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公开(公告)号:US20230087893A1
公开(公告)日:2023-03-23
申请号:US17904578
申请日:2021-02-22
发明人: Xiaojing Hao , Xu Liu , Martin Andrew Green , Ziheng Liu
IPC分类号: H01L31/00
摘要: A method of forming a photovoltaic device comprising a perovskite photovoltaic cell, particularly a method of forming a perovskite solar cell (PSC), is disclosed having a hole transport layer comprising an additive that may result in one or more of reduced formation of crystalline domains in the hole transport layer; reduced size of pinholes in the hole transport layer; improved dopant homogeneity and increased hydrophobicity of the hole transport layer. Also disclosed are PSCs so formed, showing one or more improved properties.
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公开(公告)号:US20210135028A1
公开(公告)日:2021-05-06
申请号:US16959654
申请日:2019-02-15
IPC分类号: H01L31/032 , H01L31/0749 , H01L31/18
摘要: Disclosed is an adamantine semiconductor. The semiconductor comprises a first element being from one of the following groups: VIII, VII, VI, V, IV, III, II, Ī or 0. The semiconductor also comprises at least two other elements, the at least two other elements being from group I, II, III, IV, V, VI and/or VII. The first element being from group VIII, VII, VI, V, IV, III, II, Ī or 0 includes an element not formally being from group VIII, VII, VI,V, IV, III,II, Ī or 0 but is known to assume the same oxidation state as the elements that do lie in these groups. The at least two other elements from group I, II, III, IV, V, VI and/or VII includes elements not formally being from group I, II, III, IV, V, VI and/or VII but are known to assume the same oxidation state as the elements that do lie in these groups.
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公开(公告)号:US10115854B2
公开(公告)日:2018-10-30
申请号:US15508975
申请日:2015-09-04
IPC分类号: H01L31/18 , B23K26/00 , B23K26/354 , B23K26/073 , B23K26/082 , H01L21/02 , H01L31/047 , B23K101/34 , B23K101/40 , B23K103/16 , B23K103/00
摘要: The present disclosure provides a method of manufacturing a semiconductor device. Furthermore the present disclosure provides a photovoltaic device and a light emitting diode manufactured in accordance with the method. The method comprises the steps of forming a germanium layer using deposition techniques compatible with high-volume, low-cost manufacturing, such as magnetron sputtering, and exposing the germanium layer to laser light to reduce the amount of defects in the germanium layer. After the method is performed the germanium layer can be used as a virtual germanium substrate for the growth of III-V materials.
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公开(公告)号:US20170244005A1
公开(公告)日:2017-08-24
申请号:US15508975
申请日:2015-09-04
IPC分类号: H01L31/18 , B23K26/354 , H01L31/047 , B23K26/082 , H01L21/02 , B23K26/00 , B23K26/073
CPC分类号: H01L31/1852 , B23K26/073 , B23K26/082 , B23K26/352 , B23K26/354 , B23K2101/34 , B23K2101/40 , B23K2103/172 , B23K2103/56 , H01L21/02381 , H01L21/02532 , H01L21/02631 , H01L21/02683 , H01L21/02691 , H01L31/047 , H01L31/0687 , H01L31/0693 , H01L31/0725 , H01L31/0735 , H01L31/078 , Y02E10/544 , Y02P70/521
摘要: The present disclosure provides a method of manufacturing a semiconductor device. Furthermore the present disclosure provides a photovoltaic device and a light emitting diode manufactured in accordance with the method. The method comprises the steps of forming a germanium layer using deposition techniques compatible with high-volume, low-cost manufacturing, such as magnetron sputtering, and exposing the germanium layer to laser light to reduce the amount of defects in the germanium layer. After the method is performed the germanium layer can be used as a virtual germanium substrate for the growth of III-V materials.
