Microlithographic projection exposure apparatus and method for introducing an immersion liquid into an immersion space
    3.
    发明申请
    Microlithographic projection exposure apparatus and method for introducing an immersion liquid into an immersion space 审中-公开
    用于将浸没液引入浸入空间的微光刻投影曝光装置和方法

    公开(公告)号:US20070132969A1

    公开(公告)日:2007-06-14

    申请号:US10565612

    申请日:2004-07-08

    IPC分类号: G03B27/42

    CPC分类号: G03F7/70341

    摘要: The invention relates to a projection exposure system for microlithography, said system comprising an illumination device for generating a projection light, and a projection objective comprising a plurality of optical elements such as lenses (L5) and enabling a reticle that can be arranged in an object plane of the projection objective to be imaged onto a light-sensitive surface (26) that can be arranged in an image plane of the projection objective and is applied to a carrier (30). The inventive system is also provided with an immersion device between an image-side last optical element (L5) of the projection objective and the light-sensitive surface (26), for introducing an immersion liquid (34) into an immersion chamber (50). Said immersion device comprises means (44; 66) which can prevent the appearance of gas bubbles (48) in the immersion liquid (34), affecting the imaging quality, and/or can remove existing gas bubbles (48). Said means can be, for example, an ultrasound source (66) or a degasifier (44).

    摘要翻译: 本发明涉及一种用于微光刻的投影曝光系统,所述系统包括用于产生投射光的照明装置,以及包括诸如透镜(L 5)的多个光学元件的投影物镜,并且能够将一个掩模版布置在 将被投影物镜的物体平面成像到能够被布置在投影物镜的像平面中并被施加到载体(30)的光敏表面(26)上。 本发明的系统还在投影物镜的最后一个光学元件(L 5)和光敏表面(26)之间设置浸入装置,用于将浸没液(34)引入到浸没室(50) )。 所述浸渍装置包括能够防止浸没液体(34)中的气泡(48)出现的装置(44; 66),影响成像质量,和/或可以去除现有的气泡(48)。 所述装置可以是例如超声源(66)或脱气器(44)。

    System for purifying purge gases
    6.
    发明申请
    System for purifying purge gases 审中-公开
    吹扫气净化系统

    公开(公告)号:US20050195376A1

    公开(公告)日:2005-09-08

    申请号:US11057311

    申请日:2005-02-11

    申请人: Dieter Schmerek

    发明人: Dieter Schmerek

    IPC分类号: G03B27/52 G03F7/20

    CPC分类号: G03F7/70933

    摘要: A system for purifying purge gases for an optical system, in particular for a projection objective for microlithography for the fabrication of semiconductor components, wherein the optical system has at least one optical element in a housing with a purge gas passing through the housing. Contaminating substances which settle on surfaces of the at least one optical element in the projection objective are filtered out by photochemical means.

    摘要翻译: 一种用于净化光学系统的净化气体的系统,特别是用于制造半导体部件的用于微光刻的投影物镜的系统,其中所述光学系统在壳体中具有穿过所述壳体的吹扫气体的至少一个光学元件。 通过光化学方法过滤掉在投影物镜中沉积在至少一个光学元件的表面上的污染物质。