrate utilizing the solder balls and without utilizing through-semiconductor vias (TSVs).
Abstract translation: 这里公开了包括桥插入器的半导体封装的各种实施方式。 一个示例性实现包括具有位于桥插入件上方的第一部分的第一有源管芯和不位于桥插入件上的第二部分。 半导体封装还包括具有位于桥插入件上方的第一部分的第二有源管芯和不位于桥插入件上的第二部分。 第一有源裸片的第二部分和第二有源裸片的第二部分包括安装在封装衬底上的焊球,并且被配置为使用焊球将电信号传送到封装衬底,并且不使用贯穿半导体通孔(TSV )。
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