公开(公告)号：US20060070936A1

公开(公告)日：2006-04-06

申请号：US10545799

申请日：2003-07-03

申请人： Isao Kato ,  Hideo Kashima ,  Takaaki Suga ,  Toshiya Chiku

发明人： Isao Kato ,  Hideo Kashima ,  Takaaki Suga ,  Toshiya Chiku

IPC分类号： C02F1/00

CPC分类号： C02F9/005 ,  B01F1/0027 ,  C02F1/444 ,  C02F1/4674 ,  C02F1/68 ,  C02F1/688 ,  C02F2209/40 ,  C02F2301/043 ,  E03B7/074

摘要： A mineral-water supplying apparatus includes: a mineral-water producing apparatus for producing mineral water by passing raw water, such as city water, through a mineral eluting material(s); a drink conveying pipe for conveying the mineral water produced in the mineral-water producing apparatus to a drinking water spout; a cleaning water pipe diverging from the drink conveying pipe for conveying mineral water to a nozzle; a pump for forcing the mineral water produced in the mineral-water producing apparatus to flow through the drink conveying pipe and the cleaning water pipe; and a chlorine generator for increasing the concentration of chlorine in the mineral water produced in the mineral-water producing apparatus. This allows chlorine to be added to the resulting mineral water and increases the concentration of chlorine in the mineral water.

摘要翻译： 矿泉水供给装置包括：矿泉水生产装置，其通过使原水（如自来水）通过矿物洗脱物质生产矿泉水; 用于将在矿泉水生产设备中产生的矿泉水输送到饮用水喷口的饮料输送管; 从用于将矿泉水输送到喷嘴的饮料输送管发散的清洁水管; 用于迫使在矿泉水生产设备中产生的矿泉水流过饮料输送管和清洁水管的泵; 以及用于增加在矿泉水生产设备中产生的矿泉水中的氯浓度的氯发生器。 这样可以将氯添加到所得到的矿泉水中并增加矿泉水中的氯浓度。

公开(公告)号：US09040905B2

公开(公告)日：2015-05-26

申请号：US13884755

申请日：2011-11-08

申请人： Hisashi Nagano ,  Yasutaka Suzuki ,  Hideo Kashima ,  Yuichiro Hashimoto ,  Masuyuki Sugiyama ,  Masakazu Sugaya ,  Yasunori Doi ,  Koichi Terada

发明人： Hisashi Nagano ,  Yasutaka Suzuki ,  Hideo Kashima ,  Yuichiro Hashimoto ,  Masuyuki Sugiyama ,  Masakazu Sugaya ,  Yasunori Doi ,  Koichi Terada

IPC分类号： H01J49/04 ,  G01N1/22 ,  G01N1/02 ,  H01J49/00 ,  G01N33/00

CPC分类号： H01J49/0422 ,  G01N1/2211 ,  G01N1/2214 ,  G01N33/0057 ,  G01N2001/028 ,  H01J49/00 ,  H01J49/0036 ,  H01J49/04 ,  H01J49/0459 ,  H01J49/0468 ,  Y02A50/25

摘要： Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate.

公开(公告)号：US20120289370A1

公开(公告)日：2012-11-15

申请号：US13393016

申请日：2009-09-03

申请人： Teruhide Yamanishi ,  Hirokazu Komuro ,  Ryuji Tsuchiya ,  Nobutaka Horii ,  Hideo Kashima

发明人： Teruhide Yamanishi ,  Hirokazu Komuro ,  Ryuji Tsuchiya ,  Nobutaka Horii ,  Hideo Kashima

IPC分类号： F16H57/04

CPC分类号： F16H57/0489 ,  B60K11/08 ,  B60K17/08 ,  B60Y2200/12 ,  B60Y2200/126 ,  F16H57/035 ,  F16H57/0416 ,  F16H2057/0203 ,  F16H2057/02065

摘要： Disclosed is a cooling air intake structure for a V-belt drive continuously variable transmission, which is disposed beside the rear wheel of a small vehicle and which does not permit muddy water and dust to enter therein. A cooling air inlet through which cooling air is taken in is formed at a position beside a transmission case and above a cooling fan side opening formed in the transmission case opposite to a drive pulley. A cooling air passage extending from the cooling air inlet to the side opening is formed so as to surround the side opening. Cooling air taken in through the cooling air inlet is guided so as to flow upward first and then flows downward along a U-shaped cooling air passage to the side opening of the transmission case beside the cooling fan.

