Inspection chip equipped with a light amplifier element
    9.
    发明授权
    Inspection chip equipped with a light amplifier element 有权
    检测芯片配有光放大器元件

    公开(公告)号:US08354073B2

    公开(公告)日:2013-01-15

    申请号:US11628306

    申请日:2005-05-23

    IPC分类号: G01N15/06 G01N33/00 G01N33/48

    摘要: The present invention provides an inspection chip using light, which is able to provide an irradiation of light at a high precision. The present invention further provides an inspection chip capable of carrying out the inspection of a sample in a simple manner by using a plurality of lights.The inspection chip of the present invention comprises a light amplifier element and a sample holding section for holding a sample, in which the light amplifier element is oriented so as to face to the sample holding section, so that the light emitted from the light amplifier element can irradiate the sample held in the sample holding section.

    摘要翻译: 本发明提供一种使用光的检查芯片,其能够以高精度提供光的照射。 本发明还提供一种能够通过使用多个灯以简单的方式进行样品检查的检查芯片。 本发明的检查芯片包括光放大器元件和用于保持样品的样品保持部分,其中光放大器元件被定向成面向样品保持部分,使得从光放大器元件发射的光 可以照射保持在样品保持部中的样品。