Patterning method
    7.
    发明授权
    Patterning method 有权
    图案化方法

    公开(公告)号:US08748323B2

    公开(公告)日:2014-06-10

    申请号:US12217645

    申请日:2008-07-07

    摘要: A patterning method is provided. First, a substrate having an objective material layer thereon is provided. Thereafter, a mask layer is formed on the objective material layer. Afterwards, a patterned layer is formed over the mask layer, wherein a material of the patterned layer includes a metal-containing substance. Then, the mask layer is patterned to form a patterned mask layer. Further, the objective material layer is patterned, using the patterned mask layer as a mask.

    摘要翻译: 提供了图案化方法。 首先,提供其上具有目标材料层的基板。 此后,在目标材料层上形成掩模层。 之后,在掩模层上形成图案层,其中图案化层的材料包括含金属的物质。 然后,将掩模层图案化以形成图案化掩模层。 此外,使用图案化掩模层作为掩模来对目标材料层进行图案化。

    Patterning method
    8.
    发明申请
    Patterning method 有权
    图案化方法

    公开(公告)号:US20100000969A1

    公开(公告)日:2010-01-07

    申请号:US12217645

    申请日:2008-07-07

    IPC分类号: C23F1/00

    摘要: A patterning method is provided. First, a substrate having an objective material layer thereon is provided. Thereafter, a mask layer is formed on the objective material layer. Afterwards, a patterned layer is formed over the mask layer, wherein a material of the patterned layer includes a metal-containing substance. Then, the mask layer is patterned to form a patterned mask layer. Further, the objective material layer is patterned, using the patterned mask layer as a mask.

    摘要翻译: 提供了图案化方法。 首先,提供其上具有目标材料层的基板。 此后,在目标材料层上形成掩模层。 之后,在掩模层上形成图案层,其中图案化层的材料包括含金属的物质。 然后,将掩模层图案化以形成图案化掩模层。 此外,使用图案化掩模层作为掩模来对目标材料层进行图案化。

    METHODS OF LOW TEMPERATURE OXIDATION
    9.
    发明申请
    METHODS OF LOW TEMPERATURE OXIDATION 有权
    低温氧化法

    公开(公告)号:US20090286364A1

    公开(公告)日:2009-11-19

    申请号:US12121382

    申请日:2008-05-15

    IPC分类号: H01L21/28 H01L21/336

    摘要: A method for forming a dielectric is provided. The method includes providing a substrate having a silicon-containing semiconductor layer within a process chamber. The process chamber is capable of ionizing a process precursor to a plasma comprising an oxygen-containing element and a fluorocarbon-containing element. A surface portion of the silicon-containing material is oxidized by using the plasma to convert the surface portion into an oxidized dielectric material.

    摘要翻译: 提供了形成电介质的方法。 该方法包括在处理室内提供具有含硅半导体层的衬底。 处理室能够将工艺前体电离到包含含氧元素和含氟烃元素的等离子体中。 通过使用等离子体将含硅材料的表面部分氧化,将表面部分转化为氧化的电介质材料。

    METHODS OF LOW TEMPERATURE OXIDATION
    10.
    发明申请
    METHODS OF LOW TEMPERATURE OXIDATION 审中-公开
    低温氧化法

    公开(公告)号:US20100206230A1

    公开(公告)日:2010-08-19

    申请号:US12769445

    申请日:2010-04-28

    IPC分类号: C23C16/513

    摘要: An apparatus for forming a dielectric layer includes a process chamber configured for disposing a substrate therein, a gas inlet for delivering a mixture gas to the process chamber, and an RF generator for producing a plasma from the mixture gas. The plasma includes an oxygen-containing element and a fluorocarbon-containing element. The apparatus also has a heating element configured for maintaining the chamber temperature at a desired process temperature, for example, at 800° C. or lower, and a connector to a vacuum pump for maintaining a process pressure. The apparatus is configured for using the plasma to convert a surface portion of the substrate into an oxidized dielectric material.

    摘要翻译: 用于形成电介质层的装置包括:被配置为将基板设置在其中的处理室,用于将混合气体输送到处理室的气体入口和用于从混合气体产生等离子体的RF发生器。 等离子体包括含氧元素和含氟烃元素。 该装置还具有加热元件,该加热元件被配置为将室温度维持在期望的处理温度,例如800℃或更低,以及用于维持过程压力的真空泵的连接器。 该装置被配置为使用等离子体将基板的表面部分转换成氧化介电材料。