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13 条记录 (耗时 0.016 秒)

    Probe attach tool
    1.
    发明申请
    Probe attach tool 有权
    探头连接工具

    公开(公告)号：US20050247755A1

    公开(公告)日：2005-11-10

    申请号：US10900161

    申请日：2004-07-27

    申请人： Edward Laurent ,  Dan Mironescu

    发明人： Edward Laurent ,  Dan Mironescu

    IPC分类号： G01R1/067 ,  B23K31/12

    CPC分类号： G01R1/06705 ,  G01R1/06711

    摘要： A tool for attaching fine preformed probes to a substrate for use with a vacuum source is disclosed. The apparatus comprises a body portion; a tip portion disposed at one end of the body portion; a first orifice extending from a first end of the body portion to the working tip; and at least one second orifice extending from an outer portion of the working tip and communicating with the first orifice, wherein the vacuum source is coupled to the body portion so that a vacuum generated by the vacuum source is provided to the at least one second orifice.

    摘要翻译： 公开了一种用于将精细预成型探针附着到用于真空源的基底上的工具。 该装置包括主体部分; 设置在所述主体部的一端的前端部; 从主体部分的第一端延伸到工作尖端的第一孔; 以及从所述工作尖端的外部部分延伸并与所述第一孔口连通的至少一个第二孔口，其中所述真空源联接到所述主体部分，使得由所述真空源产生的真空设置在所述至少一个第二孔口 。

    Spring loaded probe pin assembly
    2.
    发明授权
    Spring loaded probe pin assembly 有权
    弹簧加载探头针组件

    公开(公告)号：US07479794B2

    公开(公告)日：2009-01-20

    申请号：US11712797

    申请日：2007-02-28

    申请人： Dov Chartarifsky ,  Avi Pollak ,  Dan Mironescu

    发明人： Dov Chartarifsky ,  Avi Pollak ,  Dan Mironescu

    IPC分类号： G01R31/02

    CPC分类号： G01R1/07342 ,  G01R1/06722 ,  G01R3/00 ,  Y10T29/49117

    摘要： A method and apparatus for constructing a probe card assembly is provided. A probe pin is inserted into an aperture of an inverted socket enclosure to cause a probe pin shoulder of the probe pin to make contact with an aperture shoulder of the aperture. An upper end of the probe pin protrudes from the aperture after the probe pin shoulder makes contact with the aperture shoulder. A compressible member is inserted into the aperture to position an upper end of the compressible member to make contact with a lower portion of the probe pin. A substrate is aligned over the inverted socket enclosure so that the lower end of the compressible member is in contact with a substrate contact located on the substrate. The substrate is affixed in a non-permanent manner to the inverted socket enclosure.

    摘要翻译： 提供一种用于构造探针卡组件的方法和装置。 探头针插入反向插座外壳的孔中，使探针的探针针脚与孔的孔肩接触。 在探头针肩与孔肩接触后，探针的上端从孔径突出。 将可压缩构件插入到孔中以定位可压缩构件的上端以与探针的下部接触。 衬底在倒置的插座外壳上对准，使得可压缩构件的下端与位于衬底上的衬底触点接触。 基板以非永久性方式固定在倒置的插座外壳上。

    Probes for a Wafer Test Apparatus
    4.
    发明申请
    Probes for a Wafer Test Apparatus 有权
    硅片测试仪的探头

    公开(公告)号：US20080258746A1

    公开(公告)日：2008-10-23

    申请号：US11885107

    申请日：2006-02-16

    申请人： Lich Thanh Tran ,  Edward Lambert Malantonio ,  Edward T. Laurent ,  Ilan Hanoon ,  Dan Mironescu

    发明人： Lich Thanh Tran ,  Edward Lambert Malantonio ,  Edward T. Laurent ,  Ilan Hanoon ,  Dan Mironescu

    IPC分类号： G01R1/073

    CPC分类号： G01R1/06716 ,  G01R1/0675 ,  G01R1/07357

    摘要： A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion (56) extending between the first end portion and the second end portion.

