Method for fabricating InGaAIN light-emitting diodes with a metal substrate
    1.
    发明授权
    Method for fabricating InGaAIN light-emitting diodes with a metal substrate 有权
    制造具有金属基板的InGaAIN发光二极管的方法

    公开(公告)号:US08383438B2

    公开(公告)日:2013-02-26

    申请号:US13059140

    申请日:2008-08-19

    IPC分类号: H01L21/00 H01L29/06

    摘要: One embodiment of the present invention provides a method for fabricating light-emitting diodes. The method includes etching grooves on a growth substrate, thereby creating mesas on the growth substrate. The method further includes fabricating on each of the mesas an indium gallium aluminum nitride (InGaAlN) multilayer structure which contains a p-type layer, a multi-quantum-well layer, and an n-type layer. In addition, the method includes depositing one or more metal substrate layers on top of the InGaAlN multilayer structure. Moreover, the method includes removing the growth substrate. Furthermore, the method includes creating electrodes on both sides of the InGaAlN multilayer structure, thereby resulting in a vertical-electrode configuration.

    摘要翻译: 本发明的一个实施例提供一种制造发光二极管的方法。 该方法包括在生长衬底上蚀刻凹槽,从而在生长衬底上形成台面。 该方法还包括在每个台面上制造包含p型层,多量子阱层和n型层的铟镓铝氮化物(InGaAlN)层叠结构。 此外,该方法包括在InGaAlN多层结构的顶部上沉积一个或多个金属衬底层。 此外,该方法包括去除生长衬底。 此外,该方法包括在InGaAlN多层结构的两侧形成电极,从而形成垂直电极结构。

    LIGHT-EMITTING DEVICE BASED ON STRAIN-ADJUSTABLE InGaAIN FILM
    2.
    发明申请
    LIGHT-EMITTING DEVICE BASED ON STRAIN-ADJUSTABLE InGaAIN FILM 审中-公开
    基于应变可变InGaIn膜的发光器件

    公开(公告)号:US20110253972A1

    公开(公告)日:2011-10-20

    申请号:US13059207

    申请日:2008-08-19

    IPC分类号: H01L33/06 H01L33/44

    摘要: A method for fabricating a semiconductor light-emitting device based on a strain adjustable multilayer semiconductor film is disclosed. The method includes epitaxially growing a multilayer semiconductor film on a growth substrate, wherein the multilayer semiconductor film comprises a first doped semiconductor layer, a second doped semiconductor layer, and a multi-quantum-wells (MQW) active layer; forming an ohmic-contact metal layer on the first doped semiconductor layer; depositing a metal substrate on top of the ohmic-contact metal layer, wherein the density and/or material composition of the metal substrate is adjustable along the vertical direction, thereby causing the strain in the multilayer semiconductor film to be adjustable; etching off the growth substrate; and forming an ohmic-electrode coupled to the second doped semiconductor layer.

    摘要翻译: 公开了一种用于制造基于应变可调多层半导体膜的半导体发光器件的方法。 该方法包括在生长衬底上外延生长多层半导体膜,其中多层半导体膜包括第一掺杂半导体层,第二掺杂半导体层和多量子阱(MQW)有源层; 在所述第一掺杂半导体层上形成欧姆接触金属层; 在欧姆接触金属层的顶部上沉积金属衬底,其中金属衬底的密度和/或材料组成可沿着垂直方向调节,从而使多层半导体膜中的应变可调; 蚀刻生长衬底; 以及形成耦合到所述第二掺杂半导体层的欧姆电极。

    METHOD FOR FABRICATING InGaAIN LIGHT-EMITTING DIODES WITH A METAL SUBSTRATE
    3.
    发明申请
    METHOD FOR FABRICATING InGaAIN LIGHT-EMITTING DIODES WITH A METAL SUBSTRATE 有权
    用金属基材制造金属发光二极管的方法

    公开(公告)号:US20110140080A1

    公开(公告)日:2011-06-16

    申请号:US13059140

    申请日:2008-08-19

    摘要: One embodiment of the present invention provides a method for fabricating light-emitting diodes. The method includes etching grooves on a growth substrate, thereby creating mesas on the growth substrate. The method further includes fabricating on each of the mesas an indium gallium aluminum nitride (InGaAlN) multilayer structure which contains a p-type layer, a multi-quantum-well layer, and an n-type layer. In addition, the method includes depositing one or more metal substrate layers on top of the InGaAlN multilayer structure. Moreover, the method includes removing the growth substrate. Furthermore, the method includes creating electrodes on both sides of the InGaAlN multilayer structure, thereby resulting in a vertical-electrode configuration.

