Abstract:
Various embodiments implementing a multi-fabric mixed-signal electronic system design spanning across multiple design fabrics with electrical and/or thermal analysis awareness. A schematic design may be extracted from and a power delivery network (PDN) model may be determined from a plurality of layouts in multiple design fabrics in a multi-fabric design environment platform. A PDN-aware, multi-fabric full system schematic may be constructed by assembling the PDN model and the schematic design into the PDN-aware, multi-fabric full system schematic. For a schematic generated for a circuit block of interest, chip power models may be determined for the remaining portion of the multi-fabric mixed-signal electronic system design, and the PDN-aware, multi-fabric full system schematic may be updated by accounting for the chip power models. The circuit block of interest may then be electrically and/or thermally analyzed within the context of the remaining portion.
Abstract:
Disclosed are methods and systems for characterizing and analyzing an electronic system design including a parallel interface. Some methods and systems identify an electronic design including a parallel interface, determine a single circuit representation including the parallel interface from the electronic design, and analyze the parallel interface to determine waveform responses of the parallel interface by using channel analysis techniques without performing circuit simulations. Some other methods and systems are directed at performing channel analyses for a communication interface of an electronic system by concurrently applying stimuli to corresponding transmitters of a communication interface, characterizing the communication interface to perform a single simulation on the communication interface with the stimulus to determine responses at receivers of the communication interface, and determining waveform responses of the communication interface by performing operations on the responses and an input signal to the communication interface.
Abstract:
Disclosed are methods and systems for by identifying or generating an electrical schematic, generating a thermal schematic by associating thermal RC circuits of the electronic design with the electrical schematic, performing at least two analyses of an electrical analysis, a thermal analysis, and an electromagnetic interference compliance (EMC) analysis with the electrical schematic and the thermal schematic of the electronic design. The electrical, thermal, and EMC analyses may be performed concurrently by forwarding intermediate or final analysis results to each other, and the analysis results may be presented simultaneously in one or more user interface windows. The thermal schematic may be obtained by extracting the thermal RC circuits, identifying corresponding electrical circuit components that correspond to the extracted thermal RC circuits, and importing the thermal RC circuits into the electrical schematic so that the electrical and thermal schematics have the same nodes.
Abstract:
Embodiments include herein are directed towards a method for use in an electronic design environment is provided. Embodiments may include receiving a printed circuit board schematic and one or more electronic circuits. Embodiments may further include automatically generating, one or more circuit templates based upon, at least in part, the printed circuit board schematic and one or more electronic circuits. The one or more circuit templates may be stored at an electronic design database. Embodiments may also include receiving a current printed circuit board schematic and automatically determining whether a subcircuit of the current printed circuit board schematic is an exact or approximate match with the one or more circuit templates.
Abstract:
Disclosed are methods, systems, and articles of manufacture for binding and annotating an electronic design with a schematic driven extracted view. These techniques identify a schematic design and an extracted view of an electronic design and bind the schematic design with the extracted view. The resulting binding information concerning binding the schematic design with the extracted view is stored in a data structure. The schematic design may be annotated with extracted view information pertaining to the extracted view based at least in part upon the binding information. A response to a user action may be automatically generated based in part or in whole upon the extracted view information or the binding information.
Abstract:
Disclosed are methods, systems, and articles of manufacture for implementing a schematic circuit design component as a transmission line model in a schematic driven extracted view for an electronic design. These techniques identify a schematic circuit component design form a schematic design of an electronic design and identify or determine layout device information of a layout circuit component design corresponding to the schematic circuit component design. An extracted view may be generated or identified for the electronic design at least by using a transmission line model based in part or in whole upon connectivity information or a hierarchical structure of the electronic design. The electronic design may then be modified or updated based in part or in whole upon results of performing one or more analyses on the extracted view with the transmission line model.
Abstract:
Disclosed are mechanisms for implementing an IC package layout design with an integrated circuit package design estimator. These mechanisms determine an estimated number of layers for an integrated circuit (IC) package design including one or more IC die designs, determine whether the estimated number of layers suffice to accommodate routing demands for the IC package layout design, determine a power layer and/or a ground layer based in part or in whole upon one or more factors, and generate an output for the IC package layout design based using at least the estimated number of layers and the power layer and/or the ground layer. These mechanisms use input including connectivity information, thermal effects, and/or IC placement information to determine estimates for the total number of layers, layer stack-up, power and ground plane assignment, and via libraries to guide IC package layout design.
Abstract:
Disclosed are methods, systems, and articles of manufacture for implementing schematic driven extracted views for an electronic design. These techniques identify a schematic circuit component design represented by a schematic symbol from a schematic design and identifying layout device information from a layout of the electronic design. An extracted view is generated anew or updated from an existing extracted view at least by placing and interconnecting a symbol in the schematic design based at least in part upon the layout device information. The electronic design may be further updated based in part or in whole upon results of performing one or more analyses on the extracted view.
Abstract:
Embodiments include herein are directed towards a method for use in an electronic design environment is provided. The method may include receiving, using a processor, a parent fabric corresponding to a top layout fabric associated with an electronic design and receiving a child fabric corresponding to a child layout fabric associated with the electronic design. The method may further include receiving an electromagnetic (“EM”) model that represents one or more cross-fabric geometries associated with the electronic design and generating a hierarchical schematic representing each layout fabric, wherein the EM model is inserted into a parent schematic. The method may also include managing one or more interface connections between the hierarchical schematic.
Abstract:
Disclosed are techniques for implementing a layout-driven, multi-fabric schematic design of an electronic design. These techniques identify a multi-fabric layout spanning across multiple design fabrics and layout connectivity information and determine a device map that correlates a first set of devices in the multi-fabric layout with respective parasitic models. The device map can be identified one or more pre-existing device maps or can be constructed anew. A multi-fabric schematic can be generated by using at least the respective parasitic models and the layout connectivity information.