摘要翻译： 公开了一种用于V型皮带驱动无级变速器的冷却空气进气结构，其设置在小型车辆的后轮旁边，并且不允许泥水和灰尘进入其中。 在变速器壳体旁边的位置形成有与驱动带轮相对的变速器壳体上形成的冷却风扇侧开口的上方形成有冷却空气的冷却空气入口。 形成从冷却空气入口向侧面开口延伸的冷却风路，以便包围侧面开口。 通过冷却空气入口吸入的冷却空气被引导以首先向上流动，然后沿着U形的冷却空气通道向下流动到冷却风扇旁边的变速箱的侧开口。

公开(公告)号：US07897936B2

公开(公告)日：2011-03-01

申请号：US11822386

申请日：2007-07-05

申请人： Hiroyasu Shichi ,  Tohru Ishitani ,  Hidemi Koike ,  Kaoru Umemura ,  Eiichi Seya ,  Mitsuo Tokuda ,  Satoshi Tomimatsu ,  Hideo Kashima ,  Muneyuki Fukuda

发明人： Hiroyasu Shichi ,  Tohru Ishitani ,  Hidemi Koike ,  Kaoru Umemura ,  Eiichi Seya ,  Mitsuo Tokuda ,  Satoshi Tomimatsu ,  Hideo Kashima ,  Muneyuki Fukuda

IPC分类号： G21K1/00

CPC分类号： G01N23/20 ,  B23K15/0006 ,  B23K15/0013 ,  G01N1/286 ,  H01J2237/3114 ,  H01J2237/31745

摘要： A sample fabricating method of irradiating a sample with a focused ion beam at an incident angle less than 90 degrees with respect to the surface of the sample, eliminating the peripheral area of a micro sample as a target, turning a specimen stage around a line segment perpendicular to the sample surface as a turn axis, irradiating the sample with the focused ion beam while the incident angle on the sample surface is fixed, and separating the micro sample or preparing the micro sample to be separated. A sample fabricating apparatus for forming a sample section in a sample held on a specimen stage by scanning and deflecting an ion beam, wherein an angle between an optical axis of the ion beam and the surface of the specimen stage is fixed and formation of a sample section is controlled by turning the specimen stage.

摘要翻译： 相对于样品表面以小于90度的入射角照射具有聚焦离子束的样品的样品制造方法，消除作为目标的微量样品的周边区域，将样品台围绕线段 垂直于样品表面作为转动轴线，同时在样品表面上的入射角被固定的同时用聚焦离子束照射样品，并分离微量样品或制备待分离的微量样品。 一种样品制造装置，用于通过扫描和偏转离子束来形成保持在样品台上的样品中的样品部分，其中离子束的光轴与样品台的表面之间的角度被固定并形成样品 通过转动样品台来控制切片。

公开(公告)号：US07888639B2

公开(公告)日：2011-02-15

申请号：US11980654

申请日：2007-10-31

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： G01N23/00

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

摘要翻译： 本发明的目的是实现一种用于处理和观察微分样品的方法和装置，其能够以高分辨率，高精度和高产量在水平和垂直方向观察晶片的截面而不分裂任何作为样品的晶片 。 在本发明的装置中，在一个真空容器中包括聚焦离子束光学系统和电子光学系统，并且通过用带电粒子束的成形处理分离包含样品的所需区域的微小样品，并且在那里 被包括用于提取分离的微小样本的操纵器和用于独立于晶片样品台驱动操纵器的操纵器控制器。

公开(公告)号：US07205554B2

公开(公告)日：2007-04-17

申请号：US11127213

申请日：2005-05-12

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： H01J37/256 ,  G21N23/225

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

公开(公告)号：US06927391B2

公开(公告)日：2005-08-09

申请号：US10878528

申请日：2004-06-29

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： G01N1/32 ,  G01N1/28 ,  G01N23/225 ,  G01Q10/00 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q30/16 ,  G01Q30/20 ,  H01J37/20 ,  H01J37/256 ,  H01J37/28 ,  H01J37/30 ,  H01J37/305 ,  H01J37/317 ,  H01L21/66 ,  H04L29/06 ,  H04L29/08

