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    Neural processor with holographic optical paths and nonlinear operating means
    3.
    发明授权
    Neural processor with holographic optical paths and nonlinear operating means 失效
    具有全息光路和非线性运算装置的神经处理器

    公开(公告)号：US5132813A

    公开(公告)日：1992-07-21

    申请号：US631104

    申请日：1990-12-19

    申请人： H. John Caulfield ,  Charles F. Hester ,  Jason M. Kinser ,  Joseph Shamir

    发明人： H. John Caulfield ,  Charles F. Hester ,  Jason M. Kinser ,  Joseph Shamir

    IPC分类号： G06N3/067

    CPC分类号： G06N3/067 ,  G06N3/0675

    摘要： An optical apparatus for simulating a highly interconnected neural network is disclosed as including a spatial light modulator (SLM), an inputting device, a laser, a detecting device, and a page-oriented holographic component. The inputting device applies input signals to the SLM. The holographic component optically interconnects N.sup.2 pixels defined on the spatial light modulator to N.sup.2 pixels defined on a detecting surface of the detecting device. The interconnections are made by N.sup.2 patterns of up to N.sup.2 interconnection weight encoded beams projected by N.sup.2 planar, or essentially two-dimensional, holograms arranged in a spatially localized array within the holographic component. The SLM modulates the encoded beams and directs them onto the detecting surface wherein a parameter of the beams is evaluated at each pixel thereof. The evaluated parameter is transformed according to a nonlinear threshold function to provide transformed signals which can be fed back to the SLM for further iterations.

    摘要翻译： 公开了一种用于模拟高度互连的神经网络的光学装置，包括空间光调制器（SLM），输入装置，激光，检测装置和面向页的全息成分。 输入设备将输入信号应用于SLM。 全息成分将定义在空间光调制器上的N2个像素光学地互连到在检测装置的检测表面上限定的N2个像素。 互连通过由N 2平面或基本上二维的全息图投影的多达N2个互连重量编码光束的N 2图案来制成，该全息图排列在全息组件内的空间定位阵列中。 SLM调制编码的光束并将其引导到检测表面上，其中在其每个像素处评估光束的参数。 评估参数根据非线性阈值函数进行变换，以提供可以反馈到SLM进行进一步迭代的变换信号。

    Neural processor with holographic optical paths and nonlinear operating means
    4.
    发明授权
    Neural processor with holographic optical paths and nonlinear operating means 失效
    具有全息光路和非线性运算装置的神经处理器

    公开(公告)号：US5004309A

    公开(公告)日：1991-04-02

    申请号：US365441

    申请日：1989-06-13

    申请人： H. John Caulfield ,  Charles F. Hester ,  Jason M. Kinser ,  Joseph Shamir

    发明人： H. John Caulfield ,  Charles F. Hester ,  Jason M. Kinser ,  Joseph Shamir

    IPC分类号： G06N3/067

    CPC分类号： G06N3/0675 ,  G06N3/067

    摘要： An optical apparatus for simulating a highly interconnected neural network is disclosed as including a spatial light modulator (SLM), an inputting device, a laser, a detecting device, and a page-oriented hologaphic component. The inputting device applies input signals to the SLM. The holographic component optically interconnects N.sup.2 pixels defined on the spatial light modulator to N.sup.2 pixels defined on a detecting surface of the detecting device. The interconnections are made by N.sup.2 patterns of up to N.sup.2 interconnection weight encoded beams projected by N.sup.2 planar, or essentially two-dimensional, holograms arranged in a spatially localized array within the holographic component. The SLM modulates the encoded beams and directs them onto the detecting surface wherein a parameter of the beams is evaluated at each pixel thereof. The evaluated parameter is transformed according to a nonlinear threshold function to provide transformed signals which can be fed back to the SLM for further iterations.

    摘要翻译： 公开了一种用于模拟高度互联的神经网络的光学装置，包括空间光调制器（SLM），输入装置，激光器，检测装置和面向页面的记录组件。 输入设备将输入信号应用于SLM。 全息成分将定义在空间光调制器上的N2个像素光学地互连到在检测装置的检测表面上限定的N2个像素。 互连通过由N 2平面或基本上二维的全息图投影的多达N2个互连重量编码光束的N 2图案来制成，该全息图排列在全息组件内的空间定位阵列中。 SLM调制编码的光束并将其引导到检测表面上，其中在其每个像素处评估光束的参数。 评估参数根据非线性阈值函数进行变换，以提供可以反馈到SLM进行进一步迭代的变换信号。

    High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor
    5.
    发明授权
    High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor 失效
    一种使用高斯分布分析的透明盘高速光学检测装置及其方法

    公开(公告)号：US06294793B1

    公开(公告)日：2001-09-25

    申请号：US07985631

    申请日：1992-12-03

    申请人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    发明人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    IPC分类号： G01H2188

