Electrolytic processing method
    1.
    发明申请
    Electrolytic processing method 审中-公开
    电解加工方法

    公开(公告)号:US20070034525A1

    公开(公告)日:2007-02-15

    申请号:US11203545

    申请日:2005-08-12

    IPC分类号: B23H9/00

    CPC分类号: B23H5/08

    摘要: An electrolytic processing method is used to remove a metal film formed on a surface of a substrate. The electrolytic processing method includes providing a feeding electrode 31 and a processing electrode 32 on a table 12, providing an insulating member 36 between the feeding electrode and the processing electrode, holding the substrate W by a substrate carrier 11, bringing the substrate into contact with the insulating member, supplying first and second electrolytic processing liquids to gaps between the feeding electrode and the substrate and between the processing electrode and the substrate, respectively, while the first and second electrolytic processing liquids are electrically isolated, applying voltage between the feeding electrode and the processing electrode, and making a relative movement between the substrate carrier and the table to electrically process the metal film.

    摘要翻译: 使用电解处理方法去除在基板的表面上形成的金属膜。 电解处理方法包括在台12上设置馈电电极31和处理电极32,在馈电电极和处理电极之间提供绝缘构件36,通过衬底载体11保持衬底W,使衬底与 所述绝缘构件在所述第一和第二电解处理液体被电绝缘的同时,在所述馈电电极和所述衬底之间以及所述处理电极和所述衬底之间的间隙中分别供应第一和第二电解处理液体, 处理电极,并且在基板载体和工作台之间进行相对运动以对金属膜进行电加工。

    Electrolytic processing apparatus
    2.
    发明申请
    Electrolytic processing apparatus 审中-公开
    电解处理装置

    公开(公告)号:US20070034502A1

    公开(公告)日:2007-02-15

    申请号:US11202899

    申请日:2005-08-12

    IPC分类号: C25D17/00

    摘要: An electrolytic processing apparatus is used to remove a metal film formed on a surface of a substrate. The electrolytic processing apparatus includes a feeding electrode 31 for feeding electricity to a metal film 6 on a substrate W, a processing electrode 32 for processing the metal film 6, a substrate carrier 11 for holding the substrate W, a first supply passage 51 for supplying a first electrolytic processing liquid, a second supply passage 52 for supplying a second electrolytic processing liquid, an insulating member 36 for electrically isolating the first electrolytic processing liquid and the second electrolytic processing liquid, a table 12 on which the feeding electrode 31, the processing electrode 32, and the insulating member 36 are disposed, and a relative movement mechanism 17 for making a relative movement between the table 12 and the substrate carrier 11.

    摘要翻译: 使用电解处理装置去除形成在基板表面上的金属膜。 该电解处理装置包括用于向基板W上的金属膜6供电的供电电极31,用于处理金属膜6的处理电极32,用于保持基板W的基板载体11,用于供给的第一供给通道51 第一电解处理液,用于供给第二电解处理液的第二供应通道52,用于电隔离第一电解处理液和第二电解处理液的绝缘构件36,供给电极31,处理 电极32和绝缘部件36,以及用于在工作台12和基板载体11之间进行相对移动的相对移动机构17。

    Chemical mechanical polishing endpoint detection system and method
    3.
    发明授权
    Chemical mechanical polishing endpoint detection system and method 失效
    化学机械抛光终点检测系统及方法

    公开(公告)号:US06913514B2

    公开(公告)日:2005-07-05

    申请号:US10602034

    申请日:2003-06-23

    IPC分类号: B24B37/20 B24B49/12 B24D7/12

    CPC分类号: B24B37/205 B24B49/12

    摘要: The system includes a polishing pad, a pad height sensor; a window; and a window raising mechanism. The polishing pad has an aperture with the window vertically moveable therein. The pad height sensor is positioned above the polishing pad and measures the vertical position of the pad before polishing. The window raising mechanism adjusts the vertical position of the window based on information from the pad height sensor. An endpoint measurement sensor can be disposed beneath the window for in-situ measurement of the polishing process.

