Direct sensing semiconductor memory device
    1.
    发明授权
    Direct sensing semiconductor memory device 有权
    直接感应半导体存储器件

    公开(公告)号:US6128238A

    公开(公告)日:2000-10-03

    申请号:US492005

    申请日:2000-01-27

    CPC分类号: G11C11/4091 G11C7/065

    摘要: A direct sensing type semiconductor memory device combines read and write data bus lines in order to conserve real estate. The memory device includes a bit line pair and a sense amplifier connected between the lines of the bit line pair, and a data line pair. A first transistor is connected between a first potential and one of the data lines of the data line pair, and a gate of the first transistor is connected to one of the bit lines of the bit line pair. A second transistor is connected between the first potential and the other one of the data lines, and its gate is connected to the other of the bit lines. A switch circuit is connected between the data line pair and the bit line pair and transfers data from the data line pair to the bit line pair in accordance with a potential difference between the data line pair and the bit line pair.

    摘要翻译: 直接感测型半导体存储器件结合了读和写数据总线,以节省不动产。 存储器件包括位线对和连接在位线对的线之间的读出放大器和数据线对。 第一晶体管连接在数据线对的第一电位和数据线之一之间,第一晶体管的栅极连接到位线对的位线之一。 第二晶体管连接在第一电位和另一个数据线之间,其栅极连接到另一条位线。 开关电路连接在数据线对和位线对之间,并根据数据线对和位线对之间的电位差将数据从数据线对传送到位线对。

    Semiconductor memory device and method of reading data from semiconductor memory device
    2.
    发明授权
    Semiconductor memory device and method of reading data from semiconductor memory device 有权
    半导体存储器件和从半导体存储器件读取数据的方法

    公开(公告)号:US07106651B2

    公开(公告)日:2006-09-12

    申请号:US11066484

    申请日:2005-02-28

    IPC分类号: G11C8/00

    摘要: A semiconductor memory device is arranged so that its circuit area is made smaller and the stored data may be constantly outputted at fast speed. The semiconductor memory device includes a memory cell array and an auxiliary cell array concatenated with word lines on the increasing side of bit-line addresses in the memory cell array. The auxiliary cell array stores data of memory cells in the range from a first bit-line address on a next word-line address to a bit-line address located apart by a predetermined number of bits. A Y-address driver is also included in the semiconductor memory device. The Y-address driver reads data from the auxiliary cell array following the last bit-line address if the read of data pieces at a time ranges from the last bit-line address to the first bit-line address on the next word-line address in the memory cell array.

    摘要翻译: 半导体存储器件被布置成使其电路面积更小,并且可以以快速的速度恒定地输出存储的数据。 半导体存储器件包括存储单元阵列和与存储单元阵列中的位线地址的增加侧的字线连接的辅助单元阵列。 辅助单元阵列将存储单元的数据存储在从下一个字线地址上的第一位线地址到分隔预定位数的位线地址的范围内。 Y地址驱动器也包括在半导体存储器件中。 Y地址驱动器从最后一个位线地址之后的辅助单元阵列读取数据,如果数据段的读取时间范围从下一个字线地址上的最后位线地址到第一个位线地址 在存储单元阵列中。

    Semiconductor memory device and method of reading data from semiconductor memory device
    3.
    发明申请
    Semiconductor memory device and method of reading data from semiconductor memory device 有权
    半导体存储器件和从半导体存储器件读取数据的方法

    公开(公告)号:US20050141328A1

    公开(公告)日:2005-06-30

    申请号:US11066484

    申请日:2005-02-28

    摘要: A semiconductor memory device is arranged so that its circuit area is made smaller and the stored data may be constantly outputted at fast speed. The semiconductor memory device includes a memory cell array and an auxiliary cell array concatenated with word lines on the increasing side of bit-line addresses in the memory cell array. The auxiliary cell array stores data of memory cells in the range from a first bit-line address on a next word-line address to a bit-line address located apart by a predetermined number of bits. A Y-address driver is also included in the semiconductor memory device. The Y-address driver reads data from the auxiliary cell array following the last bit-line address if the read of data pieces at a time ranges from the last bit-line address to the first bit-line address on the next word-line address in the memory cell array.

