Abstract:
A write-assist memory includes a memory supply voltage and a column of SRAM cells that is controlled by a pair of bit lines, during a write operation. Additionally, the write-assist memory includes a write-assist unit that is coupled to the memory supply voltage and the column of SRAM cells and has a separable conductive line located between the pair of bit lines that provides a collapsible SRAM supply voltage to the column of SRAM cells based on a capacitive coupling of a control signal in the pair of bit lines, during the write operation. A method of operating a write-assist memory is also provided.
Abstract:
A write-assist memory includes a memory supply voltage and a column of SRAM cells that is controlled by a pair of bit lines, during a write operation. Additionally, the write-assist memory includes a write-assist unit that is coupled to the memory supply voltage and the column of SRAM cells and has a separable conductive line located between the pair of bit lines that provides a collapsible SRAM supply voltage to the column of SRAM cells based on a capacitive coupling of a control signal in the pair of bit lines, during the write operation. A method of operating a write-assist memory is also provided.
Abstract:
A subsystem configured to select the power supply to a static random access memory cell compares the level of a dedicated memory supply voltage to the primary system supply voltage. The subsystem then switches the primary system supply to the SRAM cell when the system voltage is higher than the memory supply voltage with some margin. When the system voltage is lower than the memory supply voltage, with margin, the subsystem switches the memory supply to the SRAM cell. When the system voltage is comparable to the memory supply, the subsystem switches the system voltage to the SRAM cell if performance is a prioritized consideration, but switches the memory supply to the SRAM cell if power reduction is a prioritized consideration. In this manner, the system achieves optimum performance without incurring steady state power losses and avoids timing issues in accessing memory.
Abstract:
Disclosed are devices, systems and/or methods relating to an eight transistor (8T) static random access memory (SRAM) cell, according to one or more embodiments. In one embodiment, an SRAM storage cell is disclosed comprising a word line, a write column select line, a cross-coupled data latch, and a first NMOS switch device serially coupled to a second NMOS switch device. In this embodiment, the gate node of the first NMOS switch device is coupled to the word line, a source node of the first NMOS switch device is coupled to the cross-coupled data latch, a gate node of the second NMOS switch device is coupled to the write column select line, and a source node of the second NMOS switch device is coupled to the cross-coupled data latch.
Abstract:
Disclosed are devices, systems and/or methods relating to an eight transistor (8T) static random access memory (SRAM) cell, according to one or more embodiments. In one embodiment, an SRAM storage cell is disclosed comprising a word line, a write column select line, a cross-coupled data latch, and a first NMOS switch device serially coupled to a second NMOS switch device. In this embodiment, the gate node of the first NMOS switch device is coupled to the word line, a source node of the first NMOS switch device is coupled to the cross-coupled data latch, a gate node of the second NMOS switch device is coupled to the write column select line, and a source node of the second NMOS switch device is coupled to the cross-coupled data latch.