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    Distance measuring apparatus and method
    1.
    发明授权
    Distance measuring apparatus and method 失效
    距离测量装置和方法

    公开(公告)号：US5122991A

    公开(公告)日：1992-06-16

    申请号：US551476

    申请日：1990-07-12

    申请人： Masahiro Koike ,  Sigeru Kajiyama ,  Toshiyuki Furukawa ,  Kazuo Takaku ,  Toshiyuki Sawa

    发明人： Masahiro Koike ,  Sigeru Kajiyama ,  Toshiyuki Furukawa ,  Kazuo Takaku ,  Toshiyuki Sawa

    IPC分类号： G01B17/00 ,  G01N29/12 ,  G01N29/44 ,  G01S11/14 ,  G01S15/08

    CPC分类号： G01N29/12 ,  G01N29/4454 ,  G01S11/14 ,  G01N2291/02854 ,  G01N2291/2695

    摘要： A distance measuring apparatus and method using an acoustic signal. It includes a transmitting probe for transmitting an acoustic signal from a transmitter, a plurality of receiving probes having resonance frequencies different from the central frequency of the signal transmitted from the transmitting probe, and a control circuit for controlling the functions of those probes. The acoustic signal is received by a receiving probe having a resonance frequency which provides the maximum received-signal sensitivity at the central frequency of the received acoustic signal under the control of the control circuit to thereby measure a long distance accurately.

    摘要翻译： 一种使用声学信号的距离测量装置和方法。 它包括用于从发射机发送声信号的发射探头，具有与从发射探头发送的信号的中心频率不同的谐振频率的多个接收探头，以及用于控制那些探测器的功能的控制电路。 声信号由具有谐振频率的接收探头接收，该谐振频率在控制电路的控制下在所接收的声信号的中心频率处提供最大接收信号灵敏度，从而精确地测量长距离。

    SEMICONDUCTOR DEVICE
    3.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号：US20100244157A1

    公开(公告)日：2010-09-30

    申请号：US12710851

    申请日：2010-02-23

    申请人： Izumi HIRANO ,  Yuichiro Mitani ,  Tatsuo Shimizu ,  Yasushi Nakasaki ,  Akiko Masada ,  Shigeto Fukatsu ,  Masahiro Koike

    发明人： Izumi HIRANO ,  Yuichiro Mitani ,  Tatsuo Shimizu ,  Yasushi Nakasaki ,  Akiko Masada ,  Shigeto Fukatsu ,  Masahiro Koike

    IPC分类号： H01L29/78

    CPC分类号： H01L29/7833 ,  H01L21/28079 ,  H01L29/4958 ,  H01L29/513 ,  H01L29/518 ,  H01L29/665 ,  H01L29/6659

    摘要： A semiconductor device includes a MISFET comprising: a semiconductor layer including a semiconductor region formed therein; a gate insulating film formed above the semiconductor region, and including a metal oxide layer containing a metal and oxygen, the metal contained in the metal oxide layer being at least one selected from Hf and Zr, the metal oxide layer further including at least one element selected from the group consisting of Ru, Cr, Os, V, Tc, and Nb, the metal oxide layer having sites that capture or release charges formed by inclusion of the element, density of the element in the metal oxide layer being in the range of 1×1015 cm−3 to 2.96×1020 cm−3, the sites being distributed to have a peak closer to the semiconductor region than to a center of the metal oxide layer; and a gate electrode formed on the gate insulating film.

    摘要翻译： 半导体器件包括：MISFET，包括：半导体层，包括形成在其中的半导体区域; 形成在所述半导体区域上方的栅极绝缘膜，并且包括含有金属和氧的金属氧化物层，所述金属氧化物层中所含的金属为选自Hf和Zr中的至少一种，所述金属氧化物层还包含至少一种元素 选自Ru，Cr，Os，V，Tc和Nb的金属氧化物层，金属氧化物层具有捕获或释放由元素包含形成的电荷的部位，金属氧化物层中的元素的密度在该范围内 1×1015cm-3至2.96×1020cm-3，这些位置被分配成具有比金属氧化物层的中心更靠近半导体区域的峰; 以及形成在栅极绝缘膜上的栅电极。

    Eddy current testing probe and eddy current testing apparatus
    4.
    发明授权
    Eddy current testing probe and eddy current testing apparatus 有权
    涡流测试探头和涡流测试仪

    公开(公告)号：US07235967B2

    公开(公告)日：2007-06-26

    申请号：US11326510

    申请日：2006-01-06

    申请人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    发明人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    IPC分类号： G01R33/12

    CPC分类号： G01N27/9013 ,  G01N27/904

    摘要： An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.

