公开(公告)号：US20110195638A1

公开(公告)日：2011-08-11

申请号：US13124029

申请日：2009-09-11

申请人： Kenichi Sasaki ,  Hideki Kawai

发明人： Kenichi Sasaki ,  Hideki Kawai

IPC分类号： B24B1/00

CPC分类号： G11B5/8404 ,  H01L21/67028

摘要： Disclosed is a method for producing a glass substrate, which involves a first polishing step and a second polishing step both for polishing the surface of the glass substrate with a polishing solution containing a polishing agent. The method is characterized by additionally involving a heating step for heating the glass substrate, wherein the heating step is carried out after the first polishing step and before the second polishing step.

摘要翻译： 公开了一种玻璃基板的制造方法，其包括第一研磨工序和第二研磨工序，所述第一研磨工序和第二研磨工序均用含有研磨剂的研磨液对玻璃基板的表面进行研磨。 该方法的特征在于另外涉及加热玻璃基板的加热步骤，其中加热步骤在第一抛光步骤之后和在第二抛光步骤之前进行。

公开(公告)号：US07882709B2

公开(公告)日：2011-02-08

申请号：US12312685

申请日：2007-11-05

申请人： Hideki Kawai ,  Kenichi Sasaki ,  Hiroaki Sawada

发明人： Hideki Kawai ,  Kenichi Sasaki ,  Hiroaki Sawada

IPC分类号： G11B5/73 ,  C03C15/00

CPC分类号： G11B5/8404 ,  C03C21/002 ,  G11B5/7315 ,  G11B7/2531 ,  G11B11/10582 ,  G11B11/10586 ,  G11B23/0021

摘要： Provided are a glass substrate for an information recording medium, which has both high strength and high flatness and can be manufactured at low cost, a method for manufacturing such glass substrate and an information recording medium using such glass substrate. The glass substrate for the information recording medium satisfies inequalities of 0.1≦(W1−W3)/W2≦5, where, W1 is an ion concentration at the center portion in the thickness direction of the glass substrate in a chemically reinforced region at the outer circumference end surface and the inner circumference end surface of the glass substrate and is the maximum value of K+ ion concentration, W2 is a Na+ ion concentration at a position where the K+ ion concentration is maximum, and W3 is a K+ ion concentration in a glass substrate region not chemically reinforced.

摘要翻译： 提供一种用于信息记录介质的玻璃基板，其具有高强度和高平坦度，并且可以以低成本制造，这种玻璃基板的制造方法和使用这种玻璃基板的信息记录介质。 用于信息记录介质的玻璃基板满足不等式为0.1＆nlE;（W1-W3）/ W2＆nlE; 5，其中W1是在化学增强区域中玻璃基板的厚度方向中心部分处的离子浓度 玻璃基板的外周端面和内周端面，是K +离子浓度的最大值，W2是K +离子浓度最大的位置处的Na +离子浓度，W3是K +离子浓度最高的K +离子浓度 玻璃基板区域未化学增强。

公开(公告)号：US20090252993A1

公开(公告)日：2009-10-08

申请号：US12312685

申请日：2007-11-05

申请人： Hideki Kawai ,  Kenichi Sasaki ,  Hiroaki Sawada

发明人： Hideki Kawai ,  Kenichi Sasaki ,  Hiroaki Sawada

IPC分类号： G11B5/73 ,  C03C15/00

CPC分类号： G11B5/8404 ,  C03C21/002 ,  G11B5/7315 ,  G11B7/2531 ,  G11B11/10582 ,  G11B11/10586 ,  G11B23/0021

摘要： Provided are a glass substrate for an information recording medium, which has both high strength and high flatness and can be manufactured at low cost, a method for manufacturing such glass substrate and an information recording medium using such glass substrate. The glass substrate for the information recording medium satisfies inequalities of 0.1≦(W1−W3)/W2≦5, where, W1 is an ion concentration at the center portion in the thickness direction of the glass substrate in a chemically reinforced region at the outer circumference end surface and the inner circumference end surface of the glass substrate and is the maximum value of K+ ion concentration, W2 is a Na+ ion concentration at a position where the K+ ion concentration is maximum, and W3 is a K+ ion concentration in a glass substrate region not chemically reinforced.

