公开(公告)号：US20110014649A1

公开(公告)日：2011-01-20

申请号：US12296805

申请日：2007-07-26

申请人： Hiroko Tsutsumi ,  Hiroki Ishida ,  Hiromoto Hisada ,  Makiko Mizumoto ,  Yoji Hata ,  Nobutaka Fujii ,  Masao Matsuoka ,  Eiichi Kodama ,  Shinya Oishi

发明人： Hiroko Tsutsumi ,  Hiroki Ishida ,  Hiromoto Hisada ,  Makiko Mizumoto ,  Yoji Hata ,  Nobutaka Fujii ,  Masao Matsuoka ,  Eiichi Kodama ,  Shinya Oishi

IPC分类号： C12P21/06 ,  C12N9/26

CPC分类号： C07K14/005 ,  A61K38/00 ,  C12N2740/15022 ,  C12N2740/16122

摘要： The present invention relates to the production of an N36-binding peptide at low cost and in a large quantity utilizing a microorganism. More specifically, the present invention relates to a method for producing an N36-binding peptide comprising introducing a recombinant vector into which a DNA molecule encoding an N36-binding peptide that binds to an N36 protein derived from a retrovirus that causes immunodeficiency in a mammal has been incorporated into E. coli as a host to produce a transformant.

摘要翻译： 本发明涉及以低成本和大量利用微生物生产N36结合肽。 更具体地说，本发明涉及一种N36-结合肽的制造方法，其特征在于，包括引入重组载体，其中编码与衍生自引起哺乳动物免疫缺陷的逆转录病毒的N36蛋白结合的N36结合肽的DNA分子 作为宿主掺入大肠杆菌以产生转化体。

公开(公告)号：US06558920B1

公开(公告)日：2003-05-06

申请号：US09517529

申请日：2000-03-02

申请人： Yoji Hata ,  Hiroki Ishida ,  Hiromoto Hisada ,  Eiji Ichikawa ,  Akitsugu Kawato ,  Yasuhisa Abe ,  Koji Suginami ,  Satoshi Imayasu

发明人： Yoji Hata ,  Hiroki Ishida ,  Hiromoto Hisada ,  Eiji Ichikawa ,  Akitsugu Kawato ,  Yasuhisa Abe ,  Koji Suginami ,  Satoshi Imayasu

IPC分类号： C12N934

CPC分类号： C12N9/2428 ,  C12N15/80 ,  C12Y114/18001 ,  C12Y302/01003

摘要： According to the protein expression system in which a variety of desired useful proteins are highly produced by fusing a coding region of useful protein gene to the downstream of a promoter region of a tyrosinase-encoding gene (melO) of Aspergillus oryzae by a usual method of DNA manipulation, transferring a plasmid containing the resulting novel fusion gene into Aspergillus oryzae and incubating the thus-obtained transformant, various proteins can efficiently be produced at a high purity and in a high yield.

摘要翻译： 根据蛋白质表达系统，其中通过将有用的蛋白质基因的编码区融合到米曲霉的酪氨酸酶编码基因（melO）的启动子区域的下游，通过常规的方法 DNA操作，将含有得到的新型融合基因的质粒转移到米曲霉中并培养由此得到的转化体，可以以高纯度和高产率有效地生产各种蛋白质。

公开(公告)号：US08993255B2

公开(公告)日：2015-03-31

申请号：US13123052

申请日：2009-10-06

申请人： Rie Hirao ,  Masao Kitabayashi ,  Yoshiaki Nishiya ,  Hiroki Ishida ,  Yoji Hata

发明人： Rie Hirao ,  Masao Kitabayashi ,  Yoshiaki Nishiya ,  Hiroki Ishida ,  Yoji Hata

IPC分类号： C12Q1/00 ,  C12Q1/26 ,  C12N11/00 ,  C12N9/02 ,  G01N33/72 ,  C12N9/06

CPC分类号： G01N33/723 ,  C12N9/0022 ,  C12Q1/26

摘要： The present invention provides: a protein having a fructosyl amino acid oxidase activity which protein is useful for measurement of a glycosylated protein (particularly, glycosylated hemoglobin); a modified protein thereof; and use of the protein or the modified protein. The protein of the present invention is, for example, a fructosyl valyl histidine oxidase derived from Phaeosphaeria nodorum, the fructosyl valyl histidine oxidase having excellent thermal stability and substrate specificity and also having a small Km value to fructosyl valyl histidine. This allows a glycosylated protein measuring reagent to be stored in a long time and measurement accuracy of the glycosylated protein measuring reagent to be improved.