    摘要翻译: 该系统包括抛光垫,垫高度传感器; 一个窗口; 和升起机构。 抛光垫具有孔,其中窗可在其中垂直移动。 焊盘高度传感器位于抛光垫的上方,并在抛光之前测量焊盘的垂直位置。 窗口提升机构根据来自垫高度传感器的信息来调整窗口的垂直位置。 端点测量传感器可以设置在窗户下方,用于原位测量抛光过程。

    Substrate processing apparatus and method
    8.
    发明申请
    Substrate processing apparatus and method 审中-公开
    基板加工装置及方法

    公开(公告)号:US20070187259A1

    公开(公告)日:2007-08-16

    申请号:US11715971

    申请日:2007-03-09

    IPC分类号: B23H5/00

    CPC分类号: H01L21/6708 C25F3/00 C25F7/00

    摘要: A substrate processing apparatus can perform an electrolytic processing, which is different from a common, conventional etching, to remove (clean off) a conductive material (film) formed on or adhering to a bevel portion, etc. of a substrate, or process a peripheral portion of a substrate through an electrochemical action. The substrate processing apparatus includes: an electrode section having a plurality of electrodes which are laminated with insulators being interposed, and having a holding portion which is to be opposed to a peripheral portion of a substrate; an ion exchanger disposed in the holding portion of the electrode section; a liquid supply section for supplying a liquid to the holding position of the electrode section; and a power source for applying a voltage to the electrodes of the electrode section so that the electrodes alternately have different polarities.

    摘要翻译: 基板处理装置可以执行与普通的常规蚀刻不同的电解处理,以去除(清除)形成在或附着于基板的斜面部分等上的导电材料(膜)或处理 通过电化学作用的衬底的周边部分。 基板处理装置包括:具有多个电极的电极部,该多个电极层叠有绝缘体,并且具有与基板的周边部相对的保持部; 设置在电极部的保持部中的离子交换部; 液体供应部分,用于将液体供应到电极部分的保持位置; 以及用于向电极部分的电极施加电压使得电极交替具有不同极性的电源。

    SUBSTRATE POLISHING APPARATUS AND METHOD
    9.
    发明申请
    SUBSTRATE POLISHING APPARATUS AND METHOD 有权
    基板抛光装置和方法

    公开(公告)号:US20090291624A1

    公开(公告)日:2009-11-26

    申请号:US12534465

    申请日:2009-08-03

    IPC分类号: B24B37/04 B24B41/06

    摘要: A substrate polishing apparatus includes a substrate holding mechanism having a head for holding a substrate to be polished, and a polishing mechanism including a polishing table with a polishing pad mounted thereon. The substrate held by the head is pressed against the polishing pad on the polishing table to polish the substrate by relative movement of the substrate and the polishing pad. The substrate polishing apparatus also includes a substrate transfer mechanism for delivering the substrate to be polished to the head and receiving the polished substrate. The substrate transfer mechanism includes a substrate to-be-polished receiver for receiving the substrate to be polished, and a polished substrate receiver for receiving the substrate which has been polished.

    摘要翻译: 一种基板研磨装置,具备:具有保持被研磨基板的头部的基板保持机构,以及具备安装有研磨垫的研磨台的研磨机构。 由头部保持的基板被压靠在抛光台上的抛光垫上,以通过基板和抛光垫的相对运动来抛光基板。 基板抛光装置还包括用于将要抛光的基板输送到头部并且接收经抛光的基板的基板传送机构。 基板转印机构包括用于接收待抛光的基板的待抛光基板和用于接收被抛光的基板的抛光的基板接收器。

    Electrolytic processing apparatus and substrate processing apparatus and method
    10.
    发明授权
    Electrolytic processing apparatus and substrate processing apparatus and method 失效
    电解处理装置及基板处理装置及方法

    公开(公告)号:US07569135B2

    公开(公告)日:2009-08-04

    申请号:US11723934

    申请日:2007-03-22

    IPC分类号: C25F3/16 B23H5/06

    摘要: The present invention replaces all or a portion of substrate processing by chemical-mechanical polishing with electrolytic processing using deionized water, ultrapure water or the like. An electrolytic processing apparatus comprises: a chemical-mechanical polishing section for chemically-mechanically polishing a surface of a substrate; an electrolytic processing section having a processing electrode and a feeding electrode, and also having an ion exchanger provided at least either between the substrate and the processing electrode or between the substrate and the feeding electrode, for electrolytically processing a surface of a workpiece under existence of a solution by applying a voltage between the processing electrode and the feeding electrode; and a top ring capable of freely moving between the chemical-mechanical polishing section and the processing electrode section.

    摘要翻译: 本发明通过使用去离子水,超纯水等的电解处理通过化学机械抛光来代替基板处理的全部或一部分。 电解处理设备包括:化学机械抛光部分,用于对基材的表面进行化学机械抛光; 具有处理电极和供电电极的电解处理部分,并且还具有设置在基板和处理电极之间或者基板和供电电极之间的至少一个的离子交换器,用于在存在的工件的表面进行电解处理 通过在处理电极和馈电电极之间施加电压的解决方案; 以及能够在所述化学机械抛光部和所述处理电极部之间自由移动的顶环。