摘要翻译： 提供一种用于信息记录介质的玻璃基板，其具有高强度和高平坦度，并且可以以低成本制造，这种玻璃基板的制造方法和使用这种玻璃基板的信息记录介质。 用于信息记录介质的玻璃基板满足0.1 <=（W1-W3）/ W2 <= 5的不等式，其中W1是化学增强区域中玻璃基板的厚度方向中心部分处的离子浓度 玻璃基板的外周端面和内周端面，是K +离子浓度的最大值，W2是K +离子浓度最大的位置的Na +离子浓度，W3是K +离子浓度的K +离子浓度 没有化​​学增强的玻璃基底区域。

公开(公告)号：US09190096B2

公开(公告)日：2015-11-17

申请号：US13124029

申请日：2009-09-11

申请人： Kenichi Sasaki ,  Hideki Kawai

发明人： Kenichi Sasaki ,  Hideki Kawai

IPC分类号： G11B5/84 ,  H01L21/67

CPC分类号： G11B5/8404 ,  H01L21/67028

摘要： Disclosed is a method for producing a glass substrate, which involves a first polishing step and a second polishing step both for polishing the surface of the glass substrate with a polishing solution containing a polishing agent. The method is characterized by additionally involving a heating step for heating the glass substrate, wherein the heating step is carried out after the first polishing step and before the second polishing step.

摘要翻译： 公开了一种玻璃基板的制造方法，其包括第一研磨工序和第二研磨工序，所述第一研磨工序和第二研磨工序均用含有研磨剂的研磨液对玻璃基板的表面进行研磨。 该方法的特征在于另外涉及加热玻璃基板的加热步骤，其中加热步骤在第一抛光步骤之后和在第二抛光步骤之前进行。

公开(公告)号：US08648564B2

公开(公告)日：2014-02-11

申请号：US13608033

申请日：2012-09-10

申请人： Kenichi Sasaki

发明人： Kenichi Sasaki

IPC分类号： H02J7/00 ,  H01F38/14

CPC分类号： H02J7/0044 ,  H02J5/005 ,  H02J7/025 ,  H02J50/10 ,  H02J50/80 ,  H02J50/90

摘要： According to an embodiment, a power transmitting device includes a power supply unit, a power transmitting coil, a first switch, a piezoelectric element, and a first switch controller. The power supply unit is configured to generate a transmission power by using power supplied to a power input terminal. Once the first switch is turned on, the first switch electrically connects an external power supply and the power input terminal until the first switch is turned off next time. The piezoelectric element is disposed at a position at which a weight of a placed power receiving device can be detected. The piezoelectric element is configured to generate a detection power according to the weight of the placed power receiving device. The first switch controller is configured to generate a starting power by the detection power and switches the first switch to on by using the starting power.

摘要翻译： 根据实施例，电力传输装置包括电源单元，发电线圈，第一开关，压电元件和第一开关控制器。 电源单元被配置为通过使用提供给电力输入端子的电力来产生发送功率。 一旦第一开关接通，第一开关将外部电源和电源输入端子电连接，直到第一个开关下一次关闭。 压电元件设置在可以检测放置的受电装置的重量的位置。 压电元件被配置为根据放置的电力接收装置的重量产生检测功率。 第一开关控制器被配置为通过检测功率产生启动功率，并通过使用起动功率将第一开关切换到接通状态。

公开(公告)号：US20130032942A1

公开(公告)日：2013-02-07

申请号：US13553084

申请日：2012-07-19

申请人： Kenichi Sasaki ,  Norio Fukasawa

发明人： Kenichi Sasaki ,  Norio Fukasawa

IPC分类号： H01L23/498 ,  H01L23/48

CPC分类号： H01L24/80 ,  H01L23/495 ,  H01L23/49575 ,  H01L23/49811 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/81 ,  H01L24/85 ,  H01L24/92 ,  H01L25/0657 ,  H01L2224/0401 ,  H01L2224/04042 ,  H01L2224/06135 ,  H01L2224/06136 ,  H01L2224/0614 ,  H01L2224/06177 ,  H01L2224/1134 ,  H01L2224/13082 ,  H01L2224/16145 ,  H01L2224/2929 ,  H01L2224/293 ,  H01L2224/32225 ,  H01L2224/45144 ,  H01L2224/48227 ,  H01L2224/49171 ,  H01L2224/73207 ,  H01L2224/73253 ,  H01L2224/73265 ,  H01L2224/81191 ,  H01L2224/81395 ,  H01L2224/8149 ,  H01L2224/81901 ,  H01L2224/8592 ,  H01L2224/92163 ,  H01L2225/0651 ,  H01L2225/06575 ,  H01L2924/00014 ,  H01L2924/01327 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/05599

