Multi-bank dynamic random access memory devices having all bank precharge capability
    1.
    发明授权
    Multi-bank dynamic random access memory devices having all bank precharge capability 有权
    具有全部预充电能力的多组动态随机存取存储器件

    公开(公告)号:US06343036B1

    公开(公告)日:2002-01-29

    申请号:US09157271

    申请日:1998-09-18

    IPC分类号: G11C700

    摘要: A synchronous dynamic random access memory capable of accessing data in a memory cell array therein in synchronism with a system clock from an external system such as a central processing unit (CPU). The synchronous DRAM receives an external clock and includes a plurality of memory banks each including a plurality of memory cells and operable in either an active cycle or a precharge cycle, a circuit for receiving a row address strobe signal and latching a logic level of the row address strobe signal in response to the clock, an address input circuit for receiving an externally generated address selecting one of the memory banks, and a circuit for receiving the latched logic level and the address from the address input circuit and for outputting an activation signal to the memory bank selected by the address and an inactivation signals to unselected memory banks when the latched logic level is a first logic level, so that the selected memory bank responsive to the activation signal operates in the active cycle while the unselected memory banks responsive to the inactivation signals operate in the precharge cycle.

    摘要翻译: 能够与来自诸如中央处理单元(CPU)的外部系统的系统时钟同步地访问其中的存储器单元阵列中的数据的同步动态随机存取存储器。 同步DRAM接收外部时钟并且包括多个存储器组,每个存储器组包括多个存储器单元并且可以在有效周期或预充电周期中操作,用于接收行地址选通信号并锁存该行的逻辑电平的电路 响应于时钟的地址选通信号,用于接收选择存储体之一的外部产生的地址的地址输入电路,以及用于从地址输入电路接收锁存的逻辑电平和地址的电路,并将激活信号输出到 当锁存的逻辑电平是第一逻辑电平时,由地址选择的存储器组和对未选择的存储体的去激活信号,使得响应于激活信号的所选存储器组在活动周期中工作,而未被选择的存储器组响应于 灭活信号在预充电循环中工作。

    Semiconductor memory having a plurality of I/O buses
    2.
    发明授权
    Semiconductor memory having a plurality of I/O buses 失效
    具有多个I / O总线的半导体存储器

    公开(公告)号:US5590086A

    公开(公告)日:1996-12-31

    申请号:US580481

    申请日:1995-12-29

    摘要: A synchronous dynamic random access memory capable of accessing data in a memory cell array therein in synchronism with a system clock from an external system such as a central processing unit (CPU). The synchronous DRAM receives an external clock and includes a plurality of memory banks each including a plurality of memory cells and operable in either an active cycle or a precharge cycle, a circuit for receiving a row address strobe signal and latching a logic level of the row address strobe signal in response to the clock, an address input circuit for receiving an externally generated address selecting one of the memory banks, and a circuit for receiving the latched logic level and the address from the address input circuit and for outputting an activation signal to the memory bank selected by the address and an inactivation signals to unselected memory banks when the latched logic level is a first logic level, so that the selected memory bank responsive to the activation signal operates in the active cycle while the unselected memory banks responsive to the inactivation signals operate in the precharge cycle.

    摘要翻译: 能够与来自诸如中央处理单元(CPU)的外部系统的系统时钟同步地访问其中的存储器单元阵列中的数据的同步动态随机存取存储器。 同步DRAM接收外部时钟并且包括多个存储器组,每个存储器组包括多个存储器单元并且可以在有效周期或预充电周期中操作,用于接收行地址选通信号并锁存该行的逻辑电平的电路 响应于时钟的地址选通信号,用于接收选择存储体之一的外部产生的地址的地址输入电路,以及用于从地址输入电路接收锁存的逻辑电平和地址的电路,并将激活信号输出到 当锁存的逻辑电平为第一逻辑电平时,由地址选择的存储器组和对未选择的存储体的失活信号,使得响应于激活信号的所选择的存储器组在活动周期中工作,而未选定的存储器组响应于 灭活信号在预充电循环中工作。

