-
1.发明授权Scanning ion microscope with magnetic sector lens to purify the primary ion beam 失效扫描离子显微镜用磁性镜片净化主光束
公开(公告)号：US3517191A
公开(公告)日：1970-06-23
申请号：US3517191D
申请日：1965-10-11
Applicant: HELMUT J LIEBL
Inventor： LIEBL HELMUT J
IPC: G01Q10/00 , G01Q30/06 , H01J29/58 , H01J37/05 , H01J37/252 , H01J37/256 , H01J49/02 , H01J49/14 , H01J49/20 , H01J49/28 , H01J49/30 , H01J49/32 , G01N23/22 , H01J37/08 , H01J37/28
CPC classification number: H01J49/30 , H01J29/58 , H01J37/05 , H01J37/252 , H01J37/256 , H01J49/022 , H01J49/142 , H01J49/20 , H01J49/286 , H01J49/32 , H01J49/322
Search Results
1
records
(took 0.009 seconds)
筛选
AND
AND
过滤
NOT
NOT
Scan to Join
