Surface inspection apparatus and method, and slit coater using the same
    1.
    发明申请
    Surface inspection apparatus and method, and slit coater using the same 有权
    表面检查装置和方法,以及使用其的狭缝涂布机

    公开(公告)号:US20110128550A1

    公开(公告)日:2011-06-02

    申请号:US12926622

    申请日:2010-11-30

    IPC分类号: G01B9/02 G01N21/00

    摘要: Provided are a surface inspection apparatus and method capable of detecting foreign materials on the surface of a substrate, and a slit coater having the surface inspection apparatus. In the surface inspection apparatus, a slit lighting unit irradiates slit-shaped light. An optical system splits the slit-shaped light into two beams traveling along two different paths, is incident upon a subject, and extracts an interference image caused by combination of the two beams reflected from the subject. An imaging device captures the interference image to output an image signal. An analysis unit acquires a luminance value of the image signal, analyzes the luminance value in real time, and determines whether or not foreign materials are present.

    摘要翻译: 提供了能够检测基板表面的异物的表面检查装置和方法,以及具有表面检查装置的狭缝涂布机。 在表面检查装置中,狭缝照明部照射狭缝状的光。 光学系统将狭缝状光分成沿着两个不同路径行进的两束光束,入射到被摄体上,并提取由对象反射的两束光的组合引起的干涉图像。 成像装置捕获干涉图像以输出图像信号。 分析单元获取图像信号的亮度值,实时分析亮度值,并确定是否存在异物。

    Interferometric surface inspection using a slit-shaped reference beam from inspection surface
    2.
    发明授权
    Interferometric surface inspection using a slit-shaped reference beam from inspection surface 有权
    使用来自检查表面的狭缝状参考光束进行干涉测试

    公开(公告)号:US08643845B2

    公开(公告)日:2014-02-04

    申请号:US12926622

    申请日:2010-11-30

    IPC分类号: G01N21/00 G01B11/02

    摘要: Provided are a surface inspection apparatus and method capable of detecting foreign materials on the surface of a substrate, and a slit coater having the surface inspection apparatus. In the surface inspection apparatus, a slit lighting unit irradiates slit-shaped light. An optical system splits the slit-shaped light into two beams traveling along two different paths, is incident upon a subject, and extracts an interference image caused by combination of the two beams reflected from the subject. An imaging device captures the interference image to output an image signal. An analysis unit acquires a luminance value of the image signal, analyzes the luminance value in real time, and determines whether or not foreign materials are present.

    摘要翻译: 提供了能够检测基板表面的异物的表面检查装置和方法,以及具有表面检查装置的狭缝涂布机。 在表面检查装置中,狭缝照明部照射狭缝状的光。 光学系统将狭缝状光分成沿着两个不同路径行进的两束光束,入射到被摄体上,并提取由对象反射的两束光的组合引起的干涉图像。 成像装置捕获干涉图像以输出图像信号。 分析单元获取图像信号的亮度值,实时分析亮度值,并确定是否存在异物。

    Mask for evaporation, and method and apparatus for manufacturing the same
    6.
    发明授权
    Mask for evaporation, and method and apparatus for manufacturing the same 有权
    用于蒸发的掩模,及其制造方法和装置

    公开(公告)号:US09259805B2

    公开(公告)日:2016-02-16

    申请号:US12964706

    申请日:2010-12-09

    摘要: Provided is a mask for an evaporation apparatus, which includes a first division mask and a second division mask. The first and second division masks are directly bonded to each other by welding, thereby forming welding portion between the first and the second division masks. A method and apparatus for manufacturing a mask for evaporation are also provided. The division masks according to the embodiment do not use subframes, and are directly bonded to one another by welding, so that a shadow effect does not occur. The apparatus for manufacturing a mask for evaporation includes a work stage, a clamp fixing a first division mask and a second division mask to the work stage, and a laser welding part welding the first division mask to the second division mask. The apparatus may further include a first roller leading the laser welding part and a second roller following the laser welding part.

    摘要翻译: 提供了一种用于蒸发装置的掩模,其包括第一分隔掩模和第二分隔掩模。 第一和第二分割掩模通过焊接直接接合,从而在第一和第二分隔掩模之间形成焊接部分。 还提供了用于制造用于蒸发的掩模的方法和装置。 根据本实施例的分割掩模不使用子帧,并且通过焊接直接接合,从而不发生阴影效应。 用于制造用于蒸发的掩模的装置包括工作台,将第一分区掩模固定到工作台的夹具和将第一分隔掩模焊接到第二分隔掩模的激光焊接部。 该装置还可以包括引导激光焊接部的第一辊和跟随激光焊接部的第二辊。

    MASK FOR EVAPORATION, AND METHOD AND APPARATUS FOR MANUFACTURING THE SAME
    8.
    发明申请
    MASK FOR EVAPORATION, AND METHOD AND APPARATUS FOR MANUFACTURING THE SAME 有权
    用于蒸发的掩模,以及用于制造其的方法和装置

    公开(公告)号:US20110139365A1

    公开(公告)日:2011-06-16

    申请号:US12964706

    申请日:2010-12-09

    IPC分类号: B32B37/04 B05C11/11

    摘要: Provided is a mask for an evaporation apparatus, which includes a first division mask and a second division mask. The first and second division masks are directly bonded to each other by welding, thereby forming welding portion between the first and the second division masks. A method and apparatus for manufacturing a mask for evaporation are also provided. The division masks according to the embodiment do not use subframes, and are directly bonded to one another by welding, so that a shadow effect does not occur. The apparatus for manufacturing a mask for evaporation includes a work stage, a clamp fixing a first division mask and a second division mask to the work stage, and a laser welding part welding the first division mask to the second division mask. The apparatus may further include a first roller leading the laser welding part and a second roller following the laser welding part.

    摘要翻译: 提供了一种用于蒸发装置的掩模,其包括第一分隔掩模和第二分隔掩模。 第一和第二分割掩模通过焊接直接接合,从而在第一和第二分隔掩模之间形成焊接部分。 还提供了用于制造用于蒸发的掩模的方法和装置。 根据本实施例的分割掩模不使用子帧,并且通过焊接直接接合,从而不发生阴影效应。 用于制造用于蒸发的掩模的装置包括工作台,将第一分区掩模固定到工作台的夹具和将第一分隔掩模焊接到第二分隔掩模的激光焊接部。 该装置还可以包括引导激光焊接部的第一辊和跟随激光焊接部的第二辊。