Control trimming of hard mask for sub-100 nanometer transistor gate
    3.
    发明授权
    Control trimming of hard mask for sub-100 nanometer transistor gate 有权
    对100纳米晶体管栅极的硬掩模进行控制修整

    公开(公告)号:US06482726B1

    公开(公告)日:2002-11-19

    申请号:US09690152

    申请日:2000-10-17

    CPC classification number: H01L21/28123 H01L29/6659

    Abstract: A method is provided, the method including forming a gate dielectric layer above a substrate layer, forming a gate conductor layer above the gate dielectric layer, forming a first hard mask layer above the gate conductor layer, and forming a second hard mask layer above the first hard mask layer. The method also includes forming a trimmed photoresist mask above the second hard mask layer, and forming a patterned hard mask in the second hard mask layer using the trimmed photoresist mask to remove portions of the second hard mask layer, the patterned hard mask having a first dimension. The method further includes forming a selectively etched hard mask in the first hard mask layer by removing portions of the first hard mask layer adjacent the patterned hard mask, the selectively etched hard mask having a second dimension less than the first dimension, and forming a gate structure using the selectively etched hard mask to remove portions of the gate conductor layer above the gate dielectric layer.

    Abstract translation: 提供了一种方法,该方法包括在衬底层上方形成栅介质层,在栅极介电层上方形成栅极导体层,在栅极导体层之上形成第一硬掩模层,并形成第二硬掩模层 第一硬掩模层。 该方法还包括在第二硬掩模层之上形成修整的光致抗蚀剂掩模,并且在第二硬掩模层中使用经修剪的光致抗蚀剂掩模形成图案化的硬掩模以去除第二硬掩模层的部分,图案化硬掩模具有第一 尺寸。 该方法还包括通过去除与图案化的硬掩模相邻的第一硬掩模层的部分来形成第一硬掩模层中的选择性蚀刻的硬掩模,该选择性蚀刻的硬掩模具有小于第一尺寸的第二尺寸,以及形成栅极 结构,其使用选择性蚀刻的硬掩模以去除栅极介电层上方的栅极导体层的部分。

    Low-K sub spacer pocket formation for gate capacitance reduction
    4.
    发明授权
    Low-K sub spacer pocket formation for gate capacitance reduction 有权
    用于栅极电容降低的低K子间隔袋形成

    公开(公告)号:US06351013B1

    公开(公告)日:2002-02-26

    申请号:US09352339

    申请日:1999-07-13

    Abstract: The capacitance between the gate electrode and the source/drain regions of a semiconductor device is reduced by forming sub-spacers of a low dielectric constant (K) material at the corners of the gate electrode above the source/drain regions. Subsequently, insulating sidewall spacers are formed over the sub-spacers to shield-shallow source/drain regions from subsequent impurity implantations. The resulting semiconductor device exhibits reduced capacitance between the gate electrode and the source/drain regions, while maintaining circuit reliability.

    Abstract translation: 通过在源极/漏极区域之上的栅电极的角部形成低介电常数(K)材料的子间隔物来减小半导体器件的栅电极和源/漏区之间的电容。 随后,在子间隔物之上形成绝缘侧壁间隔物以屏蔽浅源/漏区,从而避免随后的杂质注入。 所得到的半导体器件在保持电路可靠性的同时,在栅极电极和源极/漏极区域之间表现出减小的电容。

    Method of forming semiconductor device comprising a drain region with a
graded N-LDD junction with increased HCI lifetime
    5.
    发明授权
    Method of forming semiconductor device comprising a drain region with a graded N-LDD junction with increased HCI lifetime 失效
    形成半导体器件的方法包括具有增加的HCl寿命的具有梯度N-LDD结的漏区

    公开(公告)号:US6114210A

    公开(公告)日:2000-09-05

    申请号:US979364

    申请日:1997-11-26

    CPC classification number: H01L29/6659 H01L21/26586 H01L29/66659 H01L29/7835

    Abstract: A CMOS semiconductor device is formed having an N-channel transistor comprising a drain region with a graded N-LDD junction. The graded N-LDD junction is obtained by plural ion implantations at different implantation dosages, energies and angles. The graded N-LDD junction reduces the electric field around the drain, thereby increasing the HCI lifetime without adversely impacting the short channel effect.

