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    Ni-Base Single Crystal Superalloy with Enhanced Creep Property
    2.
    发明申请
    Ni-Base Single Crystal Superalloy with Enhanced Creep Property 审中-公开
    具有增强蠕变性能的Ni-Base单晶超耐热合金

    公开(公告)号：US20120237391A1

    公开(公告)日：2012-09-20

    申请号：US13419487

    申请日：2012-03-14

    申请人： Hyun Uk Hong ,  Chang Yong Jo ,  In Soo Kim ,  Baig Gyu Choi

    发明人： Hyun Uk Hong ,  Chang Yong Jo ,  In Soo Kim ,  Baig Gyu Choi

    IPC分类号： C22C19/05 ,  C22C30/00

    CPC分类号： C22C19/057

    摘要： The present invention provides Ni-base single crystal superalloy with good high-temperature property, particularly long creep life and excellent resistance to creep deformation, by adjusting content of Al and Ti that form a gamma prime (γ′), a major hardening phase of the Ni-base single crystal superalloy. The Ni-base single crystal superalloy comprise Co: 11.5˜13.5%, Cr: 3.0˜5.0%, Mo: 0.7˜2.0%, W: 8.5˜10.5%, Al: 3.5˜5.5%, Ti: 2.5˜4.5%, Ta: 6.0˜8.0%, Re: 2.0˜4.0%, Ru: 0.1˜2.0% in Weight %, and the rest is Ni and other inevitable impurities. And composition ratio of Al/Ti is 0.7˜2.2. In addition, the superalloy has a mixed structure of the γ matrix and γ′ particles.

    摘要翻译： 本发明通过调节形成γ'（γ'）的Al和Ti的含量，提供具有良好的高温性能，特别是蠕变寿命特别好的蠕变寿命和优异的抗蠕变变形的Ni基单晶超耐热合金， 镍基单晶超合金。 Ni基单晶超合金包括Co：11.5〜13.5％，Cr：3.0〜5.0％，Mo：0.7〜2.0％，W：8.5〜10.5％，Al：3.5〜5.5％，Ti：2.5〜4.5％ Ta：6.0〜8.0％，Re：2.0〜4.0％，Ru：0.1〜2.0％重量％，其余为Ni等不可避免的杂质。 Al / Ti组成比为0.7〜2.2。 此外，超合金具有γ基体和γ'粒子的混合结构。

    Apparatus of Measuring the Orientation Relationship Between Neighboring Grains Using a Goniometer in a Transmission Electron Microscope and Method for Revealing the Characteristics of Grain Boundaries
    4.
    发明申请
    Apparatus of Measuring the Orientation Relationship Between Neighboring Grains Using a Goniometer in a Transmission Electron Microscope and Method for Revealing the Characteristics of Grain Boundaries 有权
    透射电子显微镜中使用测角仪测量相邻晶粒之间取向关系的装置及揭示晶界特征的方法

    公开(公告)号：US20100019145A1

    公开(公告)日：2010-01-28

    申请号：US12343853

    申请日：2008-12-24

    申请人： Hi Won Jeong ,  Seong Moon Seo ,  Hyun Uk Hong ,  Young Soo Yoo ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo

    发明人： Hi Won Jeong ,  Seong Moon Seo ,  Hyun Uk Hong ,  Young Soo Yoo ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo

    IPC分类号： G01N23/00

    CPC分类号： G01N23/02

    摘要： An apparatus and method for measuring the crystallographic orientation relationship of neighboring grains and the characteristics of grain boundaries using a goniometer of a transmission electron microscope are disclosed to check the orientation relationship between two crystals and the characteristics of grain boundaries with a small error in real time. An apparatus for measuring the orientation relationship between neighboring grains and the characteristics of grain boundaries by using a goniometer of a transmission electron stereoscope, the apparatus comprising a goniometer mounted at a transmission electron microscope and a measurement unit for revealing the characteristics of grain boundaries of a specimen by linear-algebraically interpreting the relationship between crystal axes and tilt axes of the specimen using the goniometer.