    摘要翻译: 本发明的一个实施例提供一种制造发光二极管的方法。 该方法包括在生长衬底上蚀刻凹槽,从而在生长衬底上形成台面。 该方法还包括在每个台面上制造包含p型层,多量子阱层和n型层的铟镓铝氮化物(InGaAlN)多层结构。 此外,该方法包括在InGaAlN多层结构的顶部上沉积一个或多个金属衬底层。 此外,该方法包括去除生长衬底。 此外,该方法包括在InGaAlN多层结构的两侧形成电极,从而形成垂直电极结构。

    Method for fabricating metal substrates with high-quality surfaces
    4.
    发明授权
    Method for fabricating metal substrates with high-quality surfaces 有权
    用于制造具有高质量表面的金属基材的方法

    公开(公告)号:US07758695B2

    公开(公告)日:2010-07-20

    申请号:US11713423

    申请日:2007-03-02

    IPC分类号: C30B1/02

    摘要: One embodiment of the present invention provides a method for fabricating a high-quality metal substrate. During operation, the method involves cleaning a polished single-crystal substrate. A metal structure of a predetermined thickness is then formed on a polished surface of the single-crystal substrate. The method further involves removing the single-crystal substrate from the metal structure without damaging the metal structure to obtain the high-quality metal substrate, wherein one surface of the metal substrate is a high-quality metal surface which preserves the smoothness and flatness of the polished surface of the single-crystal substrate.

    摘要翻译: 本发明的一个实施例提供了制造高品质金属基板的方法。 在操作过程中,该方法包括清洗抛光的单晶衬底。 然后在单晶衬底的抛光表面上形成预定厚度的金属结构。 该方法还包括从金属结构中去除单晶衬底而不损坏金属结构以获得高质量的金属衬底,其中金属衬底的一个表面是高质量的金属表面,其保持了平滑度和平坦度 抛光表面的单晶基板。

    Method for fabricating metal substrates with high-quality surfaces
    5.
    发明申请
    Method for fabricating metal substrates with high-quality surfaces 有权
    用于制造具有高质量表面的金属基材的方法

    公开(公告)号:US20080166582A1

    公开(公告)日:2008-07-10

    申请号:US11713423

    申请日:2007-03-02

    摘要: One embodiment of the present invention provides a method for fabricating a high-quality metal substrate. During operation, the method involves cleaning a polished single-crystal substrate. A metal structure of a predetermined thickness is then formed on a polished surface of the single-crystal substrate. The method further involves removing the single-crystal substrate from the metal structure without damaging the metal structure to obtain the high-quality metal substrate, wherein one surface of the metal substrate is a high-quality metal surface which preserves the smoothness and flatness of the polished surface of the single-crystal substrate.

    摘要翻译: 本发明的一个实施例提供了制造高品质金属基板的方法。 在操作过程中,该方法包括清洗抛光的单晶衬底。 然后在单晶衬底的抛光表面上形成预定厚度的金属结构。 该方法还包括从金属结构中去除单晶衬底而不损坏金属结构以获得高质量的金属衬底,其中金属衬底的一个表面是高质量的金属表面,其保持了平滑度和平坦度 抛光表面的单晶基板。

    Method for fabricating InGaAlN light emitting device on a combined substrate
    7.
    发明授权
    Method for fabricating InGaAlN light emitting device on a combined substrate 有权
    在组合衬底上制造InGaAlN发光器件的方法

    公开(公告)号:US08435816B2

    公开(公告)日:2013-05-07

    申请号:US13059213

    申请日:2008-08-22

    摘要: One embodiment of the present invention provides a method for fabricating an InGaAlN light-emitting semiconductor structure. During the fabrication process, at least one single-crystal sacrificial layer is deposited on the surface of a base substrate to form a combined substrate, wherein the single-crystal sacrificial layer is lattice-matched with InGaAlN, and wherein the single crystal layer forms a sacrificial layer. Next, the InGaAlN light-emitting semiconductor structure is fabricated on the combined substrate. The InGaAlN structure fabricated on the combined substrate is then transferred to a support substrate, thereby facilitating a vertical electrode configuration. Transferring the InGaAlN structure involves etching the single-crystal sacrificial layer with a chemical etchant. Furthermore, the InGaAlN and the base substrate are resistant to the chemical etchant. The base substrate can be reused after the InGaAlN structure is transferred.

