Microwave interconnect
    1.
    发明授权
    Microwave interconnect 失效
    微波互连

    公开(公告)号:US4657322A

    公开(公告)日:1987-04-14

    申请号:US782244

    申请日:1985-10-01

    摘要: A microwave interconnect for integrated or hybrid circuits includes a flexible sheet bearing a flexible conductor which is divided into a plurality of insulated conductive lines, at least some of which make contact with the integrated or hybrid circuit, as well as with a second circuit to which the first is thereby connected. The flexible sheet is backed by a body of elastomeric material and a compression bar which assures good electrical contact of the flexible conductor with the circuits when the compression bar is tightened down on the circuits. The construction allows some degree of misregistration of parts while providing circuit coupling operative at high frequencies.

    摘要翻译: 用于集成或混合电路的微波互连包括具有柔性导体的柔性片,其被分成多个绝缘导线,其至少一些与集成或混合电路接触,以及与第二电路 第一个由此连接。 柔性片材由弹性材料体和压缩杆支撑,当压缩杆在电路上紧固时,该压缩杆确保柔性导体与电路的良好电接触。 该构造允许部件的一些程度的不对准,同时提供在高频下操作的电路耦合。

    Capacitive tuning screw
    2.
    发明授权
    Capacitive tuning screw 失效
    电容调谐螺丝

    公开(公告)号:US4598334A

    公开(公告)日:1986-07-01

    申请号:US699377

    申请日:1985-02-07

    IPC分类号: F16B35/04 H01G5/16 F16B33/00

    摘要: A capacitive tuning screw comprises a threaded portion with a longitudinal cavity for slidably receiving a plunger shaft. If the capacitive element on the tip of the plunger shaft contacts the corresponding capacitive element on the surface of an electrical circuit board or substrate, further turning of the screw will cause the shaft to slide into the cavity and prevent crushing the circuit board or substrate. A shoulder on the screw stops rotation and longitudinal movement of the screw before the entire length of the plunger shaft slides into the cavity.

    摘要翻译: 电容调谐螺钉包括具有用于可滑动地容纳柱塞轴的纵向腔的螺纹部分。 如果柱塞轴的尖端上的电容元件与电路板或基板的表面上的相应的电容元件接触,则螺杆的进一步转动将导致轴滑入空腔并防止电路板或基板的破碎。 在柱塞轴的整个长度滑入空腔之前,螺钉上的肩部停止螺杆的旋转和纵向移动。

    System for facilitating planar probe measurements of high-speed
interconnect structures
    3.
    发明授权
    System for facilitating planar probe measurements of high-speed interconnect structures 失效
    用于促进高速互连结构的平面探针测量的系统

    公开(公告)号:US4994737A

    公开(公告)日:1991-02-19

    申请号:US491569

    申请日:1990-03-09

    CPC分类号: G01R31/2886

    摘要: An adapter, having a dielectric substrate upon which are mounted an array of uniformly-spaced, coplanar conductive strips and impedance standards having similarly spaced coplanar leads, facilitates planar transmission line probe measurements of the high-speed electrical characteristics of a package or other interconnect structure for a high-speed integrated circuit. The conductive strips of the adapter are connected to the terminals of the package so as to simulate the integrated circuit connection, that is, with substantially identical length and spacing of bond wires. The planar probe, by contacting the conductive strips of the adapter, is able to measure the electrical characteristics of the package including the bond wires, thereby providing realistic measurements of the integrated circuit's environment. The impedance standards on the adapter are specially designed to enable the effects of the adapter to be removed from the measurements by calibration.

    Power divider/combiner circuit
    4.
    发明授权
    Power divider/combiner circuit 失效
    功率分配器/组合器电路

    公开(公告)号:US4668920A

    公开(公告)日:1987-05-26

    申请号:US852092

    申请日:1986-04-14

    申请人: Keith E. Jones

    发明人: Keith E. Jones

    IPC分类号: H03H11/36 H03F3/60

    CPC分类号: H03H11/36

    摘要: A broadband, monolithic integrated-circuit power divider/combiner circuit utilizing gallium arsenide field-effect transistors configured as distributed amplifiers. Two distributed amplifiers include a common merged transmission line element which divides/combines the input signal(s).