    Circuit in a semiconductor memory for programming operation modes of the
memory
    4.
    发明授权
    Circuit in a semiconductor memory for programming operation modes of the memory 失效
    用于存储器的编程操作模式的半导体存储器中的电路

    公开(公告)号:US5838990A

    公开(公告)日:1998-11-17

    申请号:US905562

    申请日:1997-08-04

    摘要: A synchronous dynamic random access memory capable of accessing data in a memory cell array therein in synchronism with a system clock from an external system such as a central processing unit (CPU). The synchronous DRAM receives an external clock and includes a plurality of memory banks each including a plurality of memory cells and operable in either an active cycle or a precharge cycle, a circuit for receiving a row address strobe signal and latching a logic level of the row address strobe signal in response to the clock, an address input circuit for receiving an externally generated address selecting one of the memory banks, and a circuit for receiving the latched logic level and the address from the address input circuit and for outputting an activation signal to the memory bank selected by the address and an inactivation signals to unselected memory banks when the latched logic level is a first logic level, so that the selected memory bank responsive to the activation signal operates in the active cycle while the unselected memory banks responsive to the inactivation signals operate in the precharge cycle.

    摘要翻译: 能够与来自诸如中央处理单元(CPU)的外部系统的系统时钟同步地访问其中的存储器单元阵列中的数据的同步动态随机存取存储器。 同步DRAM接收外部时钟并且包括多个存储器组,每个存储器组包括多个存储器单元并且可以在有效周期或预充电周期中操作,用于接收行地址选通信号并锁存该行的逻辑电平的电路 响应于时钟的地址选通信号,用于接收选择存储体之一的外部产生的地址的地址输入电路,以及用于从地址输入电路接收锁存的逻辑电平和地址的电路,并将激活信号输出到 当锁存的逻辑电平为第一逻辑电平时,由地址选择的存储器组和对未选择的存储体的失活信号,使得响应于激活信号的所选择的存储器组在活动周期中工作,而未选定的存储器组响应于 灭活信号在预充电循环中工作。

    Synchronous dram having a plurality of latency modes
    5.
    发明授权
    Synchronous dram having a plurality of latency modes 失效
    具有多个等待时间模式的同步电话

    公开(公告)号:US5835956A

    公开(公告)日:1998-11-10

    申请号:US822148

    申请日:1997-03-17

    摘要: A synchronous dynamic random access memory capable of accessing data in a memory cell array therein in synchronism with a system clock from an external system such as a central processing unit (CPU). The synchronous DRAM receives an external clock and includes a plurality of memory banks each including a plurality of memory cells and operable in either an active cycle or a precharge cycle, a circuit for receiving a row address strobe signal and latching a logic level of the row address strobe signal in response to the clock, an address input circuit for receiving an externally generated address selecting one of the memory banks, and a circuit for receiving the latched logic level and the address from the address input circuit and for outputting an activation signal to the memory bank selected by the address and an inactivation signals to unselected memory banks when the latched logic level is a first logic level, so that the selected memory bank responsive to the activation signal operates in the active cycle while the unselected memory banks responsive to the inactivation signals operate in the precharge cycle.

    摘要翻译: 能够与来自诸如中央处理单元(CPU)的外部系统的系统时钟同步地访问其中的存储器单元阵列中的数据的同步动态随机存取存储器。 同步DRAM接收外部时钟并且包括多个存储器组,每个存储器组包括多个存储器单元并且可以在有效周期或预充电周期中操作,用于接收行地址选通信号并锁存该行的逻辑电平的电路 响应于时钟的地址选通信号,用于接收选择存储体之一的外部产生的地址的地址输入电路,以及用于从地址输入电路接收锁存的逻辑电平和地址的电路,并将激活信号输出到 当锁存的逻辑电平为第一逻辑电平时,由地址选择的存储器组和对未选择的存储体的失活信号,使得响应于激活信号的所选择的存储器组在活动周期中工作,而未选定的存储器组响应于 灭活信号在预充电循环中工作。