摘要： A semiconductor device includes a circuit substrate, a first semiconductor chip disposed on the circuit substrate, a plurality of first spacers disposed on the first semiconductor chip, a second semiconductor chip which includes a first adhesive agent layer on a lower face thereof and is disposed on upper portions of the plurality of spacers, a wire which connects the circuit substrate to the first semiconductor chip, and a first sealing material which seals a gap between the first semiconductor chip and the first adhesive agent layer, wherein each height of the plurality of the first spacers is greater than height of the wire relative to an upper face of the first semiconductor chip.

摘要翻译： 半导体器件包括电路基板，布置在电路基板上的第一半导体芯片，设置在第一半导体芯片上的多个第一间隔物，第二半导体芯片，其下表面上包括第一粘合剂层， 多个间隔物的上部，将电路基板连接到第一半导体芯片的线以及密封第一半导体芯片和第一粘合剂层之间的间隙的第一密封材料，其中， 第一间隔物相对于第一半导体芯片的上表面大于导线的高度。

公开(公告)号：US20120002216A1

公开(公告)日：2012-01-05

申请号：US13256375

申请日：2010-03-08

申请人： Takeshi Shibata ,  Kenichi Sasaki

发明人： Takeshi Shibata ,  Kenichi Sasaki

IPC分类号： G01B11/14

CPC分类号： B25J9/1692 ,  G05B2219/40601 ,  G05B2219/40623 ,  H01L21/67766 ,  H01L21/67778 ,  H01L21/681 ,  H01L21/68707

摘要： The invention provides a robot including a connection member relatively displaceably connected, and configured to control the displacement of the connection member based on a reference posture that can be adjusted, the robot including: a light emitting unit to emit a laser beam in a predetermined direction; a light receiving unit to receive the laser beam when the connection member is located in a detection posture that is away, by a preset displacement amount, from a predetermined zero posture; and a zeroing unit to relatively displace the connection member so as to make the light receiving unit receive the laser beam, and then to adjust the reference posture to the zero posture based on the posture of the connection member when the laser beam is received as well as on a relationship between the zero posture and the detection posture.

摘要翻译： 本发明提供了一种机器人，其包括相对可移动地连接的连接构件，并且被配置为基于可调节的参考姿势来控制连接构件的位移，所述机器人包括：发光单元，用于沿预定方向发射激光束 ; 光接收单元，当所述连接构件位于从预定的位移量处于预定的零位置的检测姿势中时，接收所述激光束; 以及调零单元，以使连接构件相对移位，以使光接收单元接收激光束，然后基于接收激光束时的连接构件的姿态将基准姿势调整为零姿势 作为零姿势与检测姿势之间的关系。

公开(公告)号：US20110287186A1

公开(公告)日：2011-11-24

申请号：US13136296

申请日：2011-07-28

申请人： Satoru Ando ,  Chiyoko Tada ,  Hiroki Nakamaru ,  Kenichi Sasaki ,  Nobue Fujibayashi ,  Akira Matsuzaki

发明人： Satoru Ando ,  Chiyoko Tada ,  Hiroki Nakamaru ,  Kenichi Sasaki ,  Nobue Fujibayashi ,  Akira Matsuzaki

IPC分类号： B05D7/14 ,  B05D5/00 ,  B05D3/00

CPC分类号： C23C22/22

摘要： A method for making a phosphate-treated galvanized steel sheet, including forming a phosphate film on the surface of a galvanized layer of a galvanized steel sheet using a phosphate treatment solution containing Zn2+ and Mg2+ so as to satisfy 2.0

