公开(公告)号：US20220320138A1

公开(公告)日：2022-10-06

申请号：US17843320

申请日：2022-06-17

Applicant: KIOXIA CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KIDOH ,  Masaru KITO ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI

IPC: H01L27/11582 ,  G11C16/04 ,  H01L27/11556 ,  H01L27/11573 ,  H01L27/11575 ,  H01L27/11578 ,  H01L27/105 ,  H01L29/51

Abstract: A non-volatile semiconductor storage device has a plurality of memory strings to each of which a plurality of electrically rewritable memory cells are connected in series. Each of the memory strings includes first semiconductor layers each having a pair of columnar portions extending in a vertical direction with respect to a substrate and a coupling portion formed to couple the lower ends of the pair of columnar portions; a charge storage layer formed to surround the side surfaces of the columnar portions; and first conductive layers formed to surround the side surfaces of the columnar portions and the charge storage layer. The first conductive layers function as gate electrodes of the memory cells.

公开(公告)号：US20220028892A1

公开(公告)日：2022-01-27

申请号：US17499357

申请日：2021-10-12

Applicant: KIOXIA CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KIDOH ,  Masaru KITO ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI

IPC: H01L27/11582 ,  H01L27/11573

Abstract: A non-volatile semiconductor storage device has a plurality of memory strings to each of which a plurality of electrically rewritable memory cells are connected in series. Each of the memory strings includes first semiconductor layers each having a pair of columnar portions extending in a vertical direction with respect to a substrate and a coupling portion formed to couple the lower ends of the pair of columnar portions a charge storage layer formed to surround the side surfaces of the columnar portions: and first conductive layers formed to surround the side surfaces of the columnar portions and the charge storage layer. The first conductive layers function as gate electrodes of the memory cells.

公开(公告)号：US20220399267A1

公开(公告)日：2022-12-15

申请号：US17893225

申请日：2022-08-23

Applicant: Kioxia Corporation

Inventor： Takao SUEYAMA ,  Yosuke KOMORI

IPC: H01L23/528 ,  H01L27/088 ,  H01L23/532

Abstract: A semiconductor device according to the present embodiment comprises a first metallic line. The first metallic line is provided above a substrate and extends in a first direction with a first width. At least one second metallic line is connected to the first metallic line and extends in a second direction from the first metallic line with a second width that is smaller than the first width. A dummy metallic line is arranged adjacently to the at least one second metallic line, connected to the first metallic line, and extends in the second direction from the first metallic line. The dummy metallic line is not electrically connected to lines other than the first metallic line.

公开(公告)号：US20210280508A1

公开(公告)日：2021-09-09

申请号：US17001933

申请日：2020-08-25

Applicant: Kioxia Corporation

Inventor： Takao SUEYAMA ,  Yosuke KOMORI

IPC: H01L23/528 ,  H01L23/532 ,  H01L27/088

Abstract: A semiconductor device according to the present embodiment comprises a first metallic line. The first metallic line is provided above a substrate and extends in a first direction with a first width. At least one second metallic line is connected to the first metallic line and extends in a second direction from the first metallic line with a second width that is smaller than the first width. A dummy metallic line is arranged adjacently to the at least one second metallic line, connected to the first metallic line, and extends in the second direction from the first metallic line. The dummy metallic line is not electrically connected to lines other than the first metallic line.

公开(公告)号：US20230146470A1

公开(公告)日：2023-05-11

申请号：US18091728

申请日：2022-12-30

Applicant: KIOXIA CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KIDOH ,  Masaru KITO ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI

IPC: H10B43/27 ,  G11C16/04 ,  H10B41/27 ,  H10B43/40 ,  H10B43/50 ,  H10B43/20 ,  H01L27/105 ,  H01L29/51

CPC classification number: H01L27/11582 ,  G11C16/0483 ,  H01L27/11556 ,  H01L27/11573 ,  H01L27/11575 ,  H01L27/11578 ,  H01L27/1052 ,  H01L29/513 ,  H01L27/11551

Abstract: A non-volatile semiconductor storage device has a plurality of memory strings to each of which a plurality of electrically rewritahle memory cells are connected in series. Each of the memory strings includes first semiconductor layers each having a pair of columnar portions extending in a vertical direction with respect to a substrate and a coupling portion formed to couple the lower ends of the pair of colunmar portions a charge storage layer formed to surround the side surfaces of the columnar portions: and first conductive layers formed to surround the side surfaces of the columnar portions and the charge storage layer. The first conductive layers function as gate electrodes of the memory cells.