摘要翻译： 本发明提供：具有果糖基氨基酸氧化酶活性的蛋白质，该蛋白质可用于糖基化蛋白质（特别是糖基化血红蛋白）的测定。 其改性蛋白质; 并使用蛋白质或修饰的蛋白质。 本发明的蛋白质是例如来源于花粉球形的果糖基缬氨酰基组氨酸氧化酶，具有优异的热稳定性和底物特异性的果糖基缬氨酰基组氨酸氧化酶，并且对于果糖基缬氨酰基组氨酸也具有小的Km值。 这样可以长时间地存储糖基化蛋白质测定试剂，改善糖基化蛋白质测定试剂的测定精度。

公开(公告)号：US20110195444A1

公开(公告)日：2011-08-11

申请号：US13123052

申请日：2009-10-06

申请人： Rie Hirao ,  Masao Kitabayashi ,  Yoshiaki Nishiya ,  Hiroki Ishida ,  Yoji Hata

发明人： Rie Hirao ,  Masao Kitabayashi ,  Yoshiaki Nishiya ,  Hiroki Ishida ,  Yoji Hata

IPC分类号： C12Q1/26 ,  C12N9/02 ,  C07H21/00 ,  C12N15/85 ,  C12N5/10

CPC分类号： G01N33/723 ,  C12N9/0022 ,  C12Q1/26

摘要： The present invention provides: a protein having a fructosyl amino acid oxidase activity which protein is useful for measurement of a glycosylated protein (particularly, glycosylated hemoglobin); a modified protein thereof; and use of the protein or the modified protein. The protein of the present invention is, for example, a fructosyl valyl histidine oxidase derived from Phaeosphaeria nodorum, the fructosyl valyl histidine oxidase having excellent thermal stability and substrate specificity and also having a small Km value to fructosyl valyl histidine. This allows a glycosylated protein measuring reagent to be stored in a long time and measurement accuracy of the glycosylated protein measuring reagent to be improved.

摘要翻译： 本发明提供：具有果糖基氨基酸氧化酶活性的蛋白质，该蛋白质可用于糖基化蛋白质（特别是糖基化血红蛋白）的测定。 其改性蛋白质; 并使用蛋白质或修饰的蛋白质。 本发明的蛋白质是例如来源于花粉球形的果糖基缬氨酰基组氨酸氧化酶，具有优异的热稳定性和底物特异性的果糖基缬氨酰基组氨酸氧化酶，并且对于果糖基缬氨酰基组氨酸也具有小的Km值。 这样可以长时间地存储糖基化蛋白质测定试剂，改善糖基化蛋白质测定试剂的测定精度。

公开(公告)号：US20090178209A1

公开(公告)日：2009-07-16

申请号：US11721017

申请日：2005-12-06

申请人： Kenzo Koike ,  Yoshinori Saito ,  Hiroshi Obata ,  Yukihiro Nakamura ,  Yoji Hata

发明人： Kenzo Koike ,  Yoshinori Saito ,  Hiroshi Obata ,  Yukihiro Nakamura ,  Yoji Hata

IPC分类号： A61K8/49 ,  A61Q5/10 ,  A61K8/99

CPC分类号： A61K8/44 ,  A61K8/99 ,  A61Q5/10

摘要： An air-oxidative type hair dye composition containing a melanin precursor prepared by a process including (A) an oxidation step for converting, into the melanin precursor, a tyrosine or derivative thereof used as a starting substance with an enzyme or cell that is derived from a fungus selected from the group consisting of fungi belonging to the genera Aspergillus, Neurospora, Rhizomucor, Trichoderma, and Penicillium and that exhibits a catechol oxidase activity.

摘要翻译： 一种含有黑色素前体的空气氧化型染发剂组合物，其通过以下方法制备，该方法包括：（A）氧化步骤，用于将用作起始物质的酪氨酸或其衍生物转化成黑色素前体，所述酶或衍生物衍生自 选自属于曲霉属，神经孢子菌属，根霉属，木霉属和青霉属的真菌的真菌，其显示儿茶酚氧化酶活性。

公开(公告)号：US07074526B2

公开(公告)日：2006-07-11

申请号：US10456667

申请日：2003-06-05

申请人： Yoji Hata

发明人： Yoji Hata

IPC分类号： G03F9/00

CPC分类号： G03F1/48 ,  G03F1/40

摘要： A photomask by which no electrostatic damage or damage of a mask pattern due to electrification is produced. The photomask has a substrate; mask patterns formed on the substrate, which are made of a light blocking material and are covered with a light-transmissive and electrically conductive polymer material. Even the mask patterns which are isolated from each other on the substrate are electrically conductive with each other. Typically, the mask patterns are covered with an electrically conductive film made of the light-transmissive and electrically conductive polymer material. The electrically conductive film may have a thickness by which when foreign particles land on the electrically conductive film, an optical image of the foreign particles is defocused on a sample to be exposed in the exposure process, so that shapes of the foreign particles are not transferred. In this case, a pellicle, which is conventionally provided on the substrate, is unnecessary.

