Memory array having an interconnect and method of manufacture
    1.
    发明申请
    Memory array having an interconnect and method of manufacture 审中-公开
    具有互连和制造方法的存储器阵列

    公开(公告)号:US20080074927A1

    公开(公告)日:2008-03-27

    申请号:US11525547

    申请日:2006-09-22

    IPC分类号: G11C16/04

    摘要: A memory array includes first, second, third and forth memory cell strings. Each of the first, second, third, and fourth memory cell strings includes a number of serially-coupled memory cells, including a first memory cell and a last memory cell. A first interconnect is coupled to a first bit line and to each of the first, second, third and fourth memory cell strings. The first interconnect includes first, second, third and fourth string input select gates. Each input select gate has a first terminal coupled to the first bit line, and a second terminal coupled to one of the respective first, second, third or fourth memory cell strings.

    摘要翻译: 存储器阵列包括第一,第二,第三和第四存储器单元串。 第一,第二,第三和第四存储器单元串中的每一个包括多个串行耦合的存储器单元,包括第一存储单元和最后存储单元。 第一互连耦合到第一位线和第一,第二,第三和第四存储器单元串中的每一个。 第一互连包括第一,第二,第三和第四串输入选择门。 每个输入选择栅极具有耦合到第一位线的第一端子和耦合到相应的第一,第二,第三或第四存储器单元串之一的第二端子。

    Integrated Circuit Having NAND Memory Cell Strings
    2.
    发明申请
    Integrated Circuit Having NAND Memory Cell Strings 有权
    具有NAND存储器单元串的集成电路

    公开(公告)号:US20090097317A1

    公开(公告)日:2009-04-16

    申请号:US11872655

    申请日:2007-10-15

    摘要: Embodiments of the present invention relate generally to integrated circuits and methods for manufacturing an integrated circuit. In an embodiment of the invention, an integrated circuit having a memory cell is provided. The memory cell may include a trench in a carrier, a charge trapping layer structure in the trench, the charge trapping layer structure comprising at least two separate charge trapping regions, electrically conductive material at least partially filled in the trench, and source/drain regions next to the trench.

    摘要翻译: 本发明的实施例一般涉及用于制造集成电路的集成电路和方法。 在本发明的实施例中,提供了具有存储单元的集成电路。 存储单元可以包括载体中的沟槽,沟槽中的电荷俘获层结构,电荷俘获层结构包括至少两个分离的电荷俘获区,至少部分填充在沟槽中的导电材料以及源/漏区 旁边的沟槽。

    Integrated circuit having NAND memory cell strings
    3.
    发明授权
    Integrated circuit having NAND memory cell strings 有权
    具有NAND存储单元串的集成电路

    公开(公告)号:US07778073B2

    公开(公告)日:2010-08-17

    申请号:US11872655

    申请日:2007-10-15

    IPC分类号: G11C16/04

    摘要: Embodiments of the present invention relate generally to integrated circuits and methods for manufacturing an integrated circuit. In an embodiment of the invention, an integrated circuit having a memory cell is provided. The memory cell may include a trench in a carrier, a charge trapping layer structure in the trench, the charge trapping layer structure comprising at least two separate charge trapping regions, electrically conductive material at least partially filled in the trench, and source/drain regions next to the trench.

    摘要翻译: 本发明的实施例一般涉及用于制造集成电路的集成电路和方法。 在本发明的实施例中,提供了具有存储单元的集成电路。 存储单元可以包括载体中的沟槽,沟槽中的电荷俘获层结构,电荷俘获层结构包括至少两个分离的电荷俘获区,至少部分填充在沟槽中的导电材料以及源/漏区 旁边的沟槽。

    Integrated Circuits and Methods of Manufacturing Thereof
    7.
    发明申请
    Integrated Circuits and Methods of Manufacturing Thereof 有权
    集成电路及其制造方法

