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    Method for manufacturing SOI substrate
    1.
    发明授权
    Method for manufacturing SOI substrate 有权
    制造SOI衬底的方法

    公开(公告)号：US08383487B2

    公开(公告)日：2013-02-26

    申请号：US13198171

    申请日：2011-08-04

    申请人： Hideomi Suzawa ,  Shinya Sasagawa ,  Akihisa Shimomura ,  Junpei Momo ,  Motomu Kurata ,  Taiga Muraoka ,  Kosei Nei

    发明人： Hideomi Suzawa ,  Shinya Sasagawa ,  Akihisa Shimomura ,  Junpei Momo ,  Motomu Kurata ,  Taiga Muraoka ,  Kosei Nei

    IPC分类号： H01L21/76

    CPC分类号： H01L21/76254

    摘要： Forming an insulating film on a surface of the single crystal semiconductor substrate, forming a fragile region in the single crystal semiconductor substrate by irradiating the single crystal semiconductor substrate with an ion beam through the insulating film, forming a bonding layer over the insulating film, bonding a supporting substrate to the single crystal semiconductor substrate by interposing the bonding layer between the supporting substrate and the single crystal semiconductor substrate, dividing the single crystal semiconductor substrate at the fragile region to separate the single crystal semiconductor substrate into a single crystal semiconductor layer attached to the supporting substrate, performing first dry etching treatment on a part of the fragile region remaining on the single crystal semiconductor layer, performing second dry etching treatment on a surface of the single crystal semiconductor layer subjected to the first etching treatment, and irradiating the single crystal semiconductor layer with laser light.

    摘要翻译： 在单晶半导体基板的表面上形成绝缘膜，在单晶半导体基板中通过用离子束照射单晶半导体基板通过绝缘膜形成脆性区域，在绝缘膜上形成接合层， 通过将支撑基板和单晶半导体基板之间的接合层插入到单晶半导体基板的支撑基板上，将单晶半导体基板分割为脆性区域，将单晶半导体基板分离成单晶半导体层， 所述支撑基板对残留在所述单晶半导体层上的所述易碎区域的一部分进行第一干蚀刻处理，对经过所述第一蚀刻处理的所述单晶半导体层的表面进行第二干蚀刻处理， 具有激光的晶体半导体层。

    Method for manufacturing SOI substrate
    2.
    发明授权
    Method for manufacturing SOI substrate 有权
    制造SOI衬底的方法

    公开(公告)号：US08003483B2

    公开(公告)日：2011-08-23

    申请号：US12399047

    申请日：2009-03-06

    申请人： Hideomi Suzawa ,  Shinya Sasagawa ,  Akihisa Shimomura ,  Junpei Momo ,  Motomu Kurata ,  Taiga Muraoka ,  Kosei Nei

    发明人： Hideomi Suzawa ,  Shinya Sasagawa ,  Akihisa Shimomura ,  Junpei Momo ,  Motomu Kurata ,  Taiga Muraoka ,  Kosei Nei

    IPC分类号： H01L21/76

    CPC分类号： H01L21/76254

    摘要： Forming an insulating film on a surface of the single crystal semiconductor substrate, forming a fragile region in the single crystal semiconductor substrate by irradiating the single crystal semiconductor substrate with an ion beam through the insulating film, forming a bonding layer over the insulating film, bonding a supporting substrate to the single crystal semiconductor substrate by interposing the bonding layer between the supporting substrate and the single crystal semiconductor substrate, dividing the single crystal semiconductor substrate at the fragile region to separate the single crystal semiconductor substrate into a single crystal semiconductor layer attached to the supporting substrate, performing first dry etching treatment on a part of the fragile region remaining on the single crystal semiconductor layer, performing second dry etching treatment on a surface of the single crystal semiconductor layer subjected to the first etching treatment, and irradiating the single crystal semiconductor layer with laser light.

    摘要翻译： 在单晶半导体基板的表面上形成绝缘膜，在单晶半导体基板中通过用离子束照射单晶半导体基板通过绝缘膜形成脆性区域，在绝缘膜上形成接合层， 通过将支撑基板和单晶半导体基板之间的接合层插入到单晶半导体基板的支撑基板上，将单晶半导体基板分割为脆性区域，将单晶半导体基板分离成单晶半导体层， 所述支撑基板对残留在所述单晶半导体层上的所述脆性区域的一部分进行第一干蚀刻处理，对经过所述第一蚀刻处理的所述单晶半导体层的表面进行第二干蚀刻处理， 具有激光的晶体半导体层。

    Method for manufacturing semiconductor device
    4.
    发明授权
    Method for manufacturing semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号：US08741702B2

    公开(公告)日：2014-06-03

    申请号：US12582079

    申请日：2009-10-20

    申请人： Shunichi Ito ,  Miyuki Hosoba ,  Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka

    发明人： Shunichi Ito ,  Miyuki Hosoba ,  Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka

    IPC分类号： H01L21/00 ,  H01L21/84

    CPC分类号： H01L29/66969 ,  H01L27/1214 ,  H01L27/1225 ,  H01L27/1288 ,  H01L29/7869

    摘要： An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by dry etching in which an etching gas is used, and a second etching step is performed by wet etching in which an etchant is used.