    摘要翻译： 涡流测试探针具有适于面向测试物品的表面的柔性基底，多个线圈，其固定到柔性基底并被激励，其中一个可以顺序地改变;用于按压基底的按压部件 朝向测试物品，布置在基底和按压构件之间的弹性构件和用于限制按压构件朝向测试物品移动的移动限制构件。

    Spheroidizing agent of graphite
    5.
    发明申请
    Spheroidizing agent of graphite 审中-公开
    石墨球化剂

    公开(公告)号：US20070134149A1

    公开(公告)日：2007-06-14

    申请号：US11529215

    申请日：2006-09-29

    申请人： Masahiro Koike ,  Makoto Kitamura

    发明人： Masahiro Koike ,  Makoto Kitamura

    IPC分类号： C01F17/00 ,  C01B33/00 ,  C09C1/62 ,  C01B31/04

    CPC分类号： C21C1/105 ,  B22D1/00 ,  B22D27/20 ,  C01B32/20

    摘要： A graphite spheroidizing agent capable of spheroidizing graphite while preventing formation of chunky graphite is provided. The graphite spheroidizing agent of the present invention comprising silicon, magnesium, calcium and rare earth elements, wherein the graphite spheroidizing agent contains rare earth elements of 0.6 to 3.0 mass % and a calcium content of 1.3 to 4.0 mass %, respectively, relative to the total amount thereof, and a percentage of lanthanum in the rare earth elements is 50 mass % or more.

    摘要翻译： 提供一种能够防止形成大块石墨同时球化石墨的石墨球化剂。 包含硅，镁，钙和稀土元素的本发明的石墨球化剂，其中石墨球化剂分别含有0.6〜3.0质量％的稀土元素和1.3〜4.0质量％的钙含量，相对于 其总量和稀土元素中的镧的百分比为50质量％以上。

    Eddy current testing probe and eddy current testing apparatus
    7.
    发明申请
    Eddy current testing probe and eddy current testing apparatus 有权
    涡流测试探头和涡流测试仪

    公开(公告)号：US20060170420A1

    公开(公告)日：2006-08-03

    申请号：US11326510

    申请日：2006-01-06

    申请人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    发明人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    IPC分类号： G01R33/12

    CPC分类号： G01N27/9013 ,  G01N27/904

    摘要： An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.

    摘要翻译： 涡流测试探针具有适于面向测试物品的表面的柔性基底，多个线圈，其固定到柔性基底并被激励，其中一个可以顺序地改变;用于按压基底的按压部件 朝向测试物品，布置在基底和按压构件之间的弹性构件和用于限制按压构件朝向测试物品移动的移动限制构件。

    Diagnosis system
    9.
    发明授权
    Diagnosis system 失效
    诊断系统

    公开(公告)号：US5748496A

    公开(公告)日：1998-05-05

    申请号：US700043

    申请日：1996-08-20

    申请人： Fuminobu Takahashi ,  Masahiro Koike ,  Shunsuke Uchida ,  Haruo Fujimori ,  Izumi Yamada ,  Takaharu Fukuzaki ,  Makoto Nagase

    发明人： Fuminobu Takahashi ,  Masahiro Koike ,  Shunsuke Uchida ,  Haruo Fujimori ,  Izumi Yamada ,  Takaharu Fukuzaki ,  Makoto Nagase

    IPC分类号： G01M99/00 ,  G05B23/02 ,  G21C17/00 ,  G21C7/36

    CPC分类号： G21C17/00 ,  G05B23/0227 ,  G05B23/0272 ,  Y10S706/912 ,  Y10S706/915

    摘要： A diagnosis system having sensors for supervising a plant, signal processors for processing signals of the sensors, and a state quantity arithmetic operation unit. The state quantity arithmetic operation unit calculates a quantity of state expressing the environment of the plant on the basis of supervisory information inputted through the signal processors. A state quantity prediction unit predictively calculates a quantity of state after a predetermined time on the basis of the quantity of state, supervisory information and a time change of the quantity of state inputted through the state quantity arithmetic operation unit. A future event prediction unit predicts a future event on the basis of predicted information of the quantity of state inputted through the state quantity prediction unit. An image information processor converts the quantity of state given by the state quantity arithmetic operation unit into image information and indicates the image information on a display unit. An image information processor converts the predicted quantity of state after the predetermined time, given by the state quantity prediction unit, into image information and indicates the image information on a display unit. An image information processor converts the future event predicted by the future event prediction unit into image information and indicates the image information on a display unit.

    摘要翻译： 具有用于监视设备的传感器，用于处理传感器的信号的信号处理器以及状态量算术运算单元的诊断系统。 状态量算术运算部根据通过信号处理部输入的监视信息来计算表示工厂环境的状态量。 状态量预测单元基于通过状态量算术运算单元输入的状态量，监视信息和状态量的时间变化，预测计算了预定时间之后的状态量。 未来事件预测单元基于通过状态量预测单元输入的状态量的预测信息来预测未来事件。 图像信息处理器将由状态量算术运算单元给出的状态量转换为图像信息，并在显示单元上指示图像信息。 图像信息处理器将由状态量预测单元给出的预定时间之后的预测状态量转换为图像信息，并在显示单元上指示图像信息。 图像信息处理器将未来事件预测单元预测的未来事件转换成图像信息，并在显示单元上指示图像信息。