    CPC分类号： G01N21/9506 ,  G01N21/8806

    摘要： An optical inspection apparatus operates at high speed at very high resolution for detecting defects in transparent disks in a production environment. These transparent disks are of the type commonly used as disk platters in hard disk drives. This apparatus uses a laser beam directed to a polygon scanner, which provides a linear scan of the beam along a radius of the disk. The disk to be inspected is rotated such that its entire surface passes the scan path of the laser beam. The laser beam, after passing through the unit to be inspected, is directed to a parallel detector array, which detects changes in the nominal Gaussian distribution of the laser beam that correspond to defects in the surface of the transparent disk above a programmable threshold level. This parallel detection method allows the inspection apparatus to identify defects much smaller than the diffraction limits of the optics used, and will accurately identify changes of the laser beam caused by defects in the disk. An automatic disk handler loads untested disks into the apparatus and unloads and sorts tested disks according to the results of the inspection.

    摘要翻译： 光学检查装置以高分辨率高速运行，用于检测生产环境中的透明盘中的缺陷。 这些透明磁盘通常用作硬盘驱动器中的磁盘盘片。 该装置使用指向多边形扫描器的激光束，其提供沿着盘的半径的光束的线性扫描。 要检查的盘旋转，使得其整个表面通过激光​​束的扫描路径。 激光束在通过要检查的单元之后被引导到并行检测器阵列，其检测对应于透明盘表面上的缺陷的激光束的标称高斯分布的变化高于可编程阈值水平。 这种并行检测方法允许检查装置识别远小于所使用的光学器件的衍射极限的缺陷，并且将准确地识别由光盘中的缺陷引起的激光束的变化。 自动磁盘处理器将未测试的磁盘加载到设备中，并根据检查结果卸载和排序测试磁盘。

    High speed optical inspection apparatus using Gaussian distribution analysis and method therefore
    6.
    发明授权
    High speed optical inspection apparatus using Gaussian distribution analysis and method therefore 失效
    因此，使用高斯分布分析和方法的高速光学检测装置

    公开(公告)号：US06252242B1

    公开(公告)日：2001-06-26

    申请号：US07985632

    申请日：1992-12-03

    申请人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    发明人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    IPC分类号： G01H2188

    CPC分类号： G01N21/9506

    摘要： An optical inspection apparatus operates at high speed at very high resolution for detecting defects in flat, polished media in a production environment. The configuration of the first embodiment is used to inspect transparent disks such as those used as disk platters in hard disk drives. The configuration of the second embodiment is used to inspect reflective disks. The configuration of the third embodiment is used to inspect transparent flat panels such as those commonly used in Liquid Crystal Display (LCD) panels. All embodiments use a laser providing a light beam directed to a polygon scanner, which provides a linear scan of the beam. The unit to be inspected is moved such that its entire surface passes the scan path of the light beam. The light beam, after contacting the unit to be inspected, is directed to a parallel detector array, which detects changes in the nominal Gaussian distribution of the light beam that correspond to defects above a programmable threshold level. This parallel detection method allows the inspection apparatus to identify defects much smaller than the diffraction limits of the optics used, and will accurately identify changes in the light beam caused by defects in the media. An automatic media handler loads untested units into the apparatus and unloads and sorts tested units according to the results of the inspection.

    摘要翻译： 光学检测装置在高分辨率下运行，用于检测生产环境中的平面抛光介质中的缺陷。 第一实施例的配置用于检查诸如在硬盘驱动器中用作盘片的透明盘。 第二实施例的结构用于检查反射盘。 第三实施例的结构用于检查诸如液晶显示（LCD）面板中常用的透明平板。 所有实施例都使用提供指向多边形扫描器的光束的激光器，其提供光束的线性扫描。 要检查的单元被移动，使得其整个表面通过光束的扫描路径。 光束在接触待检查单元之后被引导到并行检测器阵列，其检测对应于高于可编程阈值电平的缺陷的光束的标称高斯分布的变化。 这种并行检测方法允许检查装置识别远小于所使用的光学器件的衍射极限的缺陷，并且将准确地识别由介质中的缺陷引起的光束变化。 自动介质处理器将未测试的单元装载到设备中，并根据检查结果卸载并分类测试单元。

    High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor
    7.
    发明授权
    High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor 失效
    一种使用高斯分布分析的大型透明平板的高速光学检测装置及其方法

    公开(公告)号：US06255666B1

    公开(公告)日：2001-07-03

    申请号：US07985629

    申请日：1992-12-03

    申请人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    发明人： Andrei Brunfeld ,  Joseph Shamir ,  Gregory Toker ,  Liviu Singher ,  Ilan Laver ,  Ely Pekel

