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    Semiconductor memory device having an internal voltage generation circuit for selectively generating an internal voltage according to an external voltage level
    1.
    发明授权
    Semiconductor memory device having an internal voltage generation circuit for selectively generating an internal voltage according to an external voltage level 失效
    具有内部电压产生电路的半导体存储器件，用于根据外部电压电平选择性地产生内部电压

    公开(公告)号：US06930948B2

    公开(公告)日：2005-08-16

    申请号：US10621165

    申请日：2003-07-15

    申请人： Kyu-Chan Lee ,  Sang-Jae Rhee ,  Jung-Yong Choi ,  Jong-Hyun Choi ,  Jong-Sik Na ,  Jae-Hoon Kim

    发明人： Kyu-Chan Lee ,  Sang-Jae Rhee ,  Jung-Yong Choi ,  Jong-Hyun Choi ,  Jong-Sik Na ,  Jae-Hoon Kim

    IPC分类号： G11C5/14 ,  G11C11/00

    CPC分类号： G11C5/147

    摘要： An external high/low voltage compatible semiconductor memory device includes an internal voltage pad, an internal voltage generation circuit, and an internal voltage control signal generation circuit. The internal voltage pad connects a low external voltage with an internal voltage, and the internal voltage generation circuit generates an internal voltage in response to an internal voltage control signal and a high external voltage. The internal voltage control signal generation circuit generates an internal voltage control signal according to an high or low external voltage. Thus, a database of the semiconductor memory device can be managed without classifying the database into databases for the high voltage and databases for the low voltage because of the internal voltage control signal. In addition, the internal voltage level is stable because charges provided to the internal voltage are regulated according to a voltage level of the external voltage.

    摘要翻译： 外部高/低电压兼容半导体存储器件包括内部电压焊盘，内部电压产生电路和内部电压控制信号产生电路。 内部电压焊盘将低外部电压与内部电压连接，并且内部电压产生电路响应于内部电压控制信号和高外部电压而产生内部电压。 内部电压控制信号发生电路根据高或低的外部电压产生内部电压控制信号。 因此，由于内部电压控制信号，可以管理半导体存储器件的数据库，而不将数据库分类为用于低电压的高电压数据库和数据库。 此外，内部电压电平稳定，因为根据外部电压的电压电平调节提供给内部电压的电荷。

    Temperature sensor instruction signal generator and semiconductor memory device having the same
    2.
    发明授权
    Temperature sensor instruction signal generator and semiconductor memory device having the same 失效
    温度传感器指令信号发生器和具有相同功能的半导体存储器件

    公开(公告)号：US07499359B2

    公开(公告)日：2009-03-03

    申请号：US11354125

    申请日：2006-02-15

    申请人： Jong-Hyun Choi ,  Dong-Il Seo ,  Yong-Gu Kang ,  Jung-Yong Choi ,  Young-Hun Seo

    发明人： Jong-Hyun Choi ,  Dong-Il Seo ,  Yong-Gu Kang ,  Jung-Yong Choi ,  Young-Hun Seo

    IPC分类号： G11C7/00

    CPC分类号： G01K7/01

    摘要： A temperature sensor instruction signal generator, which may drive a temperature sensor, and a semiconductor memory device including the same. The temperature sensor instruction signal generator may generate an instruction signal that instruct the operation of the temperature sensor using at least one of a master clock (CLK) signal, a clock enable (CKE) signal, a row address selection (RAS) signal, a column address selection (CAS) signal, a write enable (WE) signal, and a chip selection (CS) signal, wherein the instruction signal may be enabled corresponding to at least one of a self refresh mode, an auto refresh mode, and a long tRAS mode. The semiconductor memory device may include a temperature sensor and the temperature sensor instruction signal generator.

    摘要翻译： 可以驱动温度传感器的温度传感器指令信号发生器和包括该温度传感器的半导体存储器件。 温度传感器指令信号发生器可以使用主时钟（CLK）信号，时钟使能（CKE）信号，行地址选择（RAS）信号， 列地址选择（CAS）信号，写使能（WE）信号和芯片选择（CS）信号，其中所述指令信号可以对应于自刷新模式，自动刷新模式和 长tRAS模式。 半导体存储器件可以包括温度传感器和温度传感器指令信号发生器。

    Controlling execution of additional function during a refresh operation in a semiconductor memory device
    4.
    发明授权
    Controlling execution of additional function during a refresh operation in a semiconductor memory device 有权
    在半导体存储器件的刷新操作期间控制附加功能的执行

