摘要:
A system and method for recycling the electrical energy that has been consumed and converted into unwanted thermal energy. A power source for supplying power to a mobile computing system comprises a rechargeable battery and a semiconductor thermoelectric module coupled to the rechargeable battery and a charring circuit. The thermoelectric module is disposed proximate to a heat generating member of the computing system and operable to sense the thermal energy released by the member and convert it into electrical energy based on Seeback effect. The converted electrical energy can be regulated and stored in the rechargeable battery.
摘要:
A graphics subsystem includes a printed circuit board (PCB), a blower, and a heat sink. A graphics processing unit (GPU) is integrated into the PCB. The PCB is shortened to occupy a portion of the width of the graphics subsystem. The heat sink is coupled to the PCB and/or GPU similarly occupies just a portion of the width of the graphics subsystem. The blower is disposed adjacent to the PCB and heat sink and configured to occupy the full height of the graphics subsystem. The blower is further configured to intake air from both the top side of the graphics subsystem and the bottom side of the graphics subsystem. In this configuration, the blower provides an elevated air flow rate in order to facilitate cooling of the PCB and/or GPU.
摘要:
A method and system for testing a memory is provided in the present invention. The method includes the following steps. Each of at least one address bit to be tested of the memory is set to a fixed value. Current test data is written into memory unit(s) of the memory which the set address bit(s) correspond(s) to. Current read back data is read from the memory unit(s) which the set address bit(s) correspond(s) to. The current test data is compared with the current read back data. It is judged whether there is any signal integrity problem in unset address bit(s) of the memory according to the comparison result of the current test data and the current read back data, in order to determine fault address bit(s). The method and system for testing a memory provided by the present invention may determine fault address bit(s) of the memory simply and quickly.
摘要:
A power source management system of a circuit board that comprises: a processor, comprising a core voltage input terminal; and a core voltage feedback terminal; and a voltage regulating member, comprising a setting terminal with a fixed reference voltage provided thereto; a detecting terminal connected to the core voltage feedback terminal to detect a feedback core voltage from the core voltage feedback terminal; and a core voltage output terminal connected to the core voltage input terminal to provide a core voltage thereto, wherein the core voltage is regulated by the voltage regulating member based on the feedback core voltage, such that the feedback core voltage is equal to the fixed reference voltage, wherein an offset voltage equal to a difference between a desired core voltage of the processor and the fixed reference voltage is provided between the core voltage input terminal and the core voltage feedback terminal by the processor.
摘要:
A power source management system of a circuit board that comprises: a processor, comprising a core voltage input terminal; and a core voltage feedback terminal; and a voltage regulating member, comprising a setting terminal with a fixed reference voltage provided thereto; a detecting terminal connected to the core voltage feedback terminal to detect a feedback core voltage from the core voltage feedback terminal; and a core voltage output terminal connected to the core voltage input terminal to provide a core voltage thereto, wherein the core voltage is regulated by the voltage regulating member based on the feedback core voltage, such that the feedback core voltage is equal to the fixed reference voltage, wherein an offset voltage equal to a difference between a desired core voltage of the processor and the fixed reference voltage is provided between the core voltage input terminal and the core voltage feedback terminal by the processor.
摘要:
A method and system for testing a memory is provided in the present invention. The method includes the following steps. Each of at least one address bit to be tested of the memory is set to a fixed value. Current test data is written into memory unit(s) of the memory which the set address bit(s) correspond(s) to. Current read back data is read from the memory unit(s) which the set address bit(s) correspond(s) to. The current test data is compared with the current read back data. It is judged whether there is any signal integrity problem in unset address bit(s) of the memory according to the comparison result of the current test data and the current read back data, in order to determine fault address bit(s). The method and system for testing a memory provided by the present invention may determine fault address bit(s) of the memory simply and quickly.
摘要:
A graphics subsystem includes a printed circuit board (PCB), a set of one or more fans, and a heat sink. A graphics processing unit (GPU) is integrated into the PCB. The PCB is shortened to occupy a portion of the width of the graphics subsystem. The heat sink is coupled to the PCB and/or GPU and configured to extend beyond an edge of the PCB, thereby occupying a larger portion of the width of the graphics subsystem compared to the PCB. A first fan is disposed partially or fully beyond the edge of the PCB and is configured to direct air through the portion of the heat sink that extends beyond the edge of the PCB, along a first airflow path, and out of the graphics subsystem. A second fan is configured to direct air through the heat sink, along a second airflow path, towards the GPU.