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公开(公告)号:US11881536B2
公开(公告)日:2024-01-23
申请号:US16959654
申请日:2019-02-15
IPC分类号: H01L31/18 , H01L31/0749 , H01L31/0296 , H01L31/0304 , H01L31/032
CPC分类号: H01L31/18 , H01L31/0296 , H01L31/02966 , H01L31/0304 , H01L31/0322 , H01L31/0324 , H01L31/03046 , H01L31/0749 , Y02E10/541
摘要: Disclosed is an adamantine semiconductor. The semiconductor comprises a first element being from one of the following groups: VIII, VII, VI, V, IV, III, II, Ī or 0. The semiconductor also comprises at least two other elements, the at least two other elements being from group I, II, III, IV, V, VI and/or VII. The first element being from group VIII, VII, VI, V, IV, III, II, Ī or 0 includes an element not formally being from group VIII, VII, VI, V, IV, III, II, Ī or 0 but is known to assume the same oxidation state as the elements that do lie in these groups. The at least two other elements from group I, II, III, IV, V, VI and/or VII includes elements not formally being from group I, II, III, IV, V, VI and/or VII but are known to assume the same oxidation state as the elements that do lie in these groups.
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公开(公告)号:US11322634B2
公开(公告)日:2022-05-03
申请号:US16311845
申请日:2017-06-21
发明人: Xiaojing Hao , Fangyang Liu , Jialiang Huang , Chang Yan , Kaiwen Sun , Martin Andrew Green
IPC分类号: H01L31/0749 , H01L31/032 , H01L31/0296 , H01L31/0392 , H01L31/18 , H01L21/02
摘要: A method for forming a photovoltaic device comprising the steps of: providing a first conductive material on a substrate; depositing a continuous layer of a dielectric material less than 10 nm thick on the first conductive material; annealing the first conductive material and the layer of dielectric material; forming a chalcogenide light-absorbing material on the layer of dielectric material; and depositing a second material on the light-absorbing material such that the second material is electrically coupled to the light-absorbing material; wherein the first conductive material and the dielectric material are selected such that, during the step of annealing, a portion of the first conductive material undergoes a chemical reaction to form: a layer of a metal chalcogenide material at the interface between first conductive material and the dielectric material; and a plurality of openings in the layer of dielectric material; the openings being such to allow electrical coupling between the light-absorbing material and the layer of a metal chalcogenide material. Additionally contemplated is a photovoltaic device formed by this method.
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公开(公告)号:US09508889B2
公开(公告)日:2016-11-29
申请号:US13916823
申请日:2013-06-13
发明人: Martin Green , Xiaojing Hao , Chao-Yang Tsao
IPC分类号: H01L31/028 , H01L31/18 , C23C14/06 , C30B23/02 , C30B29/08 , H01L21/02 , H01L31/0725 , H01L31/0735
CPC分类号: H01L31/1816 , C23C14/06 , C30B23/02 , C30B23/025 , C30B29/08 , H01L21/02381 , H01L21/02532 , H01L21/02631 , H01L21/02658 , H01L31/028 , H01L31/0725 , H01L31/0735 , H01L31/1852 , Y02E10/544
摘要: A method is presented for forming a Ge containing layer on a Si substrate. The method includes providing a crystalline Si substrate having a surface that has a crystallographic orientation, heating the Si substrate in a vacuum environment, exposing the Si substrate to a surfactant that is suitable for growth of the Ge containing layer on the crystalline Si using surfactant mediation, and thereafter growing the Ge containing layer on the surface of the heated Si substrate using a suitable sputtering technique. The conditions of the growth of the Ge containing layer are selected such that a thin Ge containing layer is formed on the surface of the Si substrate. The thin Ge containing layer has a surface that has crystallographic properties suitable for epitaxial growth of a layer of a further material on the surface of the thin Ge containing layer.
摘要翻译: 提出了在Si衬底上形成含Ge层的方法。 该方法包括提供具有晶体取向的表面的晶体Si衬底,在真空环境中加热Si衬底,使用表面活性剂介质将Si衬底暴露于适合于在结晶Si上生长Ge的表面活性剂 ,然后使用合适的溅射技术在加热的Si衬底的表面上生长Ge含量层。 选择Ge含量层的生长条件使得在Si衬底的表面上形成含有薄的Ge含量层。 薄的Ge含有层具有适于在薄Ge含量层的表面上进一步材料层的外延生长的晶体学性质的表面。
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