公开(公告)号：US20220139955A1

公开(公告)日：2022-05-05

申请号：US17576164

申请日：2022-01-14

Applicant: Kioxia Corporation

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KITO ,  Masaru KIDOH ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Junya MATSUNAMI ,  Tomoko FUJIWARA ,  Hideaki AOCHI ,  Ryouhei KIRISAWA ,  Yoshimasa MIKAJIRI ,  Shigeto OOTA

IPC: H01L27/11582 ,  H01L29/66 ,  H01L29/792 ,  H01L27/11578 ,  H01L21/223 ,  H01L21/265 ,  H01L29/78 ,  H01L29/04 ,  H01L29/16 ,  H01L29/423 ,  H01L29/49 ,  H01L29/10

Abstract: A nonvolatile semiconductor memory device, includes: a stacked structural unit including a plurality of insulating films alternately stacked with a plurality of electrode films in a first direction; a selection gate electrode stacked on the stacked structural unit in the first direction; an insulating layer stacked on the selection gate electrode in the first direction; a first semiconductor pillar piercing the stacked structural unit, the selection gate electrode, and the insulating layer in the first direction, a first cross section of the first semiconductor pillar having an annular configuration, the first cross section being cut in a plane orthogonal to the first direction; a first core unit buried in an inner side of the first semiconductor pillar, the first core unit being recessed from an upper face of the insulating layer; and a first conducting layer of the first semiconductor pillar provided on the first core unit to contact the first core unit.

公开(公告)号：US20240365549A1

公开(公告)日：2024-10-31

申请号：US18766417

申请日：2024-07-08

Applicant: KIOXIA CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KIDOH ,  Masaru KITO ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Hideaki AOCHI

IPC: H10B43/27 ,  G11C16/04 ,  H01L29/51 ,  H10B41/20 ,  H10B41/27 ,  H10B43/20 ,  H10B43/40 ,  H10B43/50 ,  H10B99/00

CPC classification number: H10B43/27 ,  G11C16/0483 ,  H01L29/513 ,  H10B41/27 ,  H10B43/20 ,  H10B43/40 ,  H10B43/50 ,  H10B99/00 ,  H10B41/20

Abstract: A non-volatile semiconductor storage device has a plurality of memory strings to each of which a plurality of electrically rewritable memory cells are connected in series. Each of the memory strings includes first semiconductor layers each having a pair of columnar portions extending in a vertical direction with respect to a substrate and a coupling portion formed to couple the lower ends of the pair of columnar portions; a charge storage layer formed to surround the side surfaces of the columnar portions; and first conductive layers formed to surround the side surfaces of the columnar portions and the charge storage layer. The first conductive layers function as gate electrodes of the memory cells.

公开(公告)号：US20240008276A1

公开(公告)日：2024-01-04

申请号：US18465223

申请日：2023-09-12

Applicant: KIOXIA CORPORATION

Inventor： Yoshiaki FUKUZUMI ,  Ryota KATSUMATA ,  Masaru KITO ,  Masaru KIDOH ,  Hiroyasu TANAKA ,  Yosuke KOMORI ,  Megumi ISHIDUKI ,  Junya MATSUNAMI ,  Tomoko FUJIWARA ,  Hideaki AOCHI ,  Ryouhei KIRISAWA ,  Yoshimasa MIKAJIRI ,  Shigeto OOTA

IPC: H10B43/27 ,  H01L29/66 ,  H01L29/792 ,  H10B43/20 ,  H01L21/223 ,  H01L21/265 ,  H01L29/78 ,  H01L29/04 ,  H01L29/16 ,  H01L29/423 ,  H01L29/49 ,  H01L29/10

CPC classification number: H10B43/27 ,  H01L29/66833 ,  H01L29/792 ,  H01L29/7926 ,  H10B43/20 ,  H01L21/223 ,  H01L21/265 ,  H01L29/66666 ,  H01L29/7827 ,  H01L29/04 ,  H01L29/16 ,  H01L29/42344 ,  H01L29/4916 ,  H01L29/1037

Abstract: A nonvolatile semiconductor memory device, includes: a stacked structural unit including a plurality of insulating films alternately stacked with a plurality of electrode films in a first direction; a selection gate electrode stacked on the stacked structural unit in the first direction; an insulating layer stacked on the selection gate electrode in the first direction; a first semiconductor pillar piercing the stacked structural unit, the selection gate electrode, and the insulating layer in the first direction, a first cross section of the first semiconductor pillar having an annular configuration, the first cross section being cut in a plane orthogonal to the first direction; a first core unit buried in an inner side of the first semiconductor pillar, the first core unit being recessed from an upper face of the insulating layer; and a first conducting layer of the first semiconductor pillar provided on the first core unit to contact the first core unit.