ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20250087547A1

    公开(公告)日:2025-03-13

    申请号:US18810891

    申请日:2024-08-21

    Abstract: An electronic device is provided, including a chip unit, a heat dissipation film, an encapsulation layer, a through hole, and a circuit structure. The chip unit has a first side and a second side opposite to the first side. The heat dissipation film is disposed on the first side. The encapsulation layer surrounds the chip unit and the heat dissipation film. The through hole penetrates the encapsulation layer, and has a first position and a second position. The circuit structure is disposed on the second side. The through hole is electrically connected to the chip unit through the circuit structure. The first position is connected to the circuit structure, and the second position is farther away from the circuit structure than the first position. The first position has a first width, the second position has a second width, and the first width is greater than the second width.

    ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20240404904A1

    公开(公告)日:2024-12-05

    申请号:US18655448

    申请日:2024-05-06

    Abstract: An electronic device includes an electronic component including a chip and a protective layer disposed on the active surface of the chip; an encapsulation layer surrounding the electronic component; and a circuit structure contacting the first surface of the encapsulation layer and electrically connecting the electronic component. The protective layer has a second surface away from the active surface, and a first step difference between the first surface and the second surface is between 1 and 10 μm.

    INSPECTION METHOD FOR ELECTRONIC DEVICES

    公开(公告)号:US20240377338A1

    公开(公告)日:2024-11-14

    申请号:US18630370

    申请日:2024-04-09

    Abstract: An inspection method for electronic devices includes the steps of: providing an object under test; inspecting the object under test through an inspection system having an optical apparatus, including the steps of: using the optical apparatus to provide a first inspection light to inspect a first position of the object under test, and then receiving a first reflection light for being recorded in a controller; moving the optical apparatus; and using the optical apparatus to provide a second inspection light to inspect the first position of the object under test, and then receiving a second reflection light for being recorded in the controller; and determining whether there is an abnormality through the first reflection light and the second reflection light.

    ELECTRONIC DEVICE AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20250014956A1

    公开(公告)日:2025-01-09

    申请号:US18741160

    申请日:2024-06-12

    Abstract: An electronic device includes an electronic unit having a first side and a second side; an encapsulation layer surrounding the electronic unit and having a plurality of openings exposing the second side of the electronic unit; a first circuit structure disposed on the first side of the electronic unit and electrically connected to the electronic unit; a second circuit structure disposed on the second side of the electronic unit; a via penetrating the encapsulation layer and electrically connecting the first circuit structure to the second circuit structure; and a heat dissipation layer disposed on the second side of the electronic unit, wherein the heat dissipation layer contacts the electronic unit through the plurality of openings.

    ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20240404831A1

    公开(公告)日:2024-12-05

    申请号:US18655360

    申请日:2024-05-06

    Abstract: An electronic device includes a chip, a protection, a molding layer and a redistribution structure layer. The chip has an active surface and a first side surface connected to the active surface. The protection layer is disposed on the active surface of the chip and has a second side surface. The molding layer surrounds the chip and the protection layer. The redistribution structure layer is disposed on the molding layer, on the protection layer and electrically connected to the chip. The roughness of the first side surface is different from the roughness of the second side surface.

    CIRCUIT STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF ELECTRONIC DEVICE

    公开(公告)号:US20240361353A1

    公开(公告)日:2024-10-31

    申请号:US18613424

    申请日:2024-03-22

    CPC classification number: G01R1/07328 G01R3/00

    Abstract: A circuit structure, an electronic device, and a manufacturing method of the electronic device are provided. The circuit structure includes a support layer, a base layer, and a circuit layer. The base layer is disposed on the support layer. The circuit layer is disposed on the base layer and includes a first conductive layer, a first insulating layer, and a second conductive layer. The first conductive layer is disposed on the base layer. The first insulating layer is disposed on the first conductive layer. The second conductive layer is disposed on the first insulating layer. The elongation of the support layer is smaller than the elongation of the base layer.

    ELECTRONIC DEVICE
    9.
    发明公开
    ELECTRONIC DEVICE 审中-公开

    公开(公告)号:US20240241455A1

    公开(公告)日:2024-07-18

    申请号:US18540809

    申请日:2023-12-14

    CPC classification number: G03F9/7076 G03F1/44 G03F1/48 G03F7/70683 G03F7/7085

    Abstract: The electronic device of the present disclosure includes a redistribution structure, chip units, and a protective layer. The redistribution structure includes alignment marks. The chip units are electrically connected to the redistribution structure, and include a first chip unit and a second chip unit. The protective layer surrounds the first chip unit and the second chip unit. The chip units and the alignment marks are arranged along a direction. The first chip unit is disposed between the first alignment mark and the third alignment mark, and the second chip unit is disposed between the second alignment mark and the fourth alignment mark. The second alignment mark and the third alignment mark are disposed between the first chip unit and the second chip unit. The number of the alignment marks is greater than the number of the chip units.

    ELECTRONIC DEVICE AND RELATED TILED ELECTRONIC DEVICE

    公开(公告)号:US20240102853A1

    公开(公告)日:2024-03-28

    申请号:US17980562

    申请日:2022-11-04

    CPC classification number: G01J1/0437 G01J1/0411

    Abstract: An electronic device and a related tiled electronic device are disclosed. The electronic device includes a protective layer, a circuit structure, a sensing element and a control unit. The circuit structure is disposed on the protective layer and surrounds the sensing element. The control unit is disposed between the circuit structure and the protective layer and electrically connected to the sensing element. The protective layer surrounds the control unit and contacts a surface of the circuit structure.

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