    公开(公告)号：US07701795B2

    公开(公告)日：2010-04-20

    申请号：US11811601

    申请日：2007-06-11

    申请人： Dong-Woo Lee ,  Jung-Yong Choi

    发明人： Dong-Woo Lee ,  Jung-Yong Choi

    IPC分类号： G11C7/00

    CPC分类号： G11C11/406 ,  G11C7/04 ,  G11C7/1045 ,  G11C7/1048 ,  G11C7/1051 ,  G11C7/1069 ,  G11C11/40603 ,  G11C11/40626 ,  G11C11/4093

    摘要： A semiconductor memory device includes a mode register, an additional function executer, and an additional function controller. The mode register activates an additional function control signal when a mode register set code indicates that an additional function is to be executed concurrently with a refresh operation. The additional function controller controls the additional function executer to carry out the additional function concurrently with the refresh operation when the additional function control signal is activated.

    摘要翻译： 半导体存储器件包括模式寄存器，附加功能执行器和附加功能控制器。 当模式寄存器组代码指示要与刷新操作同时执行附加功能时，模式寄存器激活附加功能控制信号。 当附加功能控制信号被激活时，附加功能控制器控制附加功能执行器与刷新操作同时执行附加功能。

    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    5.
    发明授权
    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same 失效
    被配置为检测其温度传感器的故障的存储器件及其操作和测试方法

    公开(公告)号：US07324398B2

    公开(公告)日：2008-01-29

    申请号：US11236372

    申请日：2005-09-27

    申请人： Jae-Eung Shim ,  Jung-Yong Choi ,  Young-Gu Kang ,  Min-Gyu Hwang

    发明人： Jae-Eung Shim ,  Jung-Yong Choi ,  Young-Gu Kang ,  Min-Gyu Hwang

    IPC分类号： G11C7/04

    CPC分类号： G11C29/023 ,  G11C11/406 ,  G11C11/40615 ,  G11C11/40626 ,  G11C29/02 ,  G11C2029/5002

    摘要： A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

    摘要翻译： 存储器装置包括：温度传感器，被配置为响应于存储器件的温度产生温度检测信号;以及自刷新控制电路，被配置为根据温度检测信号控制存储器件的刷新。 该装置还包括温度检测误差感测电路，其配置为响应温度检测信号的误差来声明温度检测误差信号。 温度检测误差感测电路可以被配置为在被配置为耦合到外部设备的温度检测误差感测板处提供断言的温度检测误差信号，和/或该设备还可以包括温度传感器控制 配置为响应于温度检测误差信号来控制温度检测信号的电路。 可以提供相关的操作和测试方法。

    Semiconductor memory device having self refresh mode and related method of operation
    7.
    发明授权
    Semiconductor memory device having self refresh mode and related method of operation 有权
    具有自刷新模式和相关操作方法的半导体存储器件

    公开(公告)号：US07190628B2

    公开(公告)日：2007-03-13

    申请号：US11328237

    申请日：2006-01-10

    申请人： Jung-Yong Choi ,  Young-Gu Kang ,  Ki-Ho Jang

    发明人： Jung-Yong Choi ,  Young-Gu Kang ,  Ki-Ho Jang

    IPC分类号： G11C7/00

    CPC分类号： G11C11/406 ,  G11C11/40615 ,  G11C2211/4067

    摘要： A semiconductor memory device supporting a self refresh operation is disclosed and comprises an address buffer unit and an operation control unit. The address buffer unit may be enabled during the self refresh operation by a first external control signal to generate an internal address signal. The operation control unit controls the start of the self refresh operation in response to the internal address signal.

    摘要翻译： 公开了一种支持自刷新操作的半导体存储器件，包括地址缓冲器单元和操作控制单元。 地址缓冲单元可以在自刷新操作期间由第一外部控制信号使能以产生内部地址信号。 操作控制单元响应于内部地址信号控制自刷新操作的开始。

    Methods of Communicating Data Using Inversion and Related Systems
    8.
    发明申请
    Methods of Communicating Data Using Inversion and Related Systems 审中-公开
    使用反演和相关系统通信数据的方法