摘要翻译： 不产生静电损伤或由于带电导致的掩模图案损坏的光掩模。 光掩模具有基板; 形成在基板上的掩模图案，其由遮光材料制成并且被透光和导电的聚合物材料覆盖。 即使在基板上彼此隔离的掩模图案彼此导电。 通常，掩模图案被由透光和导电聚合物材料制成的导电膜覆盖。 导电膜可以具有当外来颗粒落在导电膜上时的厚度，外来颗粒的光学图像在曝光过程中在要暴露的样品上散焦，使得外来颗粒的形状不被转印 。 在这种情况下，通常设置在基板上的防护薄膜组件是不必要的。

公开(公告)号：US20070007988A1

公开(公告)日：2007-01-11

申请号：US11517046

申请日：2006-09-07

申请人： Yoji Hata

发明人： Yoji Hata

IPC分类号： G01R31/26

CPC分类号： H01L22/20 ,  G01R31/2894 ,  G06T7/0004 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention provides an LSI inspection method and a defect inspection data analysis apparatus capable of shortening a time needed for a wafer test. In a first database 11 is stored inspection data obtained when each defect inspection apparatus 20 inspects a wafer for defects in the front-end process. In a second database 12 are stored non-conforming article judgment criteria for each predetermined type of defect, according to which a non-conforming chip is judged. A defective chip identifying portion 16 identifies a chip having a defect and identifies the type of defect for each defect that the identified chip has, on the basis of the inspection data. For each identified chip, a non-conforming chip judging portion 17 judges whether the chip is a non-conforming article or not according to the non-conforming article judgment criteria corresponding to the type of defect for each defect, and obtains position information within the wafer surface of a chip judged as being a non-conforming article. The position information thus obtained is transmitted to an LSI inspection apparatus 30 via a transmission portion 15.

摘要翻译： 本发明提供能够缩短晶圆试验所需时间的LSI检查方法和缺陷检查数据分析装置。 在第一数据库11中存储当每个缺陷检查装置20检查晶片在前端处理中的缺陷时获得的检查数据。 对于每个预定类型的缺陷，在第二数据库12中存储不符合条件的判断标准，根据该缺陷来判断不合格的芯片。 有缺陷的芯片识别部分16基于检查数据识别具有缺陷的芯片，并且识别所识别的芯片具有的每个缺陷的缺陷的类型。 对于每个识别的芯片，不合格芯片判断部分17根据与每个缺陷的缺陷类型相对应的不符合条件的判断标准来判断芯片是否是不合格的物品，并且获得 芯片的晶片表面被判断为不合格的物品。 这样获得的位置信息经由传输部分15被发送到LSI检查装置30。

公开(公告)号：US07123041B2

公开(公告)日：2006-10-17

申请号：US10809322

申请日：2004-03-26

申请人： Yoji Hata

发明人： Yoji Hata

IPC分类号： G01R31/26

CPC分类号： H01L22/20 ,  G01R31/2894 ,  G06T7/0004 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention provides an LSI inspection method and a defect inspection data analysis apparatus capable of shortening a time needed for a wafer test. In a first database 11 is stored inspection data obtained when each defect inspection apparatus 20 inspects a wafer for defects in the front-end process. In a second database 12 are stored non-conforming article judgment criteria for each predetermined type of defect, according to which a non-conforming chip is judged. A defective chip identifying portion 16 identifies a chip having a defect and identifies the type of defect for each defect that the identified chip has, on the basis of the inspection data. For each identified chip, a non-conforming chip judging portion 17 judges whether the chip is a non-conforming article or not according to the non-conforming article judgment criteria corresponding to the type of defect for each defect, and obtains position information within the wafer surface of a chip judged as being a non-conforming article. The position information thus obtained is transmitted to an LSI inspection apparatus 30 via a transmission portion 15.

