公开(公告)号：US20200210330A1

公开(公告)日：2020-07-02

申请号：US16234271

申请日：2018-12-27

Applicant: Micron Technology, Inc.

Inventor： Kishore Kumar MUCHHERLA ,  Sampath K. RATNAM ,  Ashutosh MALSHE ,  Peter Sean FEELEY

IPC: G06F12/02

Abstract: A processing device in a memory system determines whether a first data block of a plurality of data blocks on the memory component satisfies a first threshold criterion pertaining to a first number of the plurality of data blocks having a lower amount of valid data than a remainder of the plurality of data blocks. Responsive to the first data block satisfying the first threshold criterion, the processing device determines whether the first data block satisfies a second threshold criterion pertaining to a second number of the plurality of data blocks having been written to more recently than the remainder of the plurality of data blocks. Responsive to the first data block satisfying the second threshold criterion, the processing device determines whether a rate of change of an amount of valid data on the first data block satisfies a third threshold criterion. Responsive to the rate of change satisfying the third threshold criterion, the processing device identifies the first data block as a candidate for garbage collection on the memory component.

公开(公告)号：US20220383955A1

公开(公告)日：2022-12-01

申请号：US17883538

申请日：2022-08-08

Applicant: Micron Technology, Inc.

Inventor： Kishore Kumar MUCHHERLA ,  Sampath K. RATNAM ,  Shane NOWELL ,  Sivagnanam PARTHASARATHY ,  Mustafa N. KAYNAK ,  Karl D. SCHUH ,  Peter FEELEY ,  Jiangang WU

IPC: G11C16/10 ,  G11C16/20 ,  G11C16/32 ,  G11C16/30 ,  G11C16/26 ,  G11C16/34

Abstract: A processing device of a memory sub-system is configured to detect a power on event that is associated with a memory device and indicates that power has been restored to the memory device; estimate a duration of a power off state preceding the power on event associated with the memory device; and update voltage bin assignments of a plurality of blocks associated with the memory device based on the duration of the power off state.

公开(公告)号：US20220334752A1

公开(公告)日：2022-10-20

申请号：US17233317

申请日：2021-04-16

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Kishore Kumar MUCHHERLA ,  Sampath K RATNAM ,  Shane NOWELL ,  Peter FEELEY ,  Sivagnanam Parthasarathy ,  Mustafa N Kaynak

IPC: G06F3/06

Abstract: A processing device of a memory sub-system is configured to identify a plurality of blocks assigned to a first voltage bin of a plurality of voltage bins of a memory device; identify a subset of the plurality of blocks having a time after program (TAP) within a predetermined threshold period of time from a second TAP associated with a transition boundary between the first voltage bin and a subsequent voltage bin of the plurality of voltage bins; determine a threshold voltage offset associated with the subset of blocks; and associate the threshold voltage offset with the subsequent voltage bin.

公开(公告)号：US20220300415A1

公开(公告)日：2022-09-22

申请号：US17834794

申请日：2022-06-07

Applicant: Micron Technology, Inc.

Inventor： Kishore Kumar MUCHHERLA ,  Renato C. PADILLA ,  Sampath K. RATNAM ,  Saeed SHARIFI TEHRANI ,  Peter FEELEY ,  Kevin R. BRANDT

IPC: G06F12/02 ,  G06F12/121 ,  G06F3/06

Abstract: A total estimated occupancy value of a first data on a first data block of a plurality of data blocks is determined. To determine the total estimated occupancy value of the first data block, a total block power-on-time (POT) value of the first data block is determined. Then, a scaling factor is applied to the total block POT value to determine the total estimated occupancy value of the first data block. Whether the total estimated occupancy value of the first data block satisfies a threshold criterion is determined. Responsive to determining that the total estimated occupancy value of the first data block satisfies the threshold criterion, data stored at the first data block is relocated to a second data block of the plurality of data blocks.

公开(公告)号：US20220293208A1

公开(公告)日：2022-09-15

申请号：US17198755

申请日：2021-03-11

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Kishore Kumar MUCHHERLA ,  Mustafa N. KAYNAK ,  Sivagnanam PARTHASARATHY ,  Xiangang LUO ,  Peter FEELEY ,  Devin M. BATUTIS ,  Jiangang WU ,  Sampath K RATNAM ,  Shane NOWELL ,  Karl D. Schuh

IPC: G11C29/50 ,  G06F12/02 ,  G11C7/10 ,  G11C29/02 ,  G11C16/26

Abstract: A voltage calibration scan is initiated. A first value of a data state metric measured for a sample block of a memory device based on associated with a first bin of blocks designated as a current is received. The first value is designated as a minimum value. A second value of the data state metric for the sample block is measured based on a set of read voltage offsets associated with a second bin of blocks having an index value higher than the current bin. In response to determining that the second value exceeds the first value, the first bin is maintained as the current bin and the voltage calibration scan is stopped.