    公开(公告)号:US20080259687A1

    公开(公告)日:2008-10-23

    申请号:US11737617

    申请日:2007-04-19

    IPC分类号: G11C5/00 H01R43/00

    摘要: Embodiments of the invention relate to integrated circuits having a memory cell arrangement and methods of manufacturing thereof. In one embodiment of the invention, an integrated circuit has a memory cell arrangement which includes a fin structure extending in its longitudinal direction as a first direction, including a first insulating layer, a first active region disposed above the first insulating layer, a second insulating layer disposed above the first active region, a second active region disposed above the second insulating layer, a charge storage layer structure disposed at least next to at least one sidewall of the fin structure covering at least a portion of the first active region and at least a portion of the second active region, and a control gate disposed next to the charge storage layer structure.

    摘要翻译: 本发明的实施例涉及具有存储单元布置的集成电路及其制造方法。 在本发明的一个实施例中,集成电路具有存储单元布置,其包括沿其纵向方向延伸的翅片结构作为第一方向,包括第一绝缘层,设置在第一绝缘层上方的第一有源区,第二绝缘层 设置在所述第一有源区上方的第二有源区,设置在所述第二绝缘层上方的第二有源区,电荷存储层结构,其至少布置在所述鳍结构的至少一个侧壁上,覆盖所述第一有源区的至少一部分,并且至少 第二有源区的一部分,以及设置在电荷存储层结构旁边的控制栅。

    Integrated circuits and methods of manufacture
    8.
    发明申请
    Integrated circuits and methods of manufacture 审中-公开
    集成电路和制造方法

    公开(公告)号:US20080251833A1

    公开(公告)日:2008-10-16

    申请号:US11786751

    申请日:2007-04-12

    IPC分类号: H01L29/788 H01L21/336

    摘要: In various embodiments of the invention, integrated circuits and methods of manufacturing integrated circuits are provided. In an embodiment of the invention, an integrated circuit having at least one memory cell is provided. The memory cell includes a dielectric layer disposed above a charge storage region, a word line disposed above the dielectric layer, and a control line disposed at least partially above at least one sidewall of the dielectric layer.

    摘要翻译: 在本发明的各种实施例中,提供集成电路和制造集成电路的方法。 在本发明的实施例中,提供了具有至少一个存储单元的集成电路。 存储单元包括设置在电荷存储区域上方的电介质层,设置在电介质层上方的字线​​以及至少部分地设置在电介质层的至少一个侧壁上方的控制线。

    Integrated circuits and methods of manufacturing thereof
    9.
    发明授权
    Integrated circuits and methods of manufacturing thereof 有权
    集成电路及其制造方法

    公开(公告)号:US07714377B2

    公开(公告)日:2010-05-11

    申请号:US11737617

    申请日:2007-04-19

    IPC分类号: H01L29/788

    摘要: Embodiments of the invention relate to integrated circuits having a memory cell arrangement and methods of manufacturing thereof. In one embodiment of the invention, an integrated circuit has a memory cell arrangement which includes a fin structure extending in its longitudinal direction as a first direction, including a first insulating layer, a first active region disposed above the first insulating layer, a second insulating layer disposed above the first active region, a second active region disposed above the second insulating layer, a charge storage layer structure disposed at least next to at least one sidewall of the fin structure covering at least a portion of the first active region and at least a portion of the second active region, and a control gate disposed next to the charge storage layer structure.

    摘要翻译: 本发明的实施例涉及具有存储单元布置的集成电路及其制造方法。 在本发明的一个实施例中,集成电路具有存储单元布置,其包括沿其纵向方向延伸的翅片结构作为第一方向,包括第一绝缘层,设置在第一绝缘层上方的第一有源区,第二绝缘层 设置在所述第一有源区上方的第二有源区,设置在所述第二绝缘层上方的第二有源区,电荷存储层结构,其至少布置在所述鳍结构的至少一个侧壁上,覆盖所述第一有源区的至少一部分,并且至少 第二有源区的一部分,以及设置在电荷存储层结构旁边的控制栅。