    摘要翻译: 半导体存储器件被布置成使其电路面积更小,并且可以以快速的速度恒定地输出存储的数据。 半导体存储器件包括存储单元阵列和与存储单元阵列中的位线地址的增加侧的字线连接的辅助单元阵列。 辅助单元阵列将存储单元的数据存储在从下一个字线地址上的第一位线地址到分隔预定位数的位线地址的范围内。 Y地址驱动器也包括在半导体存储器件中。 Y地址驱动器从最后一个位线地址之后的辅助单元阵列读取数据,如果数据段的读取时间范围从下一个字线地址上的最后位线地址到第一个位线地址 在存储单元阵列中。

    Synchronous memory devices and control methods for performing burst write operations
    4.
    发明授权
    Synchronous memory devices and control methods for performing burst write operations 有权
    同步存储器件和用于执行突发写入操作的控制方法

    公开(公告)号:US07821842B2

    公开(公告)日:2010-10-26

    申请号:US12176997

    申请日:2008-07-21

    申请人: Kenji Nagai

    发明人: Kenji Nagai

    IPC分类号: G11C7/10

    摘要: Synchronous memory devices and control methods for performing burst write operations are disclosed. In one embodiment, a synchronous memory device for controlling a burst write operation comprises a first buffer circuit for buffering a first control signal requesting an exit from the burst write operation in synchronization with a clock signal associated with the burst write operation, and a latch circuit for performing a reset in response to the first control signal forwarded by the first buffer circuit, wherein the reset triggers the exit from the burst write operation.

    摘要翻译: 公开了用于执行突发写入操作的同步存储器件和控制方法。 在一个实施例中,用于控制突发写入操作的同步存储器装置包括:第一缓冲器电路,用于与与突发写入操作相关联的时钟信号同步地缓冲请求从突发写入操作退出的第一控制信号;以及锁存电路 用于响应于由第一缓冲电路转发的第一控制信号执行复位,其中复位触发从突发写入操作的退出。

    Storage device and control method of storage device
    5.
    发明申请
    Storage device and control method of storage device 有权
    存储设备的存储设备和控制方法

    公开(公告)号:US20070047342A1

    公开(公告)日:2007-03-01

    申请号:US11510077

    申请日:2006-08-25

    申请人: Kenji Nagai

    发明人: Kenji Nagai

    IPC分类号: G11C8/00

    CPC分类号: G11C8/12

    摘要: In a storage device having a redundancy remedy function in a block unit having a memory cells array divided in plural blocks, prior to the access operation to individual memory cells in the block, the block address BA for specifying a block is entered, and block redundancy is determined in the entered block address BA, and hence it is not necessary to determine input or redundancy of the block address BA on every occasion of the access operation. As a result, the time to the access operation start to the memory cell can be shortened, and the access speed is enhanced.

    摘要翻译: 在具有在多个块中划分的存储单元阵列的块单元中具有冗余补救功能的存储设备中,在对块内的各个存储单元的访问操作之前,输入用于指定块的块地址BA,并且块冗余 在输入的块地址BA中确定,因此不需要在访问操作的每个场合确定块地址BA的输入或冗余。 结果,可以缩短开始到存储单元的访问操作的时间,并且提高访问速度。

    Insulator for armature of dynamo-electric machine
    6.
    发明授权
    Insulator for armature of dynamo-electric machine 有权
    发电机电枢绝缘子

    公开(公告)号:US06633102B2

    公开(公告)日:2003-10-14

    申请号:US10064927

    申请日:2002-08-29

    IPC分类号: H02K104

    CPC分类号: H02K3/38

    摘要: An armature for a rotating electrical machine and more particularly to an insulating cover for the pole teeth around which the windings are formed that has good strength against the winding without risk of damage of the insulator due to increased thickness in the highly stressed areas.