    摘要翻译： 构造成用于集成电路测试的探针包括终止于脚部（42）的第一端部部分，所述脚部限定基本上平坦的表面，所述基本上平坦的表面被配置为连接到基底（400），第二端部终止于尖端 （50），所述尖端构造成在所述集成电路的测试期间与集成电路接触，以及在所述第一端部和所述第二端部之间延伸的弯曲主体部分（56）。

    Probe attach tool
    5.
    发明授权
    Probe attach tool 有权
    探头连接工具

    公开(公告)号：US07311239B2

    公开(公告)日：2007-12-25

    申请号：US10900161

    申请日：2004-07-27

    申请人： Edward T. Laurent ,  Dan Mironescu

    发明人： Edward T. Laurent ,  Dan Mironescu

    IPC分类号： B23K37/00

    CPC分类号： G01R1/06705 ,  G01R1/06711

    摘要： A tool for attaching fine preformed probes to a substrate for use with a vacuum source is disclosed. The apparatus comprises a body portion; a tip portion disposed at one end of the body portion; a first orifice extending from a first end of the body portion to the working tip; and at least one second orifice extending from an outer portion of the working tip and communicating with the first orifice, wherein the vacuum source is coupled to the body portion so that a vacuum generated by the vacuum source is provided to the at least one second orifice.

    摘要翻译： 公开了一种用于将精细预成型探针附着到用于真空源的基底上的工具。 该装置包括主体部分; 设置在所述主体部的一端的前端部; 从主体部分的第一端延伸到工作尖端的第一孔; 以及从所述工作尖端的外部部分延伸并与所述第一孔口连通的至少一个第二孔口，其中所述真空源联接到所述主体部分，使得由所述真空源产生的真空设置在所述至少一个第二孔口 。

    Spring loaded probe pin assembly
    7.
    发明申请
    Spring loaded probe pin assembly 有权
    弹簧加载探头针组件

    公开(公告)号：US20080204061A1

    公开(公告)日：2008-08-28

    申请号：US11712797

    申请日：2007-02-28

    申请人： Dov Chartarifsky ,  Avi Pollak ,  Dan Mironescu

    发明人： Dov Chartarifsky ,  Avi Pollak ,  Dan Mironescu

    IPC分类号： G01R1/067 ,  B23P19/00

    CPC分类号： G01R1/07342 ,  G01R1/06722 ,  G01R3/00 ,  Y10T29/49117

    摘要： A method and apparatus for constructing a probe card assembly is provided. A probe pin is inserted into an aperture of an inverted socket enclosure to cause a probe pin shoulder of the probe pin to make contact with an aperture shoulder of the aperture. An upper end of the probe pin protrudes from the aperture after the probe pin shoulder makes contact with the aperture shoulder. A compressible member is inserted into the aperture to position an upper end of the compressible member to make contact with a lower portion of the probe pin. A substrate is aligned over the inverted socket enclosure so that the lower end of the compressible member is in contact with a substrate contact located on the substrate. The substrate is affixed in a non-permanent manner to the inverted socket enclosure.

    摘要翻译： 提供一种用于构造探针卡组件的方法和装置。 探头针插入反向插座外壳的孔中，使探针的探针针脚与孔的孔肩接触。 在探头针肩与孔肩接触后，探针的上端从孔径突出。 将可压缩构件插入到孔中以定位可压缩构件的上端以与探针的下部接触。 衬底在倒置的插座外壳上对准，使得可压缩构件的下端与位于衬底上的衬底触点接触。 基板以非永久性方式固定在倒置的插座外壳上。

    Probes for a wafer test apparatus
    10.
    发明授权
    Probes for a wafer test apparatus 有权
    晶圆测试仪的探头

    公开(公告)号：US07808260B2

    公开(公告)日：2010-10-05

    申请号：US11885107

    申请日：2006-02-16

    申请人： Lich Thanh Tran ,  Edward Lambert Malantonio ,  Edward T. Laurent ,  Ilan Hanoon ,  Dan Mironescu

    发明人： Lich Thanh Tran ,  Edward Lambert Malantonio ,  Edward T. Laurent ,  Ilan Hanoon ,  Dan Mironescu

    IPC分类号： G01R31/02

    CPC分类号： G01R1/06716 ,  G01R1/0675 ,  G01R1/07357

    摘要： A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion (56) extending between the first end portion and the second end portion.

    摘要翻译： 构造成用于集成电路测试的探针包括终止于脚部（42）的第一端部部分，所述脚部限定基本上平坦的表面，所述基本上平坦的表面被配置为连接到基底（400），第二端部终止于尖端 （50），所述尖端构造成在所述集成电路的测试期间与集成电路接触，以及在所述第一端部和所述第二端部之间延伸的弯曲主体部分（56）。