摘要:
There is provided in accordance with embodiments of the present invention a method of reducing the neighbor effect in reading data in a non-volatile memory array by sensing adjacent memory cells in a virtual ground array of memory cells comprising sensing substantially simultaneously a state of adjacent memory cells, wherein a bit stored in a charge trapping region of each cell of the adjacent memory cells is in an identical state.
摘要:
A sensing system for a memory cell in a memory array includes a current integrator circuit configured to integrate a read current through the memory cell and a reference current through a reference memory cell. The integration process creates a set of differential measurement voltages that can be used to determine the state of the memory cell. By integrating the read current to obtain a measurement voltage, rather than directly comparing the read current to a reference current, the sensing system can use lower supply voltages than conventional sensing systems. In addition, because the measurement voltages are generated by integrating the read current over time, sensing operations are less sensitive to supply voltage fluctuations and the accuracy. Also, for memory cells that exhibit small read currents, the accuracy of sensing operations can be increased by increasing the period of integration.
摘要:
The pipe effect can significantly degrade flash performance. A method to significantly reduce pipe current and (or neighbor current using a pre-charge sequence) is disclosed. A dedicated read order keeps the sensing node facing the section of the pipe which was pre-charged. The technique involves pre-charging several global bitlines (such as metal bitlines, or MBLs) and local bitlines (such as diffusion bitlines, or DBLs). The pre-charged global bitlines are selected according to a pre-defined table per each address. The selection of the global bitlines is done according to whether these global bitlines will interfere with the pipe during the next read cycle.
摘要:
A method for sensing a signal received from an array cell within a memory array, the method comprising the steps of generating an analog voltage Vddr proportional to a current of a selected array cell of the memory array, and comparing the analog voltage Vddr with a reference analog voltage Vcomp to generate an output digital signal. A method is also provided for sensing a memory cell by transforming a signal from a memory cell to a time delay, and sensing the memory cell by comparing the time delay to a time delay of a reference cell. Related apparatus is also disclosed.
摘要:
A method for sensing the state of a memory cell includes both dynamic and static clamping of the bit line coupled to a memory cell. This dual clamping configuration/operation ensures a quick charge of the bit line while eliminating overcharging of the bit line. Thus, sensing the state of the memory cell is substantially independent of the size of the memory array. A sensing system for sensing the state of a memory cell can include a system bit line coupled to a terminal of the memory cell, a charge initiation device for activating a charge operation on the system bit line, and a control unit connected between the system bit line and the charge initiation device. The control unit includes a static clamp to charge the system bit line to a first predetermined voltage and a dynamic clamp to charge the system bit line to a second predetermined voltage.
摘要:
A memory device includes a voltage regulator that compensates for resistance variations in the bit line control (multiplexing) circuit used to access the memory cells by including in its feedback path an emulated multiplexing circuit having an identical resistance to that of the multiplexing circuit. The voltage regulator also includes a differential amplifier, a pull-up transistor for generating a reference voltage, and a first clamp transistor controlled by the reference voltage to pass a desired voltage level to the multiplexing circuit. The feedback path incorporates the emulator circuit between a second clamp transistor and a voltage divider. Because the emulation and multiplexing circuits have the same resistance, the voltage passed to the voltage divider is essentially identical to the voltage passed by the multiplexing circuit to a selected memory cell, thereby allowing the voltage regulator to produce an optimal voltage level at the selected memory cell.
摘要:
The pipe effect can significantly degrade flash performance. A method to significantly reduce pipe current and (or neighbor current using a pre-charge sequence) is disclosed. A dedicated read order keeps the sensing node facing the section of the pipe which was pre-charged. The technique involves pre-charging several global bitlines (such as metal bitlines, or MBLs) and local bitlines (such as diffusion bitlines, or DBLs). The pre-charged global bitlines may be selected according to a pre-defined table per each address. The selection of the global bitlines may be done according to whether these global bitlines will interfere with the pipe during the next read cycle.