摘要翻译： 本发明提供能够缩短晶圆试验所需时间的LSI检查方法和缺陷检查数据分析装置。 在第一数据库11中存储当每个缺陷检查装置20检查晶片在前端处理中的缺陷时获得的检查数据。 对于每个预定类型的缺陷，在第二数据库12中存储不符合条件的判断标准，根据该缺陷来判断不合格的芯片。 有缺陷的芯片识别部分16基于检查数据识别具有缺陷的芯片，并且识别所识别的芯片具有的每个缺陷的缺陷的类型。 对于每个识别的芯片，不合格芯片判断部分17根据与每个缺陷的缺陷类型相对应的不符合条件的判断标准来判断芯片是否是不合格的物品，并且获得 芯片的晶片表面被判断为不合格的物品。 这样获得的位置信息经由传输部分15被发送到LSI检查装置30。

公开(公告)号：US20080113899A1

公开(公告)日：2008-05-15

申请号：US10585879

申请日：2005-01-13

申请人： Sachiko Suzuki ,  Katsuharu Fukuda ,  Motoko Irie ,  Yoji Hata ,  Akitsugu Kawato ,  Yasuhisa Abe

发明人： Sachiko Suzuki ,  Katsuharu Fukuda ,  Motoko Irie ,  Yoji Hata ,  Akitsugu Kawato ,  Yasuhisa Abe

IPC分类号： A61K38/12 ,  C07K7/64 ,  A61P7/06 ,  C07F15/02

CPC分类号： A61K33/26 ,  A23L33/16 ,  A61K45/06

摘要： The present inventors have found that a siderophore-iron (III) ion chelate complex is highly absorbed in the body; significantly increases the blood hemoglobin concentration, the serum iron concentration and the concentration of iron stored in the liver; and causes no adverse effects on the body. On the basis of these findings, the present inventors provide iron supplementing agents, agents for the prevention or treatment of iron defeciency anemia, food additives and food compositions, each of which contains a siderophore and iron (III) ions, preferably in the form of a chelate complex.

摘要翻译： 本发明人已经发现铁载体 - 铁（III）离子螯合物在体内被高度吸收; 显着增加血液中血红蛋白浓度，血清铁浓度和肝脏中储存的铁浓度; 对身体没有不良影响。 基于这些发现，本发明人提供铁补充剂，预防或治疗铁缺乏症贫血的药剂，食品添加剂和食品组合物，其中每一种都含有铁载体和铁（III）离子，优选为 螯合物。

公开(公告)号：US6144080A

公开(公告)日：2000-11-07

申请号：US639750

申请日：1996-04-29

申请人： Toshio Wada ,  Yoji Hata

发明人： Toshio Wada ,  Yoji Hata

IPC分类号： H01L21/76 ,  H01L21/765 ,  H01L21/8242 ,  H01L27/092 ,  H01L27/108 ,  H01L29/76 ,  H01L29/94 ,  H01L31/062 ,  H01L31/113

CPC分类号： H01L27/0925 ,  H01L21/765

摘要： A semiconductor integrated circuit has P-channel active MOSFETs and N-channel active MOSFETs formed in a semiconductor substrate. In order to electrically isolate the active MOSFETs, the semiconductor integrated circuit has P-channel field shield MOS devices and N-channel field shield MOS devices. The P-channel field shield MOS devices have field shield electrodes which are laid on regions between impurity diffusion regions of the P-channel active MOSFETs. The N-channel field shield MOS devices have field shield electrodes which are laid on regions between impurity diffusion regions of N-channel active MOSFETs. A P-channel field shield voltage, which is higher than a power supply voltage of the semiconductor integrated circuit, is supplied to the field shield electrodes of the P-channel field shield MOS device to turn the P-channel field shield MOS devices to an OFF-state to electrically isolate the P-channel active MOSFETs. An N-channel field shield voltage, which is lower than a ground level of the semiconductor integrated circuit, is supplied to the field shield electrodes of the N-channel field shield MOS devices to turn the N-channel field shield MOS devices to an OFF-state to electrically isolate the N-channel active MOSFETs.

摘要翻译： 半导体集成电路具有形成在半导体衬底中的P沟道有源MOSFET和N沟道有源MOSFET。 为了电气隔离有源MOSFET，半导体集成电路具有P沟道场屏蔽MOS器件和N沟道场屏蔽MOS器件。 P沟道场屏蔽MOS器件具有放电在P沟道有源MOSFET的杂质扩散区域之间的场屏蔽电极。 N沟道场屏蔽MOS器件具有放电在N沟道有源MOSFET的杂质扩散区域之间的场屏蔽电极。 将高于半导体集成电路的电源电压的P沟道场屏蔽电压提供给P沟道场屏蔽MOS器件的场屏蔽电极，以将P沟道场屏蔽MOS器件转换为 OFF状态以电隔离P沟道有源MOSFET。 将低于半导体集成电路的接地电平的N沟道场屏蔽电压提供给N沟道场屏蔽MOS器件的场屏蔽电极，以将N沟道场屏蔽MOS器件转为OFF 状态以电隔离N沟道有源MOSFET。