    摘要翻译: 本发明的一个实施例提供一种制造InGaAlN发光半导体结构的方法。 在制造过程中,至少一个单晶牺牲层沉积在基底表面上以形成组合衬底,其中单晶牺牲层与InGaAlN晶格匹配,并且其中单晶层形成 牺牲层。 接下来,在组合衬底上制造InGaAlN发光半导体结构。 然后将在组合衬底上制造的InGaAlN结构转移到支撑衬底,从而有助于垂直电极构型。 转移InGaAlN结构包括用化学蚀刻剂蚀刻单晶牺牲层。 此外,InGaAlN和基底对化学蚀刻剂具有耐受性。 在传输InGaAlN结构后,可以重新使用基底。

    InGaAIN light-emitting device and manufacturing method thereof
    8.
    发明授权
    InGaAIN light-emitting device and manufacturing method thereof 有权
    InGaAIN发光器件及其制造方法

    公开(公告)号:US08384100B2

    公开(公告)日:2013-02-26

    申请号:US11915304

    申请日:2006-05-26

    IPC分类号: H01L21/00

    摘要: There is provided an InGaAlN light-emitting device and a manufacturing method thereof. The light emitting device includes a conductive substrate having a main surface and a back surface, a metal bonding layer formed on the main surface of the substrate, a light reflecting layer formed on the bonding layer, a semiconductor multilayer structure including at least a p-type and an n-type InGaAlN layer disposed on the reflecting layer, the p-type InGaAlN layer directly contacting the reflecting layer, and ohmic electrodes disposed on said n-type InGaAlN layer and on the back surface of the conductive substrate, respectively.

    摘要翻译: 提供了一种InGaAlN发光器件及其制造方法。 发光器件包括具有主表面和背表面的导电衬底,形成在衬底的主表面上的金属粘合层,形成在接合层上的光反射层,至少包括p- 以及设置在反射层上的n型InGaAlN层,与反射层直接接触的p型InGaAlN层和分别设置在所述n型InGaAlN层和导电基板的背面上的欧姆电极。

    Gallium nitride light-emitting device with ultra-high reverse breakdown voltage
    9.
    发明授权
    Gallium nitride light-emitting device with ultra-high reverse breakdown voltage 有权
    具有超高反向击穿电压的氮化镓发光器件

    公开(公告)号:US08053757B2

    公开(公告)日:2011-11-08

    申请号:US12159850

    申请日:2007-08-31

    IPC分类号: H01L29/06

    摘要: One embodiment of the present invention provides a gallium nitride (GaN)-based semiconductor light-emitting device (LED) which includes an n-type GaN-based semiconductor layer (n-type layer); an active layer; and a p-type GaN-based semiconductor layer (p-type layer). The n-type layer is epitaxially grown by using ammonia gas (NH3) as the nitrogen source prior to growing the active layer and the p-type layer. The flow rate ratio between group V and group III elements is gradually reduced from an initial value to a final value. The GaN-based LED exhibits a reverse breakdown voltage equal to or greater than 60 volts.

    摘要翻译: 本发明的一个实施例提供了一种包含n型GaN基半导体层(n型层)的基于氮化镓(GaN)的半导体发光器件(LED)。 活性层 和p型GaN类半导体层(p型层)。 在生长活性层和p型层之前,通过使用氨气(NH 3)作为氮源,外延生长n型层。 V组和III组元件之间的流量比从初始值逐渐减小到最终值。 GaN基LED呈现等于或大于60伏的反向击穿电压。

    METHOD FOR FABRICATING INGAAIN LIGHT EMITTING DEVICE ON A COMBINED SUBSTRATE
    10.
    发明申请
    METHOD FOR FABRICATING INGAAIN LIGHT EMITTING DEVICE ON A COMBINED SUBSTRATE 有权
    在组合基板上制造发光装置的方法

    公开(公告)号:US20110143467A1

    公开(公告)日:2011-06-16

    申请号:US13059213

    申请日:2008-08-22

    IPC分类号: H01L33/06 H01L33/30 H01L33/60

    摘要: One embodiment of the present invention provides a method for fabricating an InGaAlN light-emitting semiconductor structure. During the fabrication process, at least one single-crystal sacrificial layer is deposited on the surface of a base substrate to form a combined substrate, wherein the single-crystal sacrificial layer is lattice-matched with InGaAlN, and wherein the single crystal layer forms a sacrificial layer. Next, the InGaAlN light-emitting semiconductor structure is fabricated on the combined substrate. The InGaAlN structure fabricated on the combined substrate is then transferred to a support substrate, thereby facilitating a vertical electrode configuration. Transferring the InGaAlN structure involves etching the single-crystal sacrificial layer with a chemical etchant. Furthermore, the InGaAlN and the base substrate are resistant to the chemical etchant. The base substrate can be reused after the InGaAlN structure is transferred.

    摘要翻译: 本发明的一个实施例提供一种制造InGaAlN发光半导体结构的方法。 在制造过程中,至少一个单晶牺牲层沉积在基底表面上以形成组合衬底,其中单晶牺牲层与InGaAlN晶格匹配,其中单晶层形成 牺牲层。 接下来,在组合衬底上制造InGaAlN发光半导体结构。 然后将在组合衬底上制造的InGaAlN结构转移到支撑衬底,从而有助于垂直电极构型。 转移InGaAlN结构包括用化学蚀刻剂蚀刻单晶牺牲层。 此外,InGaAlN和基底对化学蚀刻剂具有耐受性。 在传输InGaAlN结构后,可以重新使用基底。