    摘要翻译： 公开了使用透射电子显微镜的测角仪测量相邻晶粒的晶体取向关系和晶界特性的装置和方法，以实时检测两个晶体之间的取向关系和晶界特征，具有小的误差 。 一种利用透射电子立体镜的测角仪测量相邻晶粒之间的取向关系和晶界特性的装置，该装置包括安置在透射电子显微镜上的测角仪，以及用于显示晶界的特征的测量单元 样品通过线性代数解释使用测角仪的样品的晶轴和倾斜轴之间的关系。

    System and method for identifying object information
    6.
    发明授权
    System and method for identifying object information 有权
    用于识别对象信息的系统和方法

    公开(公告)号：US06880758B2

    公开(公告)日：2005-04-19

    申请号：US10329385

    申请日：2002-12-27

    申请人： Moon Sung Park ,  Yun Su Chung ,  Byeong Woon Jin ,  Yong Joon Lee ,  Jin Suk Kim ,  In Soo Kim ,  Hye Kyu Kim

    发明人： Moon Sung Park ,  Yun Su Chung ,  Byeong Woon Jin ,  Yong Joon Lee ,  Jin Suk Kim ,  In Soo Kim ,  Hye Kyu Kim

    IPC分类号： G06K7/14 ,  G06K17/00 ,  G02B26/10 ,  G06K7/10 ,  G06K9/22 ,  G06K19/06

    CPC分类号： G06K7/1443 ,  G06K7/14 ,  G06K17/00

    摘要： In a system for identifying an object having a bar code symbology, a measurement and input unit measure a height and a length of the object and input the measured values into the system. An object image and search region image storage unit stores an image of the object and images of at least two sub blocks from the object. A search region setting unit sets a size of the sub blocks. A region of interest (ROI) generation unit sets a weight and a characteristic value of the sub block. A bar code symbology identification unit searches vertically a bar code region from the ROI and generates a bar code edge region. An information interpretation unit interprets object information corresponding to the bar code edge region. A result process and storage unit processes and stores the interpreted object information.

    摘要翻译： 在用于识别具有条形码符号的对象的系统中，测量和输入单元测量对象的高度和长度并将测量值输入到系统中。 对象图像和搜索区域图像存储单元从对象存储对象的图像和至少两个子块的图像。 搜索区域设置单元设置子块的大小。 感兴趣区域（ROI）生成单元设定子块的权重和特征值。 条形码符号识别单元从ROI中垂直地搜索条形码区域并生成条形码边缘区域。 信息解释单元对与条形码边缘区域对应的对象信息进行解释。 结果处理和存储单元处理和存储解释的对象信息。

    Heat Treatment Method of a Ni-Based Superalloy for Wave-Type Grain Boundary and a Ni-Based Superalloy Produced Accordingly
    7.
    发明申请
    Heat Treatment Method of a Ni-Based Superalloy for Wave-Type Grain Boundary and a Ni-Based Superalloy Produced Accordingly 审中-公开
    波纹型晶界镍基超合金的热处理方法及相应生产的镍基超合金

    公开(公告)号：US20090308508A1

    公开(公告)日：2009-12-17

    申请号：US12484597

    申请日：2009-06-15

    申请人： Hyun Uk Hong ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo ,  Young Soo Yoo ,  Hi Won Jeong ,  Seong Moon Seo

    发明人： Hyun Uk Hong ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo ,  Young Soo Yoo ,  Hi Won Jeong ,  Seong Moon Seo

    IPC分类号： C22F1/10 ,  C22C19/03

    CPC分类号： C22C19/03 ,  C22F1/10

    摘要： The present invention suggests a method of heat treatment of a Ni-based superalloy that improves resistance against creep, fatigue and stress corrosion cracking while being economical and easy, and a Ni-based superalloy produced by using the same. The method and the superalloy of the present invention include solution treatment at the high temperature region during a heat treatment process after manufacturing or final cold working fabrication. Immediately following the solution treatment, the material is slowly cooled at 1˜15° C./minute down to the intermediate temperature region for aging treatment. After the slow cooling stage, aging treatment is directly performed by holding it at the intermediate temperature region for the prescribed time. Lastly, the aging treatment is followed by air-cooling stage.