    摘要翻译: 利用砷化镓场效应晶体管构成分布式放大器的宽带单片集成电路功率分配器/组合电路。 两个分布式放大器包括分配/组合输入信号的公共合并传输线元件。

    High-frequency active probe having replaceable contact needles

    公开(公告)号:US5045781A

    公开(公告)日:1991-09-03

    申请号:US663708

    申请日:1991-03-04

    IPC分类号: G01R1/067

    CPC分类号: G01R1/06772

    摘要: A high-frequency probe comprising a semirigid coaxial line which terminates in an active circuit assembly. The coaxial line's outer conductor is connected to a box while its inner conductor is connected to an active circuit chip. A signal contact needle is attached to the active circuit chip and extends linearly with the coaxial line. The signal needle is held in place with a mass of epoxy filled with silica microballoons, providing a low-capacitance mount. A ground contact needle is connected to a wiper which contacts the box, thus providing a direct, and short, path between the coaxial line's outer conductor and the ground contact needle.

    System for setting reference reactance for vector corrected measurements
    6.
    发明授权
    System for setting reference reactance for vector corrected measurements 失效
    用于设置向量校正测量的参考电抗系统

    公开(公告)号:US4858160A

    公开(公告)日:1989-08-15

    申请号:US169844

    申请日:1988-03-18

    IPC分类号: G01R27/04 G01R35/00

    CPC分类号: G01R27/04 G01R35/005

    摘要: A system for calibrating vector corrected electrical measurements to adjust for distortion due to reactance in the measuring circuit, particularly that caused by variable positioning of a circuit element, such as probe or coupling. Initial error factors for directivity, source match, and frequency response, respectively, normally calculated from assumed reflection coefficients of respective primary impedance standards, are adjusted to correct for such reactance. Reflection coefficient measurements (magnitude and phase) of a further impedance standard, different from the primary standards, are obtained at multiple frequencies and corrected by the initial error factors. The corrected magnitude and phase measurements of the further impedance standard are compared with theoretical magnitude and phase values which very linearly with frequency, and the initial error factors are adjusted so as to minimize any deviation of the corrected measurements from the linear values. Thereafter, by positioning the probe or other circuit element relative to a device under test substantially identically to its previous placement relative to the further impedance standard, the adjusted error factors can be used to obtain corrected measurements with minimized magnitude and phase errors due to reactance.

    Surface mountable microwave IC package
    7.
    发明授权
    Surface mountable microwave IC package 失效
    表面贴装微波IC封装

    公开(公告)号:US4626805A

    公开(公告)日:1986-12-02

    申请号:US727946

    申请日:1985-04-26

    申请人: Keith E. Jones

    发明人: Keith E. Jones

    摘要: A surface mountable microwave IC package uses printed transmission lines on a printed circuit board in lieu of plumbing between milled packages. A backside co-planar waveguide is connected to a topside microstrip line by a through-hole in a carrier substrate. To compensate for inductance added by the hole and transmission line ends, a gap is adjusted to provide compensation capacitance. Hermetic sealing of the package is assured by brazing a lead frame over the through-hole and using a solder sealed lid. The lid provides both a hermetic seal and shielding.

    摘要翻译: 可表面安装的微波IC封装使用印刷电路板上的印刷传输线代替在铣削的封装之间的管道。 背面共面波导通过载体基板中的通孔连接到顶侧微带线。 为了补偿由孔和传输线端增加的电感,调整间隙以提供补偿电容。 通过将引线框架焊接在通孔上并使用焊接密封的盖子来确保封装的密封。 盖子提供气密密封和屏蔽。

    Test fixture for microstrip assemblies
    9.
    发明授权
    Test fixture for microstrip assemblies 失效
    微带组件测试夹具

    公开(公告)号:US4961050A

    公开(公告)日:1990-10-02

    申请号:US309698

    申请日:1989-02-10

    IPC分类号: G01R31/00 G01R1/04 H01P5/08

    CPC分类号: G01R1/04

    摘要: A test fixture for testing microstrip assemblies and similar electronic circuit components and assemblies under application of high-frequency signals introduced through launchers whose positions are adjustable in the test fixture to accommodate circuit assemblies of different sizes and different geometry. An easily operated rapid connector positioning mechanism moves connectors which complete electrical connection between outer conductors of the launchers and a ground plane conductor of a microstrip assembly. The connectors also lift the microstrip assembly and support it while electrical connection is completed, without the need for a carrier beneath the test assembly. A lid is moved in coordination with operation of the connector positioning mechanism to provide electrical contact to a third point on the upper face of a circuit assembly to be tested.