    Semiconductor memory
    6.
    发明授权
    Semiconductor memory 失效
    半导体存储器

    公开(公告)号:US5703828A

    公开(公告)日:1997-12-30

    申请号:US580622

    申请日:1995-12-29

    摘要: A synchronous dynamic random access memory capable of accessing data in a memory cell array therein in synchronism with a system clock from an external system such as a central processing unit (CPU). The synchronous DRAM receives an external clock and includes a plurality of memory banks each including a plurality of memory cells and operable in either an active cycle or a precharge cycle, a circuit for receiving a row address strobe signal and latching a logic level of the row address strobe signal in response to the clock, an address input circuit for receiving an externally generated address selecting one of the memory banks, and a circuit for receiving the latched logic level and the address from the address input circuit and for outputting an activation signal to the memory bank selected by the address and an inactivation signals to unselected memory banks when the latched logic level is a first logic level, so that the selected memory bank responsive to the activation signal operates in the active cycle while the unselected memory banks responsive to the inactivation signals operate in the precharge cycle.

    摘要翻译: 能够与来自诸如中央处理单元(CPU)的外部系统的系统时钟同步地访问其中的存储器单元阵列中的数据的同步动态随机存取存储器。 同步DRAM接收外部时钟并且包括多个存储器组,每个存储器组包括多个存储器单元并且可以在有效周期或预充电周期中操作,用于接收行地址选通信号并锁存该行的逻辑电平的电路 响应于时钟的地址选通信号,用于接收选择存储体之一的外部产生的地址的地址输入电路,以及用于从地址输入电路接收锁存的逻辑电平和地址的电路,并将激活信号输出到 当锁存的逻辑电平为第一逻辑电平时,由地址选择的存储器组和对未选择的存储体的失活信号,使得响应于激活信号的所选择的存储器组在活动周期中工作,而未选定的存储器组响应于 灭活信号在预充电循环中工作。

    Data output buffer of a semiconductor memory device
    7.
    发明授权
    Data output buffer of a semiconductor memory device 失效
    半导体存储器件的数据输出缓冲器

    公开(公告)号:US5384735A

    公开(公告)日:1995-01-24

    申请号:US130131

    申请日:1993-10-04

    摘要: A semiconductor memory device using a clock of a constant period supplied from the exterior of a memory chip and a sense amplifier for reading out data from a memory cell designated by an address includes at least two different delay circuits for setting at least two delay time periods from the clock, a selecting circuit for receiving signals generated from the delay circuits and selecting one of said signals by a given control signal, and a data output buffer for receiving the data generated from the sense amplifier by a signal generated from the selecting circuit.

    摘要翻译: 使用从存储芯片的外部提供的恒定周期的时钟和用于从由地址指定的存储单元读出数据的读出放大器的半导体存储器件包括至少两个不同的延迟电路,用于设置至少两个延迟时间段 从时钟开始,用于接收从延迟电路产生的信号并通过给定的控制信号选择所述信号之一的选择电路,以及用于通过从选择电路产生的信号接收从读出放大器产生的数据的数据输出缓冲器。

    Multi-bit test circuits for integrated circuit memory devices and
related methods
    8.
    发明授权
    Multi-bit test circuits for integrated circuit memory devices and related methods 失效
    用于集成电路存储器件的多位测试电路及相关方法

    公开(公告)号:US5748639A

    公开(公告)日:1998-05-05

    申请号:US637358

    申请日:1996-04-24

    CPC分类号: G11C29/38

    摘要: A method for testing a plurality of data bits includes the steps of accepting the plurality of data bits at the test circuit, and comparing first and second data bits from the plurality of data bits to determine if the first and second data bits have a common data value. A first comparison signal is generated responsive to the comparison of the first and second data bits. The first comparison signal has a first logic state when the first and second data bits have a common data value and a second logic state when the first and second data bits have different data values. Third and fourth data bits from the plurality of data bits are compared to determine if the third and fourth data bits have a common data value. A second comparison signal is generated responsive to the comparison of the third and fourth data bits wherein the second comparison signal has the first logic state when the third and fourth data bits have a common data value and the second logic state when the third and fourth data bits have different data values.