    摘要翻译： 本发明提出了一种Ni基超级合金的热处理方法，其在经济且容易的情况下提高耐蠕变，疲劳和应力腐蚀开裂性，以及使用其制造的Ni系超合金。 本发明的方法和超合金包括在制造或最终冷加工制造之后的热处理过程中的高温区域的溶液处理。 在固溶处理之后，将材料在1〜15℃/分钟缓慢冷却至中间温度区域进行时效处理。 在缓慢冷却阶段之后，通过将其保持在中间温度区域达到规定时间直接进行时效处理。 最后，老化处理之后是空冷阶段。

    Device for controlling the operation of internal voltage generator
    8.
    发明授权
    Device for controlling the operation of internal voltage generator 有权
    用于控制内部电压发生器运行的装置

    公开(公告)号：US07173480B2

    公开(公告)日：2007-02-06

    申请号：US10999418

    申请日：2004-11-30

    申请人： In Soo Kim ,  Young Jun Nam

    发明人： In Soo Kim ,  Young Jun Nam

    IPC分类号： G05F1/10

    CPC分类号： G11C5/147 ,  G11C5/145

    摘要： The present invention discloses a circuit for controlling a timing of overdriving a core voltage (internal voltage) which is a driving voltage of a sense amplifier of a memory device and a duration of the overdriven core voltage, and a method for easily measuring the timing and duration. A device for controlling an operation of an internal voltage generator includes an internal voltage driver for outputting an internal voltage to an output terminal, an internal voltage over-driver for compensating for a potential level of the output terminal, and a controller for controlling an enable timing and a disable timing of the internal voltage over-driver. The controller receives a first control signal and outputs a second control signal, and the second control signal is generated after a predetermined time from reception of the first control signal, an operation of the internal voltage over-driver being controlled according to the second control signal.

    摘要翻译： 本发明公开了一种用于控制过驱动作为存储器件的读出放大器的驱动电压的核心电压（内部电压）的时序和过驱动核心电压的持续时间的电路，以及用于容易地测量定时和 持续时间 用于控制内部电压发生器的操作的装置包括用于向输出端子输出内部电压的内部电压驱动器，用于补偿输出端子的电位电平的内部电压过驱动器，以及用于控制使能 定时和内部电压过驱动器的禁用定时。 控制器接收第一控制信号并输出​​第二控制信号，并且在接收到第一控制信号之后的预定时间之后产生第二控制信号，根据第二控制信号控制内部电压过驱动器的操作 。

    Apparatus of measuring the orientation relationship between neighboring grains using a goniometer in a transmission electron microscope and method for revealing the characteristics of grain boundaries
    10.
    发明授权
    Apparatus of measuring the orientation relationship between neighboring grains using a goniometer in a transmission electron microscope and method for revealing the characteristics of grain boundaries 有权
    在透射电子显微镜中使用测角仪测量相邻晶粒之间的取向关系的装置以及揭示晶界特征的方法

    公开(公告)号：US08008621B2

    公开(公告)日：2011-08-30

    申请号：US12343853

    申请日：2008-12-24

    申请人： Hi Won Jeong ,  Seong Moon Seo ,  Hyun Uk Hong ,  Young Soo Yoo ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo

    发明人： Hi Won Jeong ,  Seong Moon Seo ,  Hyun Uk Hong ,  Young Soo Yoo ,  In Soo Kim ,  Baig Gyu Choi ,  Chang Yong Jo

    IPC分类号： G01N23/00

    CPC分类号： G01N23/02

    摘要： An apparatus and method for measuring the crystallographic orientation relationship of neighboring grains and the characteristics of grain boundaries using a goniometer of a transmission electron microscope are disclosed to check the orientation relationship between two crystals and the characteristics of grain boundaries with a small error in real time. An apparatus for measuring the orientation relationship between neighboring grains and the characteristics of grain boundaries by using a goniometer of a transmission electron stereoscope, the apparatus comprising a goniometer mounted at a transmission electron microscope and a measurement unit for revealing the characteristics of grain boundaries of a specimen by linear-algebraically interpreting the relationship between crystal axes and tilt axes of the specimen using the goniometer.

    摘要翻译： 公开了使用透射电子显微镜的测角仪测量相邻晶粒的晶体取向关系和晶界特性的装置和方法，以实时检测两个晶体之间的取向关系和晶界特征，具有小的误差 。 一种利用透射电子立体镜的测角仪测量相邻晶粒之间的取向关系和晶界特性的装置，该装置包括安置在透射电子显微镜上的测角仪，以及用于显示晶界的特征的测量单元 样品通过线性代数解释使用测角仪的样品的晶轴和倾斜轴之间的关系。