    摘要翻译: 更具体地说,涉及一种用于旋转电机的电枢,更具体地说,涉及一种用于极齿的绝缘盖,绕组绕其形成,其具有对绕组的良好强度,而不会由于高应力区域中的厚度增加而导致绝缘体损坏的风险。 PTEXT>

    Semiconductor integrated circuit device and IC card
    7.
    发明授权
    Semiconductor integrated circuit device and IC card 失效
    半导体集成电路器件和IC卡

    公开(公告)号:US06420883B1

    公开(公告)日:2002-07-16

    申请号:US09427594

    申请日:1999-10-27

    IPC分类号: G01R2708

    摘要: A semiconductor integrated circuit device provided with an IC chip so as to prevent its circuits from malfunction when the IC chip is cracked. To detect chip cracks, a resistor R01 is disposed at the outer periphery of the area which wants to detect the chip crack. If the chip is cracked and the resistance value of the resistor R01 is changed, the resistance change is detected, thereby controlling internal signals such as the power on reset signal and stopping the whole operation of the circuit device so as to prevent the circuits from malfunction. Thus, the system security can also be improved.

    摘要翻译: 具有IC芯片的半导体集成电路装置,以防止IC芯片破裂时其电路发生故障。 为了检测芯片裂纹,电阻器R01设置在要检测芯片裂纹的区域的外周。 如果芯片破裂并且电阻器R01的电阻值改变,则检测电阻变化,从而控制诸如上电复位信号的内部信号,并停止电路装置的整个操作,以防止电路故障 。 因此,系统安全性也可以提高。

    Temperature measuring system, substrate processing apparatus and temperature measuring method
    9.
    发明授权
    Temperature measuring system, substrate processing apparatus and temperature measuring method 有权
    温度测量系统,基板加工设备和温度测量方法

    公开(公告)号:US09046417B2

    公开(公告)日:2015-06-02

    申请号:US13529391

    申请日:2012-06-21

    IPC分类号: G01J3/45 G01J5/08 G01J5/00

    CPC分类号: G01J5/0896 G01J5/0007

    摘要: The temperature measuring system using optical interference includes a light source which generates measuring light; a spectroscope which measures an interference intensity distribution that is an intensity distribution of reflected light; optical transfer mechanisms which emit light reflected from a surface and a rear surface of the object to be measured to the spectroscope; an optical path length calculation unit which calculates an optical path length by performing Fourier transformation; and a temperature calculation unit which calculates a temperature of the object to be measured on the basis of a relation between optical path lengths and temperatures. The light source has a half-width at half-maximum of a light source spectrum that satisfies conditions based on a wavelength span of the spectroscope. The spectroscope measures the intensity distribution by using the number of samplings that satisfies conditions based on the wavelength span and a maximum measurable thickness.

    摘要翻译: 使用光学干涉的温度测量系统包括产生测量光的光源; 测量作为反射光的强度分布的干涉强度分布的分光镜; 将从测量对象的表面和后表面反射的光发射到分光器的光学传递机构; 光路长度计算单元,其通过执行傅立叶变换来计算光程长度; 以及温度计算单元,其基于光程长度和温度之间的关系来计算被测量物体的温度。 光源具有满足基于分光器的波长跨度的条件的光源光谱的半值的半宽度。 分光镜通过使用满足基于波长跨度和最大可测量厚度的条件的采样数来测量强度分布。

    Time reduction of address setup/hold time for semiconductor memory

    公开(公告)号:US08031537B2

    公开(公告)日:2011-10-04

    申请号:US12987466

    申请日:2011-01-10

    IPC分类号: G11C7/10

    CPC分类号: G11C7/1078 G06F1/10 G11C7/109

    摘要: In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.