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

摘要翻译： 本发明的目的是实现一种用于处理和观察微分样品的方法和装置，其能够以高分辨率，高精度和高产量在水平和垂直方向观察晶片的截面而不分裂任何作为样品的晶片 。 在本发明的装置中，在一个真空容器中包括聚焦离子束光学系统和电子光学系统，并且通过用带电粒子束的成形处理分离包含样品的所需区域的微小样品，并且在那里 被包括用于提取分离的微小样本的操纵器和用于独立于晶片样品台驱动操纵器的操纵器控制器。

公开(公告)号：US20140151543A1

公开(公告)日：2014-06-05

申请号：US13884755

申请日：2011-11-08

申请人： Hisashi Nagano ,  Yasutaka Suzuki ,  Hideo Kashima ,  Yuichiro Hashimoto ,  Masuyuki Sugiyama ,  Masakazu Sugaya ,  Yasunori Doi ,  Koichi Terada

发明人： Hisashi Nagano ,  Yasutaka Suzuki ,  Hideo Kashima ,  Yuichiro Hashimoto ,  Masuyuki Sugiyama ,  Masakazu Sugaya ,  Yasunori Doi ,  Koichi Terada

IPC分类号： H01J49/00 ,  H01J49/04

CPC分类号： H01J49/0422 ,  G01N1/2211 ,  G01N1/2214 ,  G01N33/0057 ,  G01N2001/028 ,  H01J49/00 ,  H01J49/0036 ,  H01J49/04 ,  H01J49/0459 ,  H01J49/0468 ,  Y02A50/25

摘要： Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate.

摘要翻译： 提供了一种在连续收集和冷凝颗粒时实时分析颗粒的技术。 作为检测对象物质的作为检测对象物质的气体和/或颗粒被从吹扫区域5的空气流除去。将取出的样品抽吸并在采样区域10被冷凝并取样，并且样品的离子 在离子源21处产生，然后在质量分析区域23进行质量分析。对获得的质谱进行测定，确定是否存在从检测目标物质得到的质谱，以及监测器27 显示其结果。 因此，可以实时，及时且误码率较小的连续检测附着于认证对象2的检测对象物质。

公开(公告)号：US08618520B2

公开(公告)日：2013-12-31

申请号：US13547942

申请日：2012-07-12

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： G21K5/00

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

公开(公告)号：US08217339B2

公开(公告)日：2012-07-10

申请号：US11908516

申请日：2005-03-14

申请人： Hideo Kashima ,  Yasuaki Takada ,  Izumi Waki

发明人： Hideo Kashima ,  Yasuaki Takada ,  Izumi Waki

IPC分类号： H01J49/26 ,  G01N30/72

CPC分类号： G01N1/2205 ,  G01N1/4022 ,  G01N2001/028 ,  G01N2001/4027

摘要： A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment (1) is characterized in that the equipment comprises a collecting section (5) for collecting a sample material peeled off from an inspection object (25) whereupon the sample material is adhered by blowing compression gas through a capturing filter (52), and an inspecting section (2) for analyzing the sample material captured by the capturing filter (52), and further characterized in that the inspection equipment comprises a section (3) for delivering a baggage to the inspecting section (2), and a carrying section (4) for carrying the capturing filter (52) from the capturing section (5) to the inspecting section (2).

摘要翻译： 一种用于以高速率收集附着在行李上的颗粒物质而不接触物质并检查是否将危险的或具体的样品材料粘附在行李上的技术。 还提供了一种用于简化或自动化这种检查的方法。 附着物检查设备（1）的特征在于，该设备包括：收集部分（5），用于收集从检查对象（25）剥离的样品材料，然后通过吹扫压缩气体通过捕获过滤器（ 52）和用于分析由捕获过滤器（52）捕获的样品材料的检查部（2），其特征还在于，所述检查设备包括用于将行李传送到检查部（2）的部分（3） 以及用于将捕获过滤器（52）从捕获部分（5）运送到检查部分（2）的运送部分（4）。