Erase Method of Flash Device
    4.
    发明申请
    Erase Method of Flash Device 失效
    闪存设备的擦除方法

    公开(公告)号:US20100027353A1

    公开(公告)日:2010-02-04

    申请号:US12491668

    申请日:2009-06-25

    申请人: Il Young Kwon

    发明人: Il Young Kwon

    IPC分类号: G11C16/16 G11C7/10

    CPC分类号: G11C16/16

    摘要: In an erase method of a flash device, including a page buffer configured to transfer a virtual voltage in response to a discharge signal and further comprising strings each including memory cells and coupled to the page buffer via a respective bit line, applying a ground voltage to a gate of each of the memory cells and erasing the memory cells coupled to a selected bit line by supplying the virtual voltage wherein the virtual voltage is applied to the selected bit line and a unselected bit line.

    摘要翻译: 在闪存器件的擦除方法中,包括被配置为响应于放电信号传送虚拟电压的页缓冲器,并且还包括每个包括存储器单元并且经由相应位线耦合到页缓冲器的串,将接地电压施加到 每个存储器单元的栅极,并且通过提供其中虚拟电压被施加到所选择的位线和未选择的位线的虚拟电压来擦除耦合到所选位线的存储器单元。

    Method of manufacturing semiconductor device
    5.
    发明授权
    Method of manufacturing semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US07572729B2

    公开(公告)日:2009-08-11

    申请号:US11635909

    申请日:2006-12-08

    申请人: Il Young Kwon

    发明人: Il Young Kwon

    IPC分类号: H01L21/4763

    摘要: A method of manufacturing semiconductor devices, including the steps of forming an insulating layer on a semiconductor substrate in which predetermined structures are formed, and etching the insulating layer to expose a predetermined region of the semiconductor substrate, thereby forming a contact hole, forming an insulating layer on the sides of the contact hole, and forming a conductive layer within the contact hole, forming a contact plug. It is possible to prevent a short problem by sufficiently securing a distance between a drain contact plug and a virtual power line.

    摘要翻译: 一种制造半导体器件的方法,包括以下步骤:在形成有预定结构的半导体衬底上形成绝缘层,并蚀刻绝缘层以暴露半导体衬底的预定区域,从而形成接触孔,形成绝缘层 在接触孔的侧面上形成导电层,形成接触插塞。 可以通过充分确保漏极接触插头和虚拟电源线之间的距离来防止短的问题。

    Erase method of flash device
    6.
    发明授权
    Erase method of flash device 失效
    擦除闪存设备的方法

    公开(公告)号:US08243528B2

    公开(公告)日:2012-08-14

    申请号:US12491668

    申请日:2009-06-25

    申请人: Il Young Kwon

    发明人: Il Young Kwon

    IPC分类号: G11C11/34

    CPC分类号: G11C16/16

    摘要: In an erase method of a flash device, including a page buffer configured to transfer a virtual voltage in response to a discharge signal and further comprising strings each including memory cells and coupled to the page buffer via a respective bit line, applying a ground voltage to a gate of each of the memory cells and erasing the memory cells coupled to a selected bit line by supplying the virtual voltage wherein the virtual voltage is applied to the selected bit line and a unselected bit line.

    摘要翻译: 在闪存器件的擦除方法中,包括被配置为响应于放电信号传送虚拟电压的页缓冲器,并且还包括每个包括存储器单元并且经由相应位线耦合到页缓冲器的串,将接地电压施加到 每个存储器单元的栅极,并且通过提供其中虚拟电压被施加到所选择的位线和未选择的位线的虚拟电压来擦除耦合到所选位线的存储器单元。

    Method of manufacturing semiconductor device
    7.
    发明申请
    Method of manufacturing semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US20070238286A1

    公开(公告)日:2007-10-11

    申请号:US11635909

    申请日:2006-12-08

    申请人: Il Young Kwon

    发明人: Il Young Kwon

    IPC分类号: H01L21/4763

    摘要: A method of manufacturing semiconductor devices, including the steps of forming an insulating layer on a semiconductor substrate in which predetermined structures are formed, and etching the insulating layer to expose a predetermined region of the semiconductor substrate, thereby forming a contact hole, forming an insulating layer on the sides of the contact hole, and forming a conductive layer within the contact hole, forming a contact plug. It is possible to prevent a short problem by sufficiently securing a distance between a drain contact plug and a virtual power line.

    摘要翻译: 一种制造半导体器件的方法,包括以下步骤:在形成有预定结构的半导体衬底上形成绝缘层,并蚀刻绝缘层以暴露半导体衬底的预定区域,从而形成接触孔,形成绝缘层 在接触孔的侧面上形成导电层,形成接触插塞。 可以通过充分确保漏极接触插头和虚拟电源线之间的距离来防止短的问题。