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1.
公开(公告)号:US12198902B2
公开(公告)日:2025-01-14
申请号:US17432003
申请日:2020-03-03
Applicant: Lam Research Corporation
Inventor: Lin Xu , John Daugherty , Satish Srinivasan , David Joseph Wetzel
IPC: B32B15/04 , B32B17/06 , H01J37/32 , C23C24/04 , H01L21/687
Abstract: An apparatus adapted for use in a plasma processing chamber is provided. An aluminum body with at least one surface is provided. An aluminum oxide containing aerosol deposition coating is disposed over the at least one surface of the aluminum body. An yttrium containing aerosol deposition coating is disposed over the aluminum oxide containing aerosol deposition coating.
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公开(公告)号:US12129569B2
公开(公告)日:2024-10-29
申请号:US17795509
申请日:2021-02-16
Applicant: Lam Research Corporation
Inventor: Lin Xu , David Joseph Wetzel , John Daugherty , Hong Shih , Satish Srinivasan , Yuanping Song , Johnny Pham , Yiwei Song , Christopher Kimball
CPC classification number: C25D7/04 , C25D3/44 , C25D5/48 , C25D11/08 , H01J37/32642 , H01J37/32715 , H01L21/6833 , H01J2237/2007 , H01J2237/334 , Y10T428/12542 , Y10T428/12576 , Y10T428/12583 , Y10T428/12667 , Y10T428/12806
Abstract: A method for making a component for use in a semiconductor processing chamber is provided. A component body is formed from a conductive material having a coefficient of thermal expansion of less than 10.0×10−6/K. A metal oxide layer is then disposed over a surface of the component body.
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公开(公告)号:US10725485B2
公开(公告)日:2020-07-28
申请号:US15824447
申请日:2017-11-28
Applicant: LAM RESEARCH CORPORATION
Inventor: David Joseph Wetzel , Alexander Bleakie , Jacob Frederick Theisen
Abstract: A temperature controller for a substrate support in a substrate processing system includes a power parameter module configured to calculate a power parameter indicative of power supplied to the substrate support. A coolant temperature parameter module configured to calculate a coolant temperature parameter indicative of a temperature of a coolant supplied to the substrate support. A heat transfer gas parameter module is configured to calculate a heat transfer gas parameter indicative of flow rates of a heat transfer gas supplied to the substrate support. A temperature calculation module is configured to calculate a temperature of the substrate support using the power parameter, the coolant temperature parameter, and the heat transfer gas parameter.
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