    摘要翻译: 一种用于测试多个数据位的方法包括以下步骤:在测试电路处接受多个数据位,并且从多个数据位中比较第一和第二数据位,以确定第一和第二数据位是否具有公共数据 值。 响应于第一和第二数据位的比较产生第一比较信号。 当第一和第二数据位具有公共数据值时,第一比较信号具有第一逻辑状态,当第一和第二数据位具有不同的数据值时,第一比较信号具有第一逻辑状态。 比较来自多个数据位的第三和第四数据位,以确定第三和第四数据位是否具有公共数据值。 响应于第三和第四数据比特的比较产生第二比较信号,其中当第三和第四数据比特具有公共数据值时,第二比较信号具有第一逻辑状态,当第三和第四数据 位具有不同的数据值。

    Circuit for generating internal column address suitable for burst mode
    9.
    发明授权
    Circuit for generating internal column address suitable for burst mode 失效
    产生适用于突发模式的内部列地址的电路

    公开(公告)号:US5822270A

    公开(公告)日:1998-10-13

    申请号:US769434

    申请日:1996-12-19

    申请人: Churoo Park

    发明人: Churoo Park

    CPC分类号: G11C7/1018 G11C7/1072

    摘要: An internal column address generation circuit generates an internal column address by utilizing an asynchronous counter. The circuit includes a column address buffer for synchronizing an initially received external address with an external system clock to generate the internal column address, and for synchronizing a counting bit output signal received at an internal input node with the external system clock to generate the internal column address; and an asynchronous counter connected to an output node of the column address buffer, for generating the bit output signal having the same or opposite phase as/to a phase of the internal column address received from the column address buffer, in response to a carry generation state.

    摘要翻译: 内部列地址生成电路利用异步计数器生成内部列地址。 该电路包括列地址缓冲器,用于使初始接收到的外部地址与外部系统时钟同步以产生内部列地址,并且用于使在内部输入节点处接收的计数位输出信号与外部系统时钟同步以产生内部列 地址; 以及连接到列地址缓冲器的输出节点的异步计数器,用于响应于进位生成,产生与列地址缓冲器接收的内部列地址的相位相同或相反相位的位输出信号 州。

    Column redundancy circuit and method of semiconductor memory device
    10.
    发明授权
    Column redundancy circuit and method of semiconductor memory device 失效
    半导体存储器件的列冗余电路和方法

    公开(公告)号:US5621691A

    公开(公告)日:1997-04-15

    申请号:US518863

    申请日:1995-08-24

    申请人: Churoo Park

    发明人: Churoo Park

    CPC分类号: G11C29/802 G11C29/806

    摘要: A column redundancy circuit and method of a semiconductor memory device. The column redundancy circuit comprises a programming element for programming a repair column address; a comparing element for comparing the programmed repair column address with a column address inputted from outside to thereby generate a redundancy enable control signal according to result of the comparison; a decoding element for decoding the repair column address signal to thereby generate a decoding signal; and a redundancy column select element for compounding the decoding signal and a data input signal to thereby enable a redundancy column select signal.

    摘要翻译: 半导体存储器件的列冗余电路和方法。 列冗余电路包括用于编程修复列地址的编程元件; 比较元件,用于将编程的修复列地址与从外部输入的列地址进行比较,从而根据比较结果生成冗余使能控制信号; 解码单元,用于对修复列地址信号进行解码,从而生成解码信号; 以及用于使解码信号和数据输入信号复合的冗余列选择元件,从而使能冗余列选择信号。