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公开(公告)号：US11696396B2
公开(公告)日：2023-07-04
申请号：US17585363
申请日：2022-01-26
Applicant: JF MICROTECHNOLOGY SDN. BHD
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee , Grace Ann Nee Yee
IPC: H05K1/02
CPC classification number: H05K1/0296 , H05K1/0268 , H05K1/0283 , H05K2201/1078 , H05K2201/1084 , H05K2201/10704 , H05K2201/10795
Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.
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公开(公告)号：US10826217B2
公开(公告)日：2020-11-03
申请号：US16287834
申请日：2019-02-27
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee , Muhamad Izzat bin Roslee
IPC: H01R13/11 , G01R31/28 , H01R13/405 , H01R13/42 , H01R13/426
Abstract: An electrical contact assembly having a pair of contacts mirroring each other, each contact coupled with an elastomer positioned in a recess formed near a lower end of the contact. Each elastomer has a cylindrical shape with the axis of the cylinder running in a front to rear direction. Each elastomer is secured at its front and rear ends by a lower cavity formed within a housing. The contacts are able to rock sideways around their lower ends between uncompressed and compressed states.
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公开(公告)号：US10527646B2
公开(公告)日：2020-01-07
申请号：US15438721
申请日：2017-02-21
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee
IPC: G01R1/04 , H01L21/66 , H01L23/522 , H01L23/528
Abstract: An electrical contact assembly comprised of four identical modules arranged in a four-sided formation. Each module comprises of a bottom housing formed with two rows of through holes to allow a row of front and back contact pairs to be inserted, with separators in between each pair to prevent electrical conductance between the pairs. A top housing is then lowered onto the top of these contact pairs. With the aid of a key tool, the rows of contact pairs are inserted into through holes in the top housing. By virtue of different heights between the front and back rows of through holes, the front and back contact rows are inserted one first, and then the other. This allows for easier installation of an assembly with minimal tolerance accumulation.
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公开(公告)号：US20140127953A1
公开(公告)日：2014-05-08
申请号：US14122219
申请日：2011-05-27
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee
IPC: H01R13/24
CPC classification number: G01R1/0466 , G01R1/0483 , H01R13/24 , H01R13/2407
Abstract: An electrical test contact electrically connects a test terminal of an Integrated Circuit (IC) test assembly with an IC terminal of an IC device in an electrical interconnect assembly. The test contact is formed of electrically conductive material and includes a head portion and a foot portion. The head portion includes a first electrical contacting portion for electrically engaging an IC terminal of an IC device during use, and the foot portion includes a second electrical contacting portion for electrically engaging a test terminal of a test assembly during use. The head portion includes a head receiving portion that receives a first resiliently biasing member to retain the first resiliently biasing member in contact with the test contact. The first resiliently biasing member biases the first electrical contacting portion against the IC terminal of the IC device during use. An electrical interconnect assembly having multiple test contacts is also disclosed.
Abstract translation: 电气测试接点将集成电路（IC）测试组件的测试端子与电气互连组件中的IC器件的IC端子电连接。 测试触点由导电材料形成，并包括头部和脚部。 头部包括用于在使用期间电IC接合IC器件的IC端子的第一电接触部分，并且脚部部分包括用于在使用期间电连接测试组件的测试端子的第二电接触部分。 头部包括头部接收部分，其接收第一弹性偏置构件以将第一弹性偏置构件保持为与测试接触部接触。 第一弹性偏置构件在使用期间将第一电接触部分偏压到IC器件的IC端子。 还公开了一种具有多个测试触点的电互连组件。
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公开(公告)号：US10031163B2
公开(公告)日：2018-07-24
申请号：US14567867
申请日：2014-12-11
Applicant: JF Microtechnology Sdn. Bhd.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee
Abstract: An electrical contact that employs a common compressible layer for all contacts, wherein the compressible layer is fashioned with ducts that contain bridges within them. The bridges are formed of the compressible layer. This bridge serves as a compressible member for a first and second member in electrical contact with each other, and that interact with each other such that a compression force acted on the first and second members will cause them to maintain electrical contact while compressing the bridge. When the compressive force is released, the bridge, acting like a spring, expands thus pushing the first and second members apart, but still in electrical contact with each other.