摘要翻译： 一种磷酸盐处理镀锌钢板的制造方法，其特征在于，使用含有Zn2 +和Mg2 +的磷酸盐处理溶液，在镀锌钢板的表面上形成磷酸盐膜，使其满足2.0

公开(公告)号：US20100132425A1

公开(公告)日：2010-06-03

申请号：US12563229

申请日：2009-09-21

申请人： Kenichi Sasaki

发明人： Kenichi Sasaki

IPC分类号： B21B17/10

CPC分类号： B21B17/04 ,  B21B27/035 ,  B21B2267/02 ,  B21B2267/06

摘要： The object of the present invention is to provide a mandrel mill capable of producing a seamless pipe without flaws such as necking. The mandrel mill of the present invention includes a plurality of consecutively provided grooved-roll stands and a mandrel bar 3 provided in a roll groove array formed by the grooved-roll stands so as to continuously elongate a hollow shell 2. Roll grooves 4 of at least a first stand and a second stand are arranged so as to satisfy conditions represented by the following formulas (1) to (4): b≦10a+1.5   (1) b≧10a−0.2   (2) b≦−a+1.5   (3) b≧−a+1.15   (4) wherein a=S/R1, b=C/(R1−S).

摘要翻译： 本发明的目的是提供一种能够生产无缺陷的无缝管的芯棒式无缝管，例如颈缩。 本发明的芯棒式无缝管轧机包括多个连续设置的带槽辊架和由凹槽辊架形成的辊槽阵列中的芯棒3，以便连续拉长中空壳体2。 布置最少的第一支架和第二支架以满足由下列公式（1）至（4）表示的条件：b＆nlE; 10a + 1.5（1）b≥10a-0.2（2）b＆nlE; -a + 1.5 （3）b≥-a + 1.15（4）其中a = S / R1，b = C /（R1-S）。

公开(公告)号：US07707865B2

公开(公告)日：2010-05-04

申请号：US12068044

申请日：2008-02-01

申请人： Kenichi Sasaki

发明人： Kenichi Sasaki

IPC分类号： B21B37/00

CPC分类号： B21C51/00 ,  B21B17/04 ,  B21B37/78 ,  B21B38/04 ,  B21B38/08 ,  B21B2261/04 ,  B21B2265/12

摘要： A flaw detection apparatus and flaw detection method for automatically detecting the occurrence of a flaw in a mother tube manufactured by rolling a hollow shell using a mandrel mill are provided. A flaw detection apparatus (100) according to the present invention includes a wall thickness gauge (1) which is installed on the exit side of a mandrel mill (M) and which measures the tube wall thickness in each of the reducing directions of a hollow shell (P) in the #1-#5 stands of the mandrel mill, rolling load measuring devices (2) which measure the rolling load in the #1-#5 stands, and a decision unit (3) which determines whether there are flaws in the mother tube based on the measured value of the tube wall thickness in each of the reducing directions of the hollow shell (P) and the measured value of the rolling load in each stand. The decision unit (3) determines that a flaw has occurred in the mother tube when the measured value of the tube wall thickness in any of the reducing direction in the #1-#5 stands locally varies by at least a predetermined amount and the measured value of the rolling load in any of the #1-#5 stands locally varies by at least a predetermined amount.

摘要翻译： 提供了一种用于自动检测通过使用芯棒式无缝管轧机轧制中空壳而制造的母管中的缺陷的发生的缺陷检测装置和缺陷检测方法。 根据本发明的探伤装置（100）包括安装在芯棒式无缝管轧机（M）的出口侧的壁厚计（1），其测量中空部的每个还原方向的管壁厚度 芯棒式无缝管轧机＃1＃5机架中的壳体（P），测量＃1-＃5机架中的轧制负荷的轧制负载测量装置（2），以及决定单元（3） 基于中空壳（P）的每个还原方向的管壁厚度的测量值和每个支架中的滚动负载的测量值，母管中的缺陷。 判定单元（3）判定当＃1＃5站中的任一个减少方向的管壁厚度的测量值在局部变化至少预定量时，母管中已经发生了缺陷， ＃1＃5站中的任一个中的轧制负载值在本地变化至少预定量。