    IPC分类号： G01H2188

    CPC分类号： G01N21/958 ,  G01N21/8806

    摘要： An optical inspection apparatus operates at high speed at very high resolution for detecting defects in transparent flat panels in a production environment. This apparatus uses a laser which provides a light beam directed to a polygon scanner, which provides a linear scan of the beam along the width of the flat panel. The flat panel to be inspected is moved such that its entire surface passes the scan path of the light beam. The light beam passes through the transparent flat panel, and is reflected off a spherical mirror, back through the transparent flat panel, and returns to the scanning optics and the polygon scanner in a path coincident with the transmitted light beam. The reflected light beam is distinguished from the transmitted light beam by using a beam splitter to direct the reflected light beam to a parallel detector array, which detects changes in the nominal Gaussian distribution of the light beam that correspond to defects in the surface of the transparent flat panel above a programmable threshold level. This parallel detection method allows the inspection apparatus to identify defects much smaller than the diffraction limits of the optics used, and will accurately identify changes in the light beam caused by defects in the flat panel. An automatic flat panel handler loads untested flat panels into the apparatus and unloads and sorts tested flat panels according to the results of the inspection.

    摘要翻译： 光学检查装置在高分辨率下运行，用于检测生产环境中的透明平板中的缺陷。 该装置使用提供指向多边形扫描仪的光束的激光器，其提供沿着平板的宽度的光束的线性扫描。 待检查的平板被移动，使得其整个表面通过光束的扫描路径。 光束通过透明平板，并从球面镜反射回到透明平板上，并且在与透射光束一致的路径中返回到扫描光学器件和多边形扫描仪。 通过使用分束器将反射光束与透射光束区分开来，以将反射光束引导到并行检测器阵列，其检测对应于透明表面中的缺陷的光束的标称高斯分布的变化 平板以上可编程门限电平。 这种平行检测方法允许检查装置识别远小于所使用的光学器件的衍射极限的缺陷，并且将准确地识别由平板中的缺陷引起的光束变化。 自动平板处理器将未测试的平板加载到设备中，并根据检查结果卸载和分类测试的平板。

    Phase conjugate interferometer for measuring thin film properties
    8.
    发明授权
    Phase conjugate interferometer for measuring thin film properties 失效
    用于测量薄膜性能的相位共轭干涉仪

    公开(公告)号：US4979828A

    公开(公告)日：1990-12-25

    申请号：US435260

    申请日：1989-11-13

    申请人： Mark Cronin-Golomb ,  Joseph Shamir

    发明人： Mark Cronin-Golomb ,  Joseph Shamir

    IPC分类号： G01B9/02 ,  G01B11/06

    CPC分类号： G01B11/0675 ,  G01B2290/45

    摘要： An interferometric device for measuring optical thin film parameters such as refractive index, thickness and absorption uses phase conjugate mirrors in place of standard mirrors. The optical thin film for which the refractive index, thickness and absorption are determined acts as a beam-splitter in the interferometer.

    摘要翻译： 用于测量诸如折射率，厚度和吸收的光学薄膜参数的干涉测量装置使用相位共轭反射镜代替标准反射镜。 确定折射率，厚度和吸收的光学薄膜用作干涉仪中的分束器。

    Method for particle size and concentration measurement
    9.
    发明授权
    Method for particle size and concentration measurement 有权
    粒度和浓度测量方法

    公开(公告)号：US07746469B2

    公开(公告)日：2010-06-29

    申请号：US10563662

    申请日：2004-07-08

    申请人： Joseph Shamir ,  Nir Karasikov

    发明人： Joseph Shamir ,  Nir Karasikov

    IPC分类号： G01N21/00

    CPC分类号： G01N15/1459 ,  G01N2015/145 ,  G01N2015/1493

    摘要： The present invention provides a system and method of particle size and concentration measurement based on providing a focused, synthesized, non-Gaussian laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration. The particles are fluid borne, airborne, or on a surface and have a size ranging from sub-micron to thousands of microns. In an embodiment of the invention, the focused, synthesized, non-Gaussian laser beam is a dark beam. The measurements can be made using the duration of interaction with a scanning beam, including dark field.

    摘要翻译： 本发明提供了一种基于提供聚焦，合成的非高斯激光束的粒度和浓度测量的系统和方法，使得束与粒子相互作用，测量相互作用信号和每单位时间的相互作用次数 使用粒子的光束，并使用算法将相互作用信号映射到粒子大小和每单位时间的浓度相互作用次数。 颗粒是流体载体，空气传播的或在表面上，并且具有从亚微米到数千微米的尺寸。 在本发明的实施例中，聚焦的，合成的非高斯激光束是暗光束。 可以使用包括暗场的扫描光束的相互作用持续时间进行测量。