    Abstract translation: 形成具有N沟道晶体管的CMOS半导体器件,N沟道晶体管包括具有渐变N-LDD结的漏极区。 通过以不同植入剂量,能量和角度的多个离子注入获得分级N-LDD结。 分级N-LDD结降低了漏极周围的电场,从而提高了HCl寿命,而不会对短沟道效应产生不利影响。

    Colloidal crystallization via applied fields
    8.
    发明授权
    Colloidal crystallization via applied fields 有权
    通过应用场的胶体结晶

    公开(公告)号:US07704320B2

    公开(公告)日:2010-04-27

    申请号:US10838908

    申请日:2004-05-03

    CPC classification number: C30B7/00 C30B29/54

    Abstract: The methods provided use external fields such as light and electricity as a means of directing the crystallization of concentrated colloidal systems. Not only can nucleation be directed, crystal melting can be carefully controlled and light-induced crystal diffraction used as a means of directing light propagation. A number of factors play a significant role on the crystallization rate and location, including the intensity of the light field, the magnitude of the electric field, the colloid concentration, the colloid size, and the colloid composition. In varying these parameters, kinetics in these processes are extremely fast when compared to traditional colloidal crystallization approaches.

    Abstract translation: 提供的方法使用诸如光和电的外部领域作为指导浓缩胶体体系的结晶的手段。 成核不仅可以引导,晶体熔化也可以小心控制,光诱导的晶体衍射用作引导光传播的手段。 许多因素对结晶速率和位置都起着重要的作用,包括光场强度,电场强度,胶体浓度,胶体尺寸和胶体组成。 在改变这些参数时,与传统的胶体结晶方法相比,这些方法中的动力学非常快。

    AUTOMATIC LOAD BALANCING OF A 3D GRAPHICS PIPELINE
    9.
    发明申请
    AUTOMATIC LOAD BALANCING OF A 3D GRAPHICS PIPELINE 有权
    3D图形管道的自动负载平衡

    公开(公告)号:US20080165199A1

    公开(公告)日:2008-07-10

    申请号:US11621917

    申请日:2007-01-10

    CPC classification number: G06T15/005 G06T1/20

    Abstract: A device has a processor for processing a vertex processing stage, a sub-screen dividing stage and a pixel rendering stage of a three-dimensional (3D) graphics pipeline. The processor includes processing threads which balance the work load of the 3D graphics pipeline by prioritizing processing for the pixel rendering stage over other stages. Each processing thread, operating in parallel and independently, checks a level of tasks in a Task list of sub-screen tasks. If the level is below a threshold value, empty or the sub-screen tasks are all locked, the processing thread loops to the vertex processing stage. Otherwise, the processing thread processes a sub-screen task during the pixel rendering stage.

    Abstract translation: 一种设备具有用于处理三维(3D)图形流水线的顶点处理阶段,子屏幕划分阶段和像素渲染阶段的处理器。 该处理器包括处理线程,其平衡3D图形流水线的工作负载,通过对像素渲染阶段的处理优先于其他阶段。 并行和独立运行的每个处理线程检查子屏幕任务的任务列表中的任务级别。 如果该级别低于阈值,则清空或子屏幕任务都被锁定,则处理线程循环到顶点处理阶段。 否则,处理线程在像素渲染阶段处理子屏幕任务。

    AD decorative/ protecting structure for base of game machine
    10.
    发明申请
    AD decorative/ protecting structure for base of game machine 审中-公开
    AD装饰/保护结构为游戏机的基地

    公开(公告)号:US20070021217A1

    公开(公告)日:2007-01-25

    申请号:US11183795

    申请日:2005-07-19

    Applicant: David Wu

    Inventor: David Wu

    CPC classification number: G07F17/32 G07F17/3216 G07F17/3227

    Abstract: An advertising decorative and protecting structure for a base of a game machine, the structure has a base provided therein with a cash box, the base is provided on its top surface with members such as a display screen and a top light box as the components of the main body of the game machine; the base is provided beneath the top and on the rear of the front face thereof with a liftable transparent door plate; this liftable transparent door plate is assembled on the rear of it at least with an integrally formed illumination device, so that it can generate an illumination function by which light is penetrable to the outside during operating the game machine, and also can form a covering and protecting structure for the entire base. The structure can elevate the effect of decoration of the base of the game machine in order to attract consumers, and further to enhance the function of protection of the cash box.

    Abstract translation: 一种用于游戏机基座的广告装饰和保护结构,该结构在其中设置有一个现金箱,底座在其顶表面上设置有诸如显示屏和顶灯箱的部件作为 游戏机的主体; 底座在其正面的顶部和后部设置有可升降的透明门板; 该可升降透明门板至少具有一体形成的照明装置,组装在其后部,从而能够在操作游戏机时产生光线可透过外部的照明功能,也可以形成遮盖物 保护整个基地的结构。 结构可以提升游戏机底座的装饰效果,吸引消费者,进一步提升保护箱的功能。

Patent Agency Ranking