    公开(公告)号：US20110113168A1

    公开(公告)日：2011-05-12

    申请号：US13008340

    申请日：2011-01-18

    申请人： Jung-Yong Choi ,  Dong-Woo Lee

    发明人： Jung-Yong Choi ,  Dong-Woo Lee

    IPC分类号： G06F13/38

    CPC分类号： G06F13/4217 ,  Y02D10/14 ,  Y02D10/151

    摘要： A method may be provided to communicate a plurality of groups of output data bits representing a respective plurality of groups of input data bits over a data bus with each group of output data bits and each group of input data bits have an equal data width. Each of the plurality of groups of input data bits at may be received at a data register. For each group of input data bits received at the data register, if a number of data bits of the group of input data bits having a first logic level is greater than half of the data width, the group of input data bits are inverted, the inverted group of input data bits are transmitted as a respective group of output data bits in parallel over the data bus, and an inversion flag associated with the respective group of output data bits is transmitted. For each group of input data bits received at the data register, if a number of data bits of the group of input data bits having a second logic level different than the first logic level is greater than half of the data width, the group of input data bits is transmitted without inversion as a respective group of output data bits in parallel over the data bus, and a non-inversion flag associated with the respective group of output data bits is transmitted. Related systems are also discussed.

    摘要翻译： 可以提供一种方法，以通过数据总线与每组输出数据位和每组输入数据位具有相等的数据宽度来传送表示相应多组输入数据位的多组输出数据位。 多个输入数据组中的每一组可以在数据寄存器处被接收。 对于在数据寄存器处接收的每组输入数据位，如果具有第一逻辑电平的输入数据位组组中的数据位的数目大于数据宽度的一半，则输入数据位组被反转， 输出数据位的反相组作为数据总线上的并行输出数据位组发送，并且发送与各组输出数据位相关联的反转标志。 对于在数据寄存器处接收的每组输入数据位，如果具有与第一逻辑电平不同的第二逻辑电平的输入数据位组组中的数据位数大于数据宽度的一半，则输入组 数据位在数据总线上并行发送而不反转为相应的输出数据位组，并且发送与各组输出数据位相关联的非反转标志。 还讨论了相关系统。

    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    9.
    发明申请
    Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same 失效
    被配置为检测其温度传感器的故障的存储器件及其操作和测试方法

    公开(公告)号：US20060077742A1

    公开(公告)日：2006-04-13

    申请号：US11236372

    申请日：2005-09-27

    申请人： Jae-Eung Shim ,  Jung-Yong Choi ,  Young-Gu Kang ,  Min-Gyu Hwang

    发明人： Jae-Eung Shim ,  Jung-Yong Choi ,  Young-Gu Kang ,  Min-Gyu Hwang

    IPC分类号： G11C7/00

    CPC分类号： G11C29/023 ,  G11C11/406 ,  G11C11/40615 ,  G11C11/40626 ,  G11C29/02 ,  G11C2029/5002

    摘要： A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

    摘要翻译： 存储装置包括：温度传感器，被配置为响应于存储器件的温度产生温度检测信号;以及自刷新控制电路，被配置为根据温度检测信号控制存储器件的刷新。 该装置还包括温度检测误差感测电路，其配置为响应温度检测信号的误差来声明温度检测误差信号。 温度检测误差感测电路可以被配置为在被配置为耦合到外部设备的温度检测误差感测板处提供断言的温度检测误差信号，和/或该设备还可以包括温度传感器控制 配置为响应于温度检测误差信号来控制温度检测信号的电路。 可以提供相关的操作和测试方法。

    Semiconductor memory device having self refresh mode and related method of operation
    10.
    发明申请
    Semiconductor memory device having self refresh mode and related method of operation 有权
    具有自刷新模式和相关操作方法的半导体存储器件

    公开(公告)号：US20060164903A1

    公开(公告)日：2006-07-27

    申请号：US11328237

    申请日：2006-01-10

    申请人： Jung-Yong Choi ,  Young-Gu Kang ,  Ki-Ho Jang

    发明人： Jung-Yong Choi ,  Young-Gu Kang ,  Ki-Ho Jang

    IPC分类号： G11C7/00

    CPC分类号： G11C11/406 ,  G11C11/40615 ,  G11C2211/4067

    摘要： A semiconductor memory device supporting a self refresh operation is disclosed and comprises an address buffer unit and an operation control unit. The address buffer unit may be enabled during the self refresh operation by a first external control signal to generate an internal address signal. The operation control unit controls the start of the self refresh operation in response to the internal address signal.

    摘要翻译： 公开了一种支持自刷新操作的半导体存储器件，包括地址缓冲器单元和操作控制单元。 地址缓冲单元可以在自刷新操作期间由第一外部控制信号使能以产生内部地址信号。 操作控制单元响应于内部地址信号控制自刷新操作的开始。