Display panel, method for manufacturing the same and display device

    公开(公告)号:US11960333B2

    公开(公告)日:2024-04-16

    申请号:US17430686

    申请日:2021-01-07

    IPC分类号: G06F1/16

    摘要: A display panel, a method for manufacturing the display panel and a display device are provided. The display panel includes a display region and a bezel region, the display region includes at least one first bending region extending in a first direction, and the bezel region includes a second bending region extending in a second direction crossing the first direction. At least one position where an extension line of the at least one first bending region crosses an extension line of the second bending region forms at least one overlapping region, and the display panel further includes a hollowed-out structure formed in the at least one overlapping region and penetrating a display surface and a non-display surface of the display panel.

    Backlight module and display apparatus

    公开(公告)号:US11635656B2

    公开(公告)日:2023-04-25

    申请号:US17344054

    申请日:2021-06-10

    IPC分类号: G02F1/1335 F21V8/00

    摘要: The present disclosure discloses a backlight module and a display apparatus. A microprism film layer is further arranged on a light emitting side of a light guide plate, and the microprism film layer is located in a range of a preset distance by which the light guide plate extends from a side close to a light source to a side away from the light source; and the microprism film layer includes a plurality of first microprism structures, and the first microprism structures are configured to make an incident angle of light at a first interface when entering the first microprism structures greater than an emitting angle of the light at the first interface when exiting from the first microprism structures when the light in the light guide plate enters the first microprism structures from the light guide plate and then enters the light guide plate from the first microprism structures.

    SUBSTRATE DAMAGE INSPECTION APPARATUS, PRODUCTION SYSTEM AND INSPECTION METHOD
    6.
    发明申请
    SUBSTRATE DAMAGE INSPECTION APPARATUS, PRODUCTION SYSTEM AND INSPECTION METHOD 有权
    基板损坏检查装置,生产系统和检查方法

    公开(公告)号:US20170038306A1

    公开(公告)日:2017-02-09

    申请号:US14912577

    申请日:2015-08-11

    IPC分类号: G01N21/88 H01L21/67 G01N21/55

    摘要: The present invention relates to the technical field of display, and particularly relates to a substrate damage inspection apparatus, a production system and an inspection method. The substrate damage inspection apparatus comprises a drive unit, support rods, sensors and a controller, wherein the drive unit is connected with the support rods so as to drive the support rods to ascend or descend below a substrate to be detected; and the sensors are disposed on the support rods and communicatively connect with the controller, so as to emit light beams to the substrate to be detected, receive the light beams reflected by the substrate to be detected, and feed them back to the controller. By means of the drive unit and the support rods with the sensors, the substrate damage inspection apparatus realizes damage inspection for the substrate to be detected in a vertical direction. That is, a technical solution provided by the present invention allows for damage inspection for the substrate to be detected when it vertically moves. In addition, the substrate damage inspection apparatus is simple in structure and convenient to operate, thereby having strong utility value and significance of generalization.

    摘要翻译: 本发明涉及显示技术领域,特别涉及基板损伤检查装置,生产系统和检查方法。 基板损伤检查装置包括驱动单元,支撑杆,传感器和控制器,其中驱动单元与支撑杆连接,以驱动支撑杆上升或下降到待检测基板下方; 并且传感器设置在支撑杆上并且与控制器通信地连接,以将光束发射到待检测的基板,接收由待检测的基板反射的光束,并将其馈送到控制器。 通过驱动单元和具有传感器的支撑杆,基板损伤检查装置对垂直方向上要检测的基板实现损伤检查。 也就是说,本发明提供的技术方案允许当垂直移动时要检测的基板的损伤检查。 另外,基板损伤检查装置结构简单,操作方便,具有很强的实用价值和泛化意义。