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Patent Agency Ranking
公开(公告)号：US11266015B2
公开(公告)日：2022-03-01
申请号：US17344499
申请日：2021-06-10
Applicant: JF MICROTECHNOLOGY SDN. BHD
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee , Grace Ann Nee Yee
IPC: H05K1/02
Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.
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公开(公告)号：US10446965B2
公开(公告)日：2019-10-15
申请号：US15438508
申请日：2017-02-21
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee
Abstract: A vertical spring contact is constructed of a single piece of electrical conductor, having a central spine that acts as a spring and does not bulge horizontally during compression. This contact is also provided with a pair of arms extending downwards from a top member, flanking both sides of the central spine without being in contact with the central spine. The lower tips of the arms are bent inwards. The central spine structurally connects the top member to a bottom member. The bottom member is provided with recesses that are adapted to loosely receive the lower tips of the arms. In this way, when the contact is compressed, the lower tips of the arms are pressed into the recesses, thus establishing more contact points for a current to pass through.
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公开(公告)号：US10018652B2
公开(公告)日：2018-07-10
申请号：US14855341
申请日：2015-09-15
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee
CPC classification number: G01R1/0416 , G01R31/2886 , H01R12/7076 , H01R13/22 , H01R13/24 , H01R13/2407 , H01R13/46 , H01R13/642 , H05K7/1069
Abstract: An electrical contact for use in an integrated circuit testing apparatus with a very short conducting contact pin. The shortness of the contact pin is made possible due to the unique design and coupling of the contact pin with an elastomer, and both supported by a housing in such a way that the contact pin test height is brought down to 0.5 mm, while providing a deflection of 0.1 mm with is sufficient in order to provide adequate penetration to matte tin plated devices. The contact pin of this invention looks almost like the letter “F”, rotated 90° to the left, so that it lies on its left side. The rectangular shaped elastomer is placed between the prongs of the “F”. The bottom part of the “F” is curved upwards so that it is almost parallel to the prongs.
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公开(公告)号：US11821916B2
公开(公告)日：2023-11-21
申请号：US17710818
申请日：2022-03-31
Applicant: JF MICROTECHNOLOGY SDN. BHD.
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee , Fadzhirul Ridhzwan Azry Bin Sulaiman
CPC classification number: G01R1/0466 , H01R13/2414
Abstract: An electrical ground connector for use as part of a test connector in an integrated circuit (IC) device testing apparatus having a resilient connector for electrical grounding and comprising a dual elastomer contact stacked vertically above a rigid ground block. The height of the ground block can be adjusted to compensate for the lack of height of the dual elastomer contacts, so that the entire connector has enough height to maintain electrical connection between a load board of the testing apparatus and the IC device.
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公开(公告)号：US11674977B2
公开(公告)日：2023-06-13
申请号：US17682769
申请日：2022-02-28
Applicant: JF MICROTECHNOLOGY SDN. BHD
Inventor： Wei Kuong Foong , Kok Sing Goh , Shamal Mundiyath , Eng Kiat Lee , Grace Ann Nee Yee
CPC classification number: G01R1/0466 , G01R1/0735 , G01R1/07364 , H05K1/0268 , H05K1/0283 , H05K1/0296 , H05K2201/1078 , H05K2201/1084 , H05K2201/10704 , H05K2201/10795
Abstract: An electrical contact assembly that uses an elastomer strip for each row of individual contacts. Each contact comprises a rigid bottom pin and a flexible top pin with a pair of arms which extend over and slide along sloped concave surfaces of the bottom contact. The elastomer strip is located between rows of the bottom and top pins. A bottom socket housing is provided with grooves which receive each elastomer strip. A row of top pins is then placed over each elastomer strip, and through ducts in the bottom socket housing. Bottom pins are then snapped into place in between the pair of arms.
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