    摘要翻译： 目的是以低成本，高生产率制造包括氧化物半导体的半导体器件，使得通过减少曝光掩模的数量来简化光刻工艺。 在制造包括通道蚀刻反交错薄膜晶体管的半导体器件的方法中，使用使用作为曝光的多色调掩模形成的掩模层来蚀刻氧化物半导体膜和导电膜 光透过该掩模以具有多个强度。 在蚀刻步骤中，通过使用蚀刻气体的干蚀刻进行第一蚀刻步骤，并且通过使用蚀刻剂的湿蚀刻进行第二蚀刻步骤。

    Oxide semiconductor device formed by using multi-tone mask
    5.
    发明授权
    Oxide semiconductor device formed by using multi-tone mask 有权
    通过使用多色调掩模形成的氧化物半导体器件

    公开(公告)号：US08686417B2

    公开(公告)日：2014-04-01

    申请号：US13555579

    申请日：2012-07-23

    申请人： Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka ,  Shunichi Ito ,  Miyuki Hosoba

    发明人： Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka ,  Shunichi Ito ,  Miyuki Hosoba

    IPC分类号： H01L29/26

    CPC分类号： H01L29/66969 ,  H01L27/1225 ,  H01L27/1288 ,  H01L29/66742 ,  H01L29/78621 ,  H01L29/7869

    摘要： An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by wet etching in which an etchant is used, and a second etching step is performed by dry etching in which an etching gas is used.

    摘要翻译： 目的是以低成本，高生产率制造包括氧化物半导体的半导体器件，使得通过减少曝光掩模的数量来简化光刻工艺。 在制造包括通道蚀刻反交错薄膜晶体管的半导体器件的方法中，使用使用作为曝光的多色调掩模形成的掩模层来蚀刻氧化物半导体膜和导电膜 光透过该掩模以具有多个强度。 在蚀刻步骤中，通过使用蚀刻剂的湿式蚀刻进行第一蚀刻步骤，并且通过使用蚀刻气体的干法蚀刻进行第二蚀刻步骤。

    METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
    8.
    发明申请
    METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 有权
    制造半导体器件的方法

    公开(公告)号：US20100102315A1

    公开(公告)日：2010-04-29

    申请号：US12582082

    申请日：2009-10-20

    申请人： Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka ,  Shunichi Ito ,  Miyuki Hosoba

    发明人： Hideomi Suzawa ,  Shinya Sasagawa ,  Taiga Muraoka ,  Shunichi Ito ,  Miyuki Hosoba

    IPC分类号： H01L29/786

    CPC分类号： H01L29/66969 ,  H01L27/1225 ,  H01L27/1288 ,  H01L29/66742 ,  H01L29/78621 ,  H01L29/7869

    摘要： An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by wet etching in which an etchant is used, and a second etching step is performed by dry etching in which an etching gas is used.

    摘要翻译： 目的是以低成本，高生产率制造包括氧化物半导体的半导体器件，使得通过减少曝光掩模的数量来简化光刻工艺。 在制造包括通道蚀刻反交错薄膜晶体管的半导体器件的方法中，使用使用作为曝光的多色调掩模形成的掩模层来蚀刻氧化物半导体膜和导电膜 光透过该掩模以具有多个强度。 在蚀刻步骤中，通过使用蚀刻剂的湿式蚀刻进行第一蚀刻步骤，并且通过使用蚀刻气体的干法蚀刻进行第二蚀刻步骤。

    Display device
    10.
    发明申请
    Display device 有权
    显示设备

    公开(公告)号：US20080042926A1

    公开(公告)日：2008-02-21

    申请号：US11806071

    申请日：2007-05-29

    申请人： Yuji Egi ,  Takeshi Nishi ,  Kiyofumi Ogino ,  Shinya Sasagawa ,  Motomu Kurata ,  Hideomi Suzawa

    发明人： Yuji Egi ,  Takeshi Nishi ,  Kiyofumi Ogino ,  Shinya Sasagawa ,  Motomu Kurata ,  Hideomi Suzawa

    IPC分类号： G09G3/34

    CPC分类号： G02B1/118 ,  C09K11/06 ,  C09K2211/1011 ,  C09K2211/1029 ,  C09K2211/185 ,  G02B1/14 ,  G02F1/133502 ,  H01J2211/442 ,  H01L27/3244 ,  H01L51/5281 ,  H05B33/22 ,  Y10T428/10

    摘要： The display device includes an anti-reflection film having a plurality of projections over a display screen surface and a protective layer filling a space between the projections. The number of times of incidence of external light entering the display device on the anti-reflection film is increased; therefore, the amount of external light transmitted through the anti-reflection film is increased. Thus, the amount of external light reflected to a viewer side is reduced, and the cause of a reduction in visibility such as reflection can be eliminated. Further, since the plurality of projections is covered with a protective layer, entry of dust can be prevented, and physical strength of the anti-reflection film can be increased.

    摘要翻译： 显示装置包括在显示屏表面上具有多个突起的防反射膜和填充突起之间的空间的保护层。 在抗反射膜上进入显示装置的外部光的入射次数增加; 因此，透过防反射膜的外部光量增加。 因此，反射到观察者侧的外部光量减少，并且可以消除诸如反射等可见性的降低的原因。 此外，由于多个突起被保护层覆盖，因此可以防止灰尘进入，并且可以提高抗反射膜的物理强度。