摘要:
A high voltage regulator including a current mirror including a pair of transistors, one of the transistors being connected to a node that outputs an output voltage Vout, a diode stack that includes a plurality of serially connected transistors T0, T1, T2, . . . Tn, wherein the transistor T1 is connected to a node n0, to which is connected another transistor T0 that receives an input bias voltage Vbias, and wherein a feedback voltage fb from node n0 is fed to an input of the differential amplifier, the differential amplifier receiving an input reference voltage Vref at one of its other inputs, and is also connected to positive voltage supply Vdd, the differential amplifier outputting to an NMOS transistor M, and wherein the high voltage regulator has a large diode stack gain and lower GDA*GNMOS*m, resulting in a generally constant feedback (loop) gain Gloop, wherein the loop gain is given by: Loop Gain=Gloop=Gstack*GDA*GNMOS*m wherein m is the ratio of the two currents I1 and I2, that is, I2=mI1, Gstack is the gain of the diode stack, GDA is the gain of the differential amplifier and GNMOS is the gain of the NMOS transistor M.
摘要翻译:一种高电压调节器,包括包括一对晶体管的电流镜,其中一个晶体管连接到输出输出电压V OUT的节点;二极管叠层,包括多个串联连接的晶体管T T 1,T 2,...,N 2, 。 。 其中晶体管T 1连接到与另一个晶体管T 0连接的节点n 0 0 < SUB>接收输入偏置电压V SUB偏置,并且其中来自节点n0的反馈电压fb被馈送到差分放大器的输入端,差分放大器接收 输入参考电压V SUB参考电压,并且还连接到正电压源Vdd,该差分放大器输出到NMOS晶体管M,并且其中高压调节器具有大的二极管叠层 增益和更低的G N N N * N,导致大体上恒定的反馈(环路)增益G SUB>,其中环路增益为 给了
摘要:
A high voltage regulator including a current mirror including a pair of transistors, one of the transistors being connected to a node that outputs an output voltage Vout, a diode stack that includes a plurality of serially connected transistors T0, T1, T2, . . . Tn, wherein the transistor T1 is connected to a node n0, to which is connected another transistor T0 that receives an input bias voltage Vbias, and wherein a feedback voltage fb from node n0 is fed to an input of the differential amplifier, the differential amplifier receiving an input reference voltage Vref at one of its other inputs, and is also connected to positive voltage supply Vdd, the differential amplifier outputting to an NMOS transistor M, and wherein the high voltage regulator has a large diode stack gain and lower GDA*GNMOS*m, resulting in a generally constant feedback (loop) gain Gloop wherein the loop gain is given by: Loop Gain=Gloop=Gstack*GDA*GNMOS*m wherein m is the ratio of the two currents I1 and I2, that is, I2=mI1, Gstack is the gain of the diode stack, GDA is the gain of the differential amplifier and GNMOS is the gain of the NMOS transistor M.
摘要翻译:一种高电压调节器,包括包括一对晶体管的电流镜,其中一个晶体管连接到输出输出电压V OUT的节点;二极管叠层,包括多个串联连接的晶体管T T 1,T 2,...,N 2, 。 。 其中晶体管T 1连接到与另一个晶体管T 0连接的节点n 0 0 < SUB>接收输入偏置电压V SUB偏置,并且其中来自节点n0的反馈电压fb被馈送到差分放大器的输入端,差分放大器接收 输入参考电压V SUB参考电压,并且还连接到正电压源Vdd,该差分放大器输出到NMOS晶体管M,并且其中高压调节器具有大的二极管叠层 增益和较低的G N N N N N * M,导致通常恒定的反馈(环路)增益G SUB>其中给出了环路增益 通过:<?in-line-formula description =“In-line Formulas”end =“lead”?> Loop Gain = G SUB> = G SUB> 其中m是两个电流I的比值,其中m是两个电流I的比值 &lt; 1&gt;和&lt; 2&gt;,即I 2&gt; = m 1&lt; 1&lt;&lt; >是二极管堆叠的增益,G SUB>是差分放大器的增益,并且G NMOS NMOS是NMOS晶体管M的增益。
摘要:
A method for sensing a signal received from an array cell within a memory array, the method comprising the steps of generating an analog voltage Vddr proportional to a current of a selected array cell of the memory array, and comparing the analog voltage Vddr with a reference analog voltage Vcomp to generate an output digital signal. A method is also provided for sensing a memory cell by transforming a signal from a memory cell to a time delay, and sensing the memory cell by comparing the time delay to a time delay